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显示项目 306271-306280 / 2348685 (共234869页)
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| 臺大學術典藏 |
2021-12-21T23:17:06Z |
Deep learning–assisted burn wound diagnosis: Diagnostic model development Study
|
Chang, Che Wei; Lai, Feipei; Christian, Mesakh; Chen, Yu Chun; Hsu, Ching; Chen, Yo Shen; Chang, Dun Hao; Roan, Tyng Luen; Yu, Yen Che |
| 臺大學術典藏 |
2022-04-25T06:44:23Z |
Deep learning–assisted burn wound diagnosis: Diagnostic model development Study
|
Chang C.W;Lai F;Christian M;Chen Y.C;Hsu C;Chen Y.S;Chang D.H;Roan T.L;Yu Y.C.; Chang C.W; Lai F; Christian M; Chen Y.C; Hsu C; Chen Y.S; Chang D.H; Roan T.L; Yu Y.C.; FEI-PEI LAI |
| 臺大學術典藏 |
2009-02-04T18:50:58Z |
Deep Level Analysis of MBE Grown InAlAs Strained Layers
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Wu, C. W.; Lin, Hao-Hsiung; 林浩雄; Lee, T. L.; Liu, J. S.; Liu, J. S.; Lee, T. L.; Wu, C. W.; Lin, Hao-Hsiung |
| 國立臺灣大學 |
1993 |
Deep Level Analysis of MBE Grown InAlAs Strained Layers
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Liu, J. S.; Lee, T. L.; 林浩雄; Wu, C. W.; Liu, J. S.; Lee, T. L.; Lin, Hao-Hsiung; Wu, C. W. |
| 國立成功大學 |
2003-05-26 |
Deep level defect in Si-implanted GaN n(+)-p junction
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Chen, X. D.; Huang, Y.; Fung, S.; Beling, C. D.; Ling, C. C.; Sheu, Jinn-Kong; Lee, M. L.; Chi, Gou-Chung; Chang, Shoou-Jinn |
| 南台科技大學 |
2003 |
Deep level defect in Si-implanted GaN n+-p junction
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李明倫; J. K. Sheu;M. L. Lee; G. C. Chi;S. J. Chang |
| 國立交通大學 |
2014-12-08T15:44:17Z |
Deep level transient spectroscopy characterization of InAs self-assembled quantum dots
|
Ilchenko, VV; Lin, SD; Lee, CP; Tretyak, OV |
| 國立成功大學 |
2021-02-1 |
Deep level transient spectroscopy characterization without the Arrhenius plot
|
Li;Jian;V |
| 國立交通大學 |
2014-12-08T15:02:21Z |
Deep level transient spectroscopy depth profile measurements of polycrystalline zinc oxide ceramic
|
Lee, WI; Young, RL; Chen, WK |
| 國立交通大學 |
2019-04-02T05:58:23Z |
Deep level transient spectroscopy depth profile measurements of polycrystalline zinc oxide ceramic
|
Lee, WI; Young, RL; Chen, WK |
显示项目 306271-306280 / 2348685 (共234869页)
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