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Institution Date Title Author
國立彰化師範大學 2007 Trapped Resonant Fermions Above the Superfluid Transition Temperature Cheng, Chi-Ho; Yip, Sung-Kit
淡江大學 1978-11 Trapped waves on a string with two discontinuities 芮涵芝; Ruei, Keiser-hantze
國立交通大學 2020-07-01T05:22:11Z Trapping a pentagonal molecule in a self-assembled molecular network: an alkoxylated isosceles triangular molecule does the job Anzai, Masaru; Iyoda, Masahiko; De Feyter, Steven; Tobe, Yoshito; Tahara, Kazukuni
國立交通大學 2014-12-08T15:02:04Z Trapping and de-trapping characteristics in PBTI and dynamic PBTI between HfO2 and HfSiON gate dielectrics Lin, We-Liang; Lee, Yao-Jen; Lo, Wen-Cheng; Chen, King-Sheng; Hou, Y. T.; Lin, K. C.; Chao, Tien-Sheng
國立交通大學 2019-09-02T07:45:40Z Trapping and Detrapping of Oxide Border Traps in Al2O3 Gate Dielectric in MOS2 n-MOSFETs under PBTI Stress Yuan, Hui-Wen; Shen, Hui; Li, Jun-Jie; Shao, Jinhai; Huang, Daming; Chen, Yi-Fang; Wang, P. F.; Ding, S. J.; Chin, Albert; Li, Ming-Fu
臺大學術典藏 2018-09-10T07:29:06Z Trapping characteristics of Al2O3/HfO 2/SiO1-2 stack structure prepared by low temperature in situ oxidation in dc sputtering Chang, C.-H.; Hwu, J.-G.; JENN-GWO HWU; Chang, C.-H.;Hwu, J.-G.
國立臺灣大學 2009 Trapping Characteristics of Al2O3/HfO2/SiO2 Stack Structure Prepared by Low Temperature In-situ Oxidation in dc-sputtering Chang, Chia-Hua; Hwu, Jenn-Gwo
國立交通大學 2020-07-01T05:22:11Z Trapping Depth and Transition Probability of Four-Level Random Telegraph Noise in a Gate-All-Around Poly-Si Nanowire Transistor Change, You-Tai; Tsai, Yueh-Lin; Peng, Kang-Ping; Su, Chun-Jung; Li, Pei-Wen; Lin, Horng-Chih
臺大學術典藏 2016 Trapping in proton irradiated p + -n-n + silicon sensors at fluences anticipated at the HL-LHC outer tracker Adam, W.; Adam, W.; RONG-SHYANG LU
國立成功大學 2013-09-09 Trapping mid-infrared rays in a lossy film with the Berreman mode, epsilon near zero mode, and magnetic polaritons Chen, Yu-Bin; Chiu, Feng-Cheng

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