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教育部委托研究计画 计画执行:国立台湾大学图书馆
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显示项目 527866-527875 / 2346288 (共234629页)
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每页显示[10|25|50]项目
| 中原大學 |
1999 |
Investigation on Process Characteristics and Application of Injection-Compression Molding Process
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Shia-Chung Chen;Yung-Chung Chen;Lei-Ti Huang;Hsin-Shu Peng |
| 元智大學 |
2006-11 |
Investigation on Production Polyhydroxyalkanoates from Aeromonas hydrophila Strain
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吳和生; 魏毓宏; Yen-An Gong; Chi-Wei Lo; Hsiao-Ming Wan |
| 國立交通大學 |
2019-08-23T01:09:55Z |
Investigation on psychological capital
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Chin-Tsu Chen; Chun-Fu Chen |
| 國立交通大學 |
2014-12-08T15:22:48Z |
Investigation on residual stress and stress-optical coefficient for flexible electronics by photoelasticity
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Lee, Y. C.; Liu, T. S.; Wu, C. I.; Lin, W. Y. |
| 國家衛生研究院 |
2021-10-12 |
Investigation on returning to work in liver cancer survivors in Taiwan: A 5-year follow-up study
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Yang, SW;Chen, WL;Wu, WT;Wang, CC |
| 國立交通大學 |
2017-04-21T06:48:25Z |
Investigation on RF characteristics of stacked P-I-N polysilicon diodes for ESD protection design in 0.18-mu m CMOS technology
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Shiu, Yu-Da; Chuang, Che-Hao; Ker, Ming-Dou |
| 國立交通大學 |
2014-12-08T15:10:44Z |
Investigation on Robustness of CMOS Devices Against Cable Discharge Event (CDE) Under Different Layout Parameters in a Deep-Submicrometer CMOS Technology
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Ker, Ming-Dou; Lai, Tai-Hsiang |
| 義守大學 |
2008-11 |
Investigation on Robustness of CMOS Devices Against Cable Discharge Event (CDE) Under Different Layout Parameters in a Deep-Submicrometer CMOS Technology
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Ming-Dou Ker;Tai-Hsiang Lai |
| 國立交通大學 |
2014-12-08T15:32:12Z |
Investigation on Safe Operating Area and ESD Robustness in a 60-V BCD Process with Different Deep P-Well Test Structures
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Dai, Chia-Tsen; Ker, Ming-Dou |
| 國立交通大學 |
2016-03-28T00:05:42Z |
Investigation on SCR-based ESD protection device for biomedical integrated circuits in a 0.18-mu m CMOS process
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Lin, Chun-Yu; Chiu, Yan-Lian |
显示项目 527866-527875 / 2346288 (共234629页)
<< < 52782 52783 52784 52785 52786 52787 52788 52789 52790 52791 > >>
每页显示[10|25|50]项目
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