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显示项目 883601-883610 / 2344573 (共234458页)
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机构 日期 题名 作者
國立成功大學 2003-03-15 Transmission electron microscopic study on setting mechanism of tetracalcium phosphate/dicalcium phosphate anhydrous-based calcium phosphate cement Chen, Wen-Cheng; Lin, Jiin-Huey Chern; Ju, Chien-Ping
國立交通大學 2014-12-08T15:16:09Z Transmission electron microscopy assessment of the Si enhancement of Ti/Al/Ni/Au Ohmic contacts to undoped AIGaN/GaN heterostructures Desmaris, Vincent; Shiu, Jin-Yu; Lu, Chung-Yu; Rorsman, Niklas; Zirath, Herbert; Chang, Edward-Yi
臺大學術典藏 2020-04-24T08:53:15Z Transmission electron microscopy characterization of HfO 2/GaAs(001) heterostructures grown by molecular beam epitaxy Liou, S.C.; Chu, M.-W.; Chen, C.H.; Lee, Y.J.; Chang, P.; Lee, W.C.; Hong, M.; Kwo, J.
臺大學術典藏 2019-12-27T07:49:41Z Transmission electron microscopy characterization of HfO 2/GaAs(001) heterostructures grown by molecular beam epitaxy Liou, S.C.; Chu, M.-W.; Chen, C.H.; Lee, Y.J.; Chang, P.; Lee, W.C.; Hong, M.; Kwo, J.; MINGHWEI HONG
臺大學術典藏 2018-09-10T07:01:20Z Transmission electron microscopy characterization of HfO2/GaAs (001) heterostructures grown by molecular beam epitaxy Liou, SC; Chu, M-W; Chen, CH; Lee, YJ; Chang, P; Lee, WC; Hong, M; Kwo, J; MINGHWEI HONG
國立臺灣大學 2008-06 Transmission electron microscopy characterization of HfO2/GaAs(001) heterostructures grown by molecular beam epitaxy Liou, SC; Chu, MW; Chen, CH
國立臺灣大學 2010 Transmission Electron Microscopy Characterization of Ni(V) Metallization Stressed Under High Current Density in Flip Chip Solder Joints Tsai, M.Y.; Lin, Y.L.; Lin, Y.W.; Ke, J.H.; Kao, C.R.
臺大學術典藏 2019-11-27T02:02:48Z Transmission electron microscopy characterization of the porous structure induced by high current density in the flip-chip solder joints C. ROBERT KAO;Kao C.R.;Lin Y.-L.;Tsai M.-Y.; Tsai M.-Y.; Lin Y.-L.; Kao C.R.; C. ROBERT KAO
國立中山大學 1990 Transmission Electron Microscopy Observations of Fatigue Deformation in Fe-19Cr-4Ni-2Al Alloy N.J. Ho;S.C. Tjong;Y.C. Chang
國立交通大學 2014-12-08T15:15:56Z Transmission electron microscopy studies of GaAs nanostructures in InGaAs/InP matrix grown by molecular beam epitaxy Lin, S. D.; Lin, Z. C.; Lee, C. P.

显示项目 883601-883610 / 2344573 (共234458页)
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每页显示[10|25|50]项目