|
English
|
正體中文
|
简体中文
|
總筆數 :0
|
|
造訪人次 :
52796139
線上人數 :
600
教育部委託研究計畫 計畫執行:國立臺灣大學圖書館
|
|
|
顯示項目 294786-294795 / 2348719 (共234872頁) << < 29474 29475 29476 29477 29478 29479 29480 29481 29482 29483 > >> 每頁顯示[10|25|50]項目
| 佛光大學 |
2003-11-20 |
Critical Perspective on Technology Integration: A Case Study of One Computer-Assisted Course in the University Foreign Language Classroom.
|
許惠美; Hsu, Hui-Mei |
| 嘉南藥理大學 |
2009 |
Critical Perspectives on Accounting
|
Elsevier SDOL |
| 南台科技大學 |
2014-11 |
Critical perspectives on testing teaching: reframing teacher education for English medium instruction
|
Da-Fu Huang; Michael Singh |
| 國立臺灣大學 |
2001 |
Critical phase band for Chinese character recognition.
|
Chen, I.; Yeh, S.L.; Lin, S.Y. |
| 南台科技大學 |
2005-08 |
Critical Phenomena in the Amorphous Ni62Nb8B30 Ferromagnet
|
王聖璋; Chun Rong Lin; Wen-Chieh Lee; KaiJan Lin; Sheng-Chang Wang |
| 南台科技大學 |
2005 |
Critical phenomena in the amorphous Ni62Nb8B30 ferromagnet
|
林春榮; Chun-Rong Lin; Wen-Chieh Lee |
| 國立中山大學 |
1990 |
Critical Phenomena of Amorphous Ferromagnet (Fe9NbO0.1)76B24
|
I.M. Jiang;S.T. Lin;C.H. Lo |
| 國立交通大學 |
2014-12-08T15:34:52Z |
Critical point defect detection for small-pixel thin-film transistor array applied to medical display
|
Wang, Yao-Chin; Lin, Bor-Shyh |
| 國立交通大學 |
2014-12-08T15:37:19Z |
Critical point energy as a function of electric field determined by electroreflectance of surface-intrinsic-n(+) type doped GaAs
|
Chen, YS; Wu, KS; Wang, DP; Huang, KF; Huang, TC |
| 國立中山大學 |
2004 |
Critical point energy as a function of electric field determined by electroreflectance of surface-intrinsic-n+ type doped GaAs
|
Y.S. Chen;K.S. Wu;D.P. Wang;K.F. Huang;T.C. Huang |
顯示項目 294786-294795 / 2348719 (共234872頁) << < 29474 29475 29476 29477 29478 29479 29480 29481 29482 29483 > >> 每頁顯示[10|25|50]項目
|