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显示项目 874201-874210 / 2348617 (共234862页)
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| 國立成功大學 |
2002 |
Thin oxide breakdown mechanism of constant voltage stress on MOSFETs
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Chen, J. H.; Wei, C. T.; Wong, Shyh-Chyi; Wang, Yeong-Her |
| 東海大學 |
2002 |
Thin oxide breakdown mechanism of constant voltage stress on MOSFETs
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Chen J.H., Wei C.T., Wong S.C., Wang Y.H. |
| 國立交通大學 |
2014-12-08T15:04:16Z |
THIN OXIDE GROWN ON HEAVILY CHANNEL-IMPLANTED SUBSTRATE BY USING A LOW-TEMPERATURE WAFER LOADING AND N2 PRE-ANNEALING PROCESS
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WU, SL; LEE, CL; LEI, TF |
| 國立臺灣大學 |
1990 |
Thin Oxide Thickness Measurement in Ellipsometry by a Wafer Rotation Method
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胡振國; Ho, I. H.; Chou, S. P.; Hwu, Jenn-Gwo; Ho, I. H.; Chou, S. P. |
| 國立交通大學 |
2014-12-08T15:42:22Z |
Thin oxides grown on disilane-based polysilicon
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Lee, JW; Lei, TF; Lee, CL |
| 國立交通大學 |
2014-12-08T15:01:30Z |
Thin oxides with in situ native oxide removal
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Chin, A; Chen, WJ; Chang, T; Kao, RH; Lin, BC; Tsai, C; Huang, JCM |
| 國立交通大學 |
2019-04-02T05:59:49Z |
Thin oxides with in situ native oxide removal
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Chin, A; Chen, WJ; Chang, T; Kao, RH; Lin, BC; Tsai, C; Huang, JCM |
| 國立交通大學 |
2014-12-08T15:03:26Z |
THIN POLYOXIDE ON THE TOP OF POLY-SI GATE TO SUPPRESS BORON PENETRATION FOR PMOS
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LIN, YH; LEE, CL; LEI, TF; CHAO, TS |
| 國立臺灣科技大學 |
2008 |
Thin porous Ni-YSZ films as anodes for a solid oxide fuel cell
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Jou, S.;Wu, T.-H. |
| 國立臺灣大學 |
2009 |
Thin Silicon Oxide Films on N-type 4H-SiC Prepared by Scanning Frequency Anodization Method
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Chuang, Kai-Chieh; Hwu, Jenn-Gwo |
显示项目 874201-874210 / 2348617 (共234862页)
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