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显示项目 526981-526990 / 2348685 (共234869页) << < 52694 52695 52696 52697 52698 52699 52700 52701 52702 52703 > >> 每页显示[10|25|50]项目
| 國立交通大學 |
2014-12-08T15:16:56Z |
Investigation of DC hot-carrier degradation at elevated temperatures for n-channel metal-oxide-semiconductor field-effect-transistor of 0.13 mu m technology
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Lin, JC; Chen, SY; Chen, HW; Jhou, ZW; Lin, HC; Chou, S; Ko, J; Lei, TF; Haung, HS |
| 國立臺灣科技大學 |
2016 |
Investigation of defect free SiGe nanowire biosensor modified by dual plasma technology
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Chen, Y.-M;Chang, T.-Y;Lai, C.-H;Chang, K.-M;Chen, Chen C.-F;Lai, Y.-L;Whang, A.J.-W;Lai, H.-L;Hsu, T.-R. |
| 國立交通大學 |
2017-04-21T06:56:03Z |
Investigation of Defect Free SiGe Nanowire Biosensor Modified by Dual Plasma Technology
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Chen, Yi-Ming; Chang, Tai-Yuan; Lai, Chiung-Hui; Chang, Kow-Ming; Chen, Chu-Feng; Lai, Yi-Lung; Whang, Allen Jong-Woei; Lai, Hui-Lung; Hsu, Terng-Ren |
| 國立成功大學 |
2014-11 |
Investigation of defect modes in a defective photonic crystal with a semiconductor metamaterial defect
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Wu, Meng-Ru; Wu, Chien-Jang; Chang, Shoou-Jinn |
| 國立成功大學 |
2015-08-24 |
Investigation of defect-induced abnormal body current in fin field-effect-transistors
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Liu, Kuan-Ju; Chang, Ting-Chang; Chen, Ching-En; Yang, Ren-Ya; Tsai, Jyun-Yu; Lu, Ying-Hsin; Liu, Xi-Wen; Cheng, Osbert; Huang, Cheng-Tung |
| 國立交通大學 |
2015-12-02T02:59:24Z |
Investigation of defect-induced abnormal body current in fin field-effect-transistors
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Liu, Kuan-Ju; Chang, Ting-Chang; Chen, Ching-En; Yang, Ren-Ya; Tsai, Jyun-Yu; Lu, Ying-Hsin; Liu, Xi-Wen; Cheng, Osbert; Huang, Cheng-Tung |
| 國立臺灣大學 |
1989 |
Investigation of defects in amorphous silicon films using positron annihilation
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Chen, Yang-Fang; Wang, Chia-Chi; Tseng, Poh-Kun; Lue, Jun-Tseng |
| 臺大學術典藏 |
2018-09-10T07:26:33Z |
Investigation of defects in amorphous silicon films using positron annihilation
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Chen, Y.-F.;Wang, C.-C.;Tseng, P.-K.;Lue, J.-T.; Chen, Y.-F.; Wang, C.-C.; Tseng, P.-K.; Lue, J.-T.; YANG-FANG CHEN |
| 國立交通大學 |
2017-04-21T06:49:32Z |
Investigation of defects in organic semiconductors by charge based Deep Level Transient Spectroscopy (Q-DLTS)
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Nguyen, T. P.; Renaud, C.; Le Rendu, P.; Yang, S. H. |
| 南台科技大學 |
2023-04 |
Investigation of deformation of viscoelastic materials is applied with hollow touch force
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Yu-Jung Lee |
显示项目 526981-526990 / 2348685 (共234869页) << < 52694 52695 52696 52697 52698 52699 52700 52701 52702 52703 > >> 每页显示[10|25|50]项目
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