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显示项目 526976-526985 / 2348674 (共234868页)
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| 元智大學 |
2018-09-19 |
Investigation of CZTSe Solar Cells with Different Back Contacts
|
Fang-I Lai |
| 國立交通大學 |
2019-08-02T02:24:17Z |
Investigation of Data Pattern Effects on Nitride Charge Lateral Migration in a Charge Trap Flash Memory by Using a Random Telegraph Signal Method
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Liu, Y. H.; Lin, H. Y.; Jiang, C. M.; Wang, Tahui; Tsai, W. J.; Lu, T. C.; Chen, K. C.; Lu, Chih-Yuan |
| 國立臺灣科技大學 |
2003 |
Investigation of DC electric arc furnace average power factor calculation using IEEE standard 1459
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Chi-Jui Wu;Cheng-Ping Huang;Tsu-Hsun Fu;Tzu-Chih Zhao;Hung-Shian Kuo |
| 元培科技大學 |
2003-09-01 |
Investigation of DC Electric Arc Furnace Average Power Factor Calculation Using IEEE Standard 1459
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Wu , Chi-Jui;Huang, Cheng-Ping;Fu, Tsu-Hsun, Zhao;Tzu-Chih ; Hung-Shian |
| 國立交通大學 |
2014-12-08T15:16:56Z |
Investigation of DC hot-carrier degradation at elevated temperatures for n-channel metal-oxide-semiconductor field-effect-transistor of 0.13 mu m technology
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Lin, JC; Chen, SY; Chen, HW; Jhou, ZW; Lin, HC; Chou, S; Ko, J; Lei, TF; Haung, HS |
| 國立臺灣科技大學 |
2016 |
Investigation of defect free SiGe nanowire biosensor modified by dual plasma technology
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Chen, Y.-M;Chang, T.-Y;Lai, C.-H;Chang, K.-M;Chen, Chen C.-F;Lai, Y.-L;Whang, A.J.-W;Lai, H.-L;Hsu, T.-R. |
| 國立交通大學 |
2017-04-21T06:56:03Z |
Investigation of Defect Free SiGe Nanowire Biosensor Modified by Dual Plasma Technology
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Chen, Yi-Ming; Chang, Tai-Yuan; Lai, Chiung-Hui; Chang, Kow-Ming; Chen, Chu-Feng; Lai, Yi-Lung; Whang, Allen Jong-Woei; Lai, Hui-Lung; Hsu, Terng-Ren |
| 國立成功大學 |
2014-11 |
Investigation of defect modes in a defective photonic crystal with a semiconductor metamaterial defect
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Wu, Meng-Ru; Wu, Chien-Jang; Chang, Shoou-Jinn |
| 國立成功大學 |
2015-08-24 |
Investigation of defect-induced abnormal body current in fin field-effect-transistors
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Liu, Kuan-Ju; Chang, Ting-Chang; Chen, Ching-En; Yang, Ren-Ya; Tsai, Jyun-Yu; Lu, Ying-Hsin; Liu, Xi-Wen; Cheng, Osbert; Huang, Cheng-Tung |
| 國立交通大學 |
2015-12-02T02:59:24Z |
Investigation of defect-induced abnormal body current in fin field-effect-transistors
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Liu, Kuan-Ju; Chang, Ting-Chang; Chen, Ching-En; Yang, Ren-Ya; Tsai, Jyun-Yu; Lu, Ying-Hsin; Liu, Xi-Wen; Cheng, Osbert; Huang, Cheng-Tung |
显示项目 526976-526985 / 2348674 (共234868页)
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