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機構 日期 題名 作者
國立臺灣海洋大學 2008-08 Full-field Hard X-Ray Microscopy below 30 Nanometers: a Challenging Nanofabrication Achievement Giorgio Margaritondo; Yu-Tung Chen; Tsung-Nan Lo; Yong S. Chu; Jaemock Yi; Chi-Jen Liu; Jun-Yue Wang; Cheng-Liang Wang; Chen-Wei Chiu; Tzu-En Hua; Yeukuang Hwu; Qun Shen; Gung-Chian Yin; Keng S. Liang; Hong-Ming Lin; Jung-Ho Je
國立成功大學 2006-11-01 Full-field heterodyne polariscope with an image signal processing method for principal axis and phase retardation measurements Lo, Yu-Lung; Chih, Hung-Wei; Yeh, Cheng-Yen; Yu, Tsung-Chih
臺大學術典藏 2021-10-07T08:46:31Z Full-field measurement of carbon fiber composite under tensile test using digital image correlation Chien-Ching Ma; Ching-Yuan Chang; Wan-Hsuan Chou; CHIEN-CHING MA
臺大學術典藏 2018-09-10T15:20:32Z Full-field Measurement of Deformation and Vibration using Digital Image Correlation Liang-Chih Chen; Ching-Yuan Chang; Wei-Chen Lee; Chien-Ching Ma; CHIEN-CHING MA
臺大學術典藏 2020-01-13T08:21:32Z Full-field measurement of deformation and vibration using digital image correlation Chen, L.-C.; Chang, C.-Y.; Lee, W.-C.; Ma, C.-C.; LIANG-CHIA CHEN
臺大學術典藏 2022-09-21T23:30:09Z Full-field Measurement of Deformation and Vibration using Digital Image Correlation LIANG-CHIH CHEN; Chang, Ching Yuan; Lee, Wei Chen; CHIEN-CHING MA
國立交通大學 2014-12-08T15:09:50Z Full-field measurement of the phase retardation for birefringent elements by using common path heterodyne interferometry Chen, Yen-Liang; Su, Der-Chin
臺大學術典藏 2020-01-13T08:21:46Z Full-field micro surface profilometry using digital fringe projection with spatial encoding principle Chen, L.-C.; Liao, C.-C.; Lai, M.-J.; LIANG-CHIA CHEN
國立成功大學 2011-10 Full-field microimaging with 8 keV X-rays achieves a spatial resolutions better than 20 nm Chen, Tsung-Yu; Chen, Yu-Tung; Wang, Cheng-Liang; Kempson, Ivan M.; Lee, Wah-Keat; Chu, Yong S.; Hwu, Y.; Margaritondo, G.
國立臺灣海洋大學 2011-10 Full-field microimaging with 8 keV X-rays achieves a spatial resolutions better than 20 nm G. Margaritondo; Tsung-Yu Chen; Yu-Tung Chen; Cheng-Liang Wang; Ivan M. Kempson; Wah-Keat Lee; Yong S. Chu; Y. Hwu

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