|
English
|
正體中文
|
简体中文
|
總筆數 :0
|
|
造訪人次 :
51991350
線上人數 :
788
教育部委託研究計畫 計畫執行:國立臺灣大學圖書館
|
|
|
顯示項目 215751-215760 / 2348439 (共234844頁) << < 21571 21572 21573 21574 21575 21576 21577 21578 21579 21580 > >> 每頁顯示[10|25|50]項目
| 臺大學術典藏 |
2019-11-04T06:41:55Z |
Automatic debris flow detection using geophones
|
KO-FEI LIU;Wei, Shih Chao; Wei, Shih Chao; KO-FEI LIU |
| 臺大學術典藏 |
2018-09-10T09:25:33Z |
Automatic Decoder Synthesis: Methods and Case Studies
|
Hsiou-Yuan Liu;Yen-Cheng Chou;Chen-Hsuan Lin;Jie-Hong R. Jiang; Hsiou-Yuan Liu; Yen-Cheng Chou; Chen-Hsuan Lin; Jie-Hong R. Jiang; JIE-HONG JIANG |
| 國立臺灣科技大學 |
2019 |
Automatic Defect Detection System Based on Deep Convolutional Neural Networks
|
Chen, Y.-F.;Yang, F.-S.;Su, E.;Ho, C.-C. |
| 元智大學 |
2005-08 |
Automatic defect inspection for LCDs using singular value decomposition
|
C. J. Lu (呂奇傑); 蔡篤銘 |
| 元智大學 |
2006-10 |
Automatic defect inspection of patterned TFT-LCD panels using Fourier image reconstruction
|
蔡篤銘; Su-Ta Chuang; Yan-Hsin Tseng |
| 元智大學 |
2005-11 |
Automatic defect inspection of patterned thin film transistor-liquid crystal display (TFT-LCD) panels using one-dimensional Fourier reconstruction and wavelet decomposition
|
蔡篤銘; C. Y. Hung (洪崇祐) |
| 元智大學 |
2014-10-12 |
Automatic defect inspection of TFT-LCD panels using Fourier image reconstruction
|
Du-Ming Tsai; Yan-Hsin Tseng; Wei-Yao Chiu |
| 國立臺灣科技大學 |
2013 |
Automatic defect inspection system of colour filters using Taguchi-based neural network
|
Kuo, C.-F.;Hsu, C.-T.M.;Fang, C.-H.;Chao, S.-M.;Lin, Y.-D. |
| 元智大學 |
2002-12 |
Automatic defect inspectoin for LCDs using singular value decomposition
|
蔡篤銘; Chi-Jie Lu; Hus-Nan Yen |
| 國立交通大學 |
2014-12-08T15:36:16Z |
Automatic defect recognition of TFT array process using gray level co-occurrence matrix
|
Yang, Shih-Wei; Lin, Chern-Sheng; Lin, Shir-Kuan; Chiang, Hsien-Te |
顯示項目 215751-215760 / 2348439 (共234844頁) << < 21571 21572 21573 21574 21575 21576 21577 21578 21579 21580 > >> 每頁顯示[10|25|50]項目
|