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显示项目 527071-527095 / 2348674 (共93947页)
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机构 日期 题名 作者
臺大學術典藏 2021-05-24T13:07:22Z Investigation of Electrical and Optical Properties of AlGaInP Red Vertical Micro-Light-Emitting Diodes With Cu/Invar/Cu Metal Substrates Sinha, Shreekant; Tarntair, Fu Gow; Ho, Cheng Han; YUH-RENN WU; Horng, Ray Hua
國立交通大學 2015-07-21T08:29:41Z Investigation of electrical and thermal properties of multiple AlGaN/GaN high-electron-mobility transistors flip-chip packaged in parallel for power electronics Tsai, Szu-Ping; Hsu, Heng-Tung; Tu, Yung-Yi; Chang, Edward Yi
國立臺灣海洋大學 2016 Investigation of Electrical Characteristics of Multi-thin-film Metal Electrodes Deposited on Flexible Polydimethylsiloxane Substrates by Using an Automatic Folding Test System Pen-Cheng Wang;Bor-Jiunn Wen;Tung-Yuan Lee;Pin-Hsuan Hung;Heng Yin Chen
國立交通大學 2018-08-21T05:53:08Z Investigation of Electrical Characteristics on 25-nm InGaAs Channel FinFET Using InAlAs Back Barrier and Al2O3 Gate Dielectric Lin, M. H.; Lin, Y. C.; Lin, Y. S.; Sun, W. J.; Chen, S. H.; Chiu, Y. C.; Cheng, C. H.; Chang, C. Y.
國立交通大學 2019-04-02T05:58:14Z Investigation of Electrical Characteristics on AP-PECVD Fabricated Amorphous IGZO TFTs with Hydrogen Plasma Treatment Wu, Chien-Hung; Chang, Kow-Ming; Chen, Yi-Ming; Zhang, Yu-Xin; Tan, Yu-Hsuan
國立交通大學 2019-04-02T05:58:14Z Investigation of Electrical Characteristics on LaAlO3/ZrO2/IGZO TFTs with Microwave Annealing Wu, Chien-Hung; Chang, Kow-Ming; Chen, Yi-Ming; Zhang, Yu-Xin; Cheng, Chia-Yao
國立交通大學 2014-12-08T15:18:30Z Investigation of electrical characteristics on surrounding-gate and omega-shaped-gate nanowire FinFETs Li, YM; Chou, HM; Lee, JW
南台科技大學 2004 Investigation of Electrical Field Effect on Nickel Induced crystallization of Amorphous Si 許進明; Yu-zhi Zhang; Ching-Ming Hsu
國立交通大學 2014-12-08T15:12:21Z Investigation of electrical pulse erasing method effect on current - Voltage characteristics of organic bistable device Lee, Po-Tsung; Chang, Tzu-Yueh; Chen, Szu-Yuah
國立聯合大學 2008 Investigation of electrical transient behavior for ultrasonic transducer in ON/OFF cycles Kuo-Tsai Chang, Hsuang-Chang Chiang
國立聯合大學 2007 Investigation of electrical transient behavior of an ultrasonic transducer under impulsive mechanical excitation K.-T. Chang
國立成功大學 2006-10-05 Investigation of electro-oxidation of methanol and benzyl alcohol at boron-doped diamond electrode: Evidence for the mechanism for fouling film formation Chang, Chia-Chin; Chen, Li-Chia; Liu, Shyh-Jiun; Chang, Hsien-Chang
元智大學 2017-06-22 Investigation of electrochemical approach for biochemical analysis of microbial culture system Jian-An Su; Chi-Wei (John) Lan
淡江大學 1998-01 Investigation of electrochemical behavior and mass-transfer process of C70 film. structure, size and temperature effect 王文竹; Wang, Wen-jwu; Chiu, H. S.; Lin, S. S.; Chang, C. S.; Chuang, K. S.
義守大學 2016-04 Investigation of Electrochromic Properties of Novel Tungsten Trioxide Nano-structure Preparation Using Hydrothermal Process Jia-Cian Hsieh;Wen-Jen Liu
南台科技大學 2007 Investigation of Electrode Pattern Design for Nitride-based Light Emitting Diodes 邱裕中; 林陞羽; Chiou, Y.Z; Lin, S.Y.
國立交通大學 2014-12-08T15:12:50Z Investigation of electroless Co(W,P) thin film as the diffusion barrier of underbump metallurgy Wu, W. C.; Hsieh, Tsung-Eong; Pan, Hung-Chun
國立交通大學 2014-12-08T15:16:17Z Investigation of electroless cobalt-phosphorous layer and its diffusion barrier properties of Pb-Sn solder Liang, Muh-Wang; Yen, Hui-Ting; Hsieh, Tsung-Eong
元智大學 2011-07 Investigation of Electromagnetic Interferences Caused by the Stacked I/O Connectors H.-H. Chou; S-C Tuan; Chou H.-T.; Y-S Lee
元智大學 2011-07 Investigation of Electromagnetic Interferences Caused by the Stacked I/O Connectors H.-H. Chou; S-C Tuan; Chou H.-T.; Y-S Lee
臺大學術典藏 2018-09-10T08:42:45Z Investigation of electromagnetic interferences caused by the stacked I/O connectors Chou, H.-H.;Tuan, S.-C.;Chou, H.-T.;Lee, Y.-S.; Chou, H.-H.; Tuan, S.-C.; Chou, H.-T.; Lee, Y.-S.; HSI-TSENG CHOU
國立臺灣科技大學 2009 Investigation of electromagnetic radiation from high power weather radar Wen J.-Y.; Huang J.-F.
國立成功大學 2014-11 Investigation of electromigration reliability of redistribution lines in wafer-level chip-scale packages Kao, Chin-Li; Chen, Tei-Chen; Lai, Yi-Shao; Chiu, Ying-Ta
國立交通大學 2020-01-02T00:04:18Z Investigation of Electron and Hole Lateral Migration in Silicon Nitride and Data Pattern Effects on ${V}_{{t}}$ Retention Loss in a Multilevel Charge Trap Flash Memory Liu, Yu-Heng; Zhan, Ting-Chien; Wang, Tahui; Tsai, Wen-Jer; Lu, Tao-Cheng; Chen, Kuang-Chao; Lu, Chih-Yuan
朝陽科技大學 2025-11-19 Investigation of Electron Transport Layer Influence on Asymmetric Bipolar Switching in Transparent BST-Based RRAM Devices Chen, Kai-Huang; Kao, Ming-Cheng; Chen, Hsin-Chin; Wang, Yao-Chin; Cheng, Chien-Min; Xu, Wei-Min; 高銘政

显示项目 527071-527095 / 2348674 (共93947页)
<< < 21078 21079 21080 21081 21082 21083 21084 21085 21086 21087 > >>
每页显示[10|25|50]项目