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教育部委託研究計畫 計畫執行:國立臺灣大學圖書館
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顯示項目 423061-423070 / 2348638 (共234864頁)
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每頁顯示[10|25|50]項目
| 義守大學 |
2014-02 |
Failure analysis of EOS-induced damage at final electrical testing
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Ming-Kun Chen;Yu-Jung Huang;Chi-Chan Cheng;Yi-Lung Lin;Shen-Li Fu |
| 國立交通大學 |
2014-12-08T15:26:28Z |
Failure analysis of ESD damage in a high-voltage driver IC and the effective ESD protection solution
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Ker, MD; Peng, JJ; Jiang, HC |
| 國立成功大學 |
2015-12-15 |
Failure analysis of fiber-reinforced composite laminates subjected to biaxial loads
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Hu, Hsuan-Teh; Lin, Wen-Pin; Tu, Fang-Tai |
| 國立交通大學 |
2017-04-21T06:48:54Z |
Failure Analysis of Gate-all-around Nanowire Field Effect Transistor Under TLP Test
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Zhang, Guoyan; Dong, Aihua; Liu, Nie; Tian, Rui; Yang, Xuejiao; Liu, Zhiwei; Lee, Kohui; Lin, Horng-Chih; Liou, Juin J.; Wang Yuxin |
| 國立成功大學 |
2012-03 |
Failure Analysis of Halogen-Free Printed Circuit Board Assembly Under Board-Level Drop Test
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Chang, Hung-Jen; Zhan, Chau-Jie; Chang, Tao-Chih; Chou, Jung-Hua |
| 國立高雄應用科技大學 |
2008 |
Failure analysis of pad-height effects in the fine-pitch interconnection of the anisotropic conductive films
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Lin, Chao-Ming; Lin, Tzu-Chao; Fang, Te-Hua; Chao, Kuo-Sheng |
| 亞洲大學 |
2012-09 |
Failure Analysis of Power MOSFETs based on Multi-finger Configuration under Unclamped Inductive Switching (UIS) Stress Condition
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楊紹明;Yang, Shao-Ming;蔡宗叡;Tsai, Jung-Ruey;許健;Sheu, Gene |
| 亞洲大學 |
2012-09 |
Failure Analysis of Power MOSFETs based on Multifinger Configuration under Unclamped Inductive
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楊紹明;Yang, Shao-Ming;許健;Sheu, Gene |
| 國立勤益科技大學 |
2008-02 |
Failure Analysis of Reverse Shaft in the Transmission System of All-Terrain Vehicles
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Lin, Chun-Yuan;Hung, Jui-Pin;Hsu, Tze-Chi |
| 國立交通大學 |
2014-12-08T15:21:42Z |
Failure Analysis of Small Composite Sandwich Turbine Blade Subjected to Extreme Wind Load
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Chen, C. P.; Kam, T. Y. |
顯示項目 423061-423070 / 2348638 (共234864頁)
<< < 42302 42303 42304 42305 42306 42307 42308 42309 42310 42311 > >>
每頁顯示[10|25|50]項目
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