| 國立臺灣科技大學 |
2009 |
Optical characterization of thin epitaxial GaAs films on Ge substrates
|
Wu J.D.; Huang Y.S.; Brammertz G.; Tiong K.K. |
| 國立臺灣海洋大學 |
2009 |
Optical characterization of thin epitaxial GaAs films on Ge substrates
|
J. D. Wu; Y. S. Huang; G. Brammertz; K. K. Tiong |
| 國立屏東大學 |
2006 |
Optical characterization of two-dimensional photonic crystals based on spectroscopic ellipsometry with rigorous coupled-wave analysis
|
張雯惠;Lin, CH;Chen, HL;Chao, WC; |
| 國立屏東大學 |
2005 |
Optical characterization of two-dimensional photonic crystals based on spectroscopic ellipsometry with rigorous coupled-wave analysis
|
張雯惠;CH, Lin;Chen, HL;Chao, WC;Hsieh, CI;Chang, WH. |
| 臺大學術典藏 |
2006 |
Optical Characterization of Two-dimensional Photonic Crystals Based on Spectroscopic Ellipsometry with Rigorous Coupled-Wave Analysis
|
Chang, Wen-Huei; Hsieh, Chung-I; Chao, Wen-Chi; Chen, Hsuen-Li; Lin, Chun-Hung; Lin, Chun-Hung; Chen, Hsuen-Li; Chao, Wen-Chi; Hsieh, Chung-I; Chang, Wen-Huei |
| 國立成功大學 |
2006 |
Optical characterization of two-dimensional photonic crystals based on spectroscopic ellipsometry with rigorous coupled-wave analysis
|
Lin, Chun-Hung; Chen, Hsuen-Li; Chao, Wen-Chi; Hsieh, Chung-I; Chang, Wen-Huei |
| 國立臺灣大學 |
2006 |
Optical Characterization of Two-dimensional Photonic Crystals Based on Spectroscopic Ellipsometry with Rigorous Coupled-Wave Analysis
|
Lin, Chun-Hung; Chen, Hsuen-Li; Chao, Wen-Chi; Hsieh, Chung-I; Chang, Wen-Huei |
| 國立臺灣科技大學 |
2014 |
Optical characterization of undoped and Au-doped MoS2 single crystals
|
Sigiro M., Huang Y.-S., Ho C.-H. |
| 國立臺灣大學 |
1999 |
Optical characterization of visible multiquantum-well semiconductor lasers by collection/excitation modes of scanning near-field optical microscopy
|
Lu, N. H.; Tsai, D. P.; Chang, C. S.; T. T. Tsong |
| 國立臺灣師範大學 |
2014-12-02T06:41:30Z |
Optical Characterization of Wurtzite Gallium Nitride Nanowires
|
M.-W. Lee; H.-Z. Twu; Chia-Chun Chen; C.-H. Chen |
| 國立臺灣科技大學 |
2012 |
Optical characterization of Zn 0.35Cd 0.44Mg 0.21Se crystalline alloy by polarization-dependent contactless electroreflectance measurements
|
Dumcenco, D.;Levcenco, S.;Huang, Y.-S.;Hsu, H.-P.;Firszt, F.;Tiong, K.-K. |
| 國立臺灣海洋大學 |
2012 |
Optical characterization of Zn0.35Cd0.44Mg0.21Se crystalline alloy by polarization-dependent contactless electroreflectance measurements
|
Dumitru Dumcenco; Sergiu Levcenco; Ying-Sheng Huang; Hung-Pin Hsu; Franciszek Firszt; Kwong-Kau Tiong |
| 國立臺灣科技大學 |
2015 |
Optical characterization of Zn0.48Cd0.52Se/Zn0.24Cd0.18Mg0.58Se asymmetric coupled quantum well structure
|
Wu, S.L.;Hsu, H.P.;Wu, Y.F.;Huang, Y.S.;Charles, W.O.;Shen, A.;Tamargo, M.C. |
| 國立臺灣科技大學 |
2009 |
Optical characterization of Zn0.95-x Bex Mn0.05 Se mixed crystals
|
Dumcenco D.O.; Huang C.T.; Huang Y.S.; Firszt F.; Legowski S.; Meczynska H.; Marasek A.; Tiong K.K. |
| 國立臺灣科技大學 |
2008 |
Optical characterization of Zn0.95-xBe0.05Mn xSe mixed crystals
|
Hsu H.P.; Chang T.W.; Huang Y.S.; Firszt F.; Leowski S.; Meczynska H.; Marasek A.; Strzalkowski K.; Tiong K.K.; Munoz M. |
| 國立臺灣科技大學 |
2009 |
Optical characterization of Zn0.95-xBexMn0.05Se mixed crystals
|
Dumcenco, D.O.;Huang, C.T.;Huang, Y.S.;Firszt, F.;Legowski, S.;Meczynska, H.;Marasek, A.;Tiong, K.K. |
| 國立臺灣科技大學 |
2008 |
Optical characterization of Zn0.96 Be0.04 Se and Zn0.93 Mg0.07 Se mixed crystals
|
Hsu, H.P.;Huang, P.J.;Huang, C.T.;Huang, Y.S.;Firszt, F.;Legowski, S.;Meczynska, H.;Strzalkowski, K.;Marasek, A.;Tiong, K.K. |
| 國立臺灣海洋大學 |
2008 |
Optical characterization of Zn0.96Be0.04Se and Zn0.93Mg0.07Se mixed crystals
|
H. P. Hsu;P. J. Huang;C. T. Huang;Y. S. Huang;F. Firszt;S. Łęgowski;H. Męczyńska;K. Strzałkowski; A. Marasek;K. K. Tiong |
| 國立交通大學 |
2014-12-08T15:06:13Z |
Optical characterization of Zn0.97Mn0.03Se/ZnSe0.92Te0.08 type II multiple-quantum-well structures
|
Lin, D. Y.; Shiu, J. J.; Wu, J. D.; Yang, C. S.; Chou, W. C. |
| 國立臺灣海洋大學 |
2008-07-15 |
Optical Characterization of Zn095-xBe005MnxSe Mixed Crystals
|
H. P. Hsu; T. W. Chang; Y. S. Huang; F. Firszt; S. Łegowski; H Meczynska; A. Marasek; K. Strzałkowski; K. K. Tiong; M. Munoz |
| 國立交通大學 |
2014-12-08T15:43:11Z |
Optical characterization of ZnMnO thin films on c-Al2O3
|
Lin, H. J.; Lin, D. Y.; Wu, J. S.; Chou, W. C.; Yang, C. S.; Wang, J. S.; Lo, W. H. |
| 國立彰化師範大學 |
2008-07 |
Optical Characterization of ZnMnO Thin Films on c-Al2O3
|
Lin, H. J. ; Lin, D. Y. ; Wu, Jenq-Shinn; Chou, W. C. ;Yang, C. S. ; Wang, J. S. ; Lo, W. H. |
| 國立臺灣大學 |
2006 |
Optical Characterization of ZnO Materials Grown by Modified Melt Growth Technique
|
Feng, Z. C.; Yu, J. W.; Wang, J. B.; Varatharajan, R.; Nemeth, B.; Nause, J.; Ferguson, I.; Lu, W.; Collins, W. E. |
| 國立交通大學 |
2014-12-08T15:17:04Z |
Optical characterization of ZnSe epilayers and ZnCdSe/ZnSe quantum wells grown on Ge/Ge0.95Si0.05/Ge0.9Si0.1/Si virtual substrates
|
Ku, JT; Kuo, MC; Shen, JL; Chiu, KC; Yang, TH; Luo, GL; Chang, CY; Lin, YC; Fu, CP; Chuu, DS; Chia, CH; Chou, WC |
| 臺大學術典藏 |
2018-09-10T04:14:57Z |
Optical characterization on InAs/GaAs quantum dots
|
C. M. Lai,; F. Y. Chang,; C. W. Chang,; H. H. Lin,; G. J. Jan,; HAO-HSIUNG LIN |
