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顯示項目 470176-470200 / 2307984 (共92320頁)
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每頁顯示[10|25|50]項目
| 臺大學術典藏 |
2021-12-05T07:43:52Z |
Hot weather and chronic kidney disease of undetermined aetiology in Taiwan: nested case-control study from Changhua Community-based Integrated Screening programme
|
Jerry Che-Jui Chang; HSIAO-YU YANG |
| 國立成功大學 |
2000-10 |
Hot welter separation process for copper and insulating material recovery from electric cable waste
|
Sheih, Shing-Wen; Tsai, Min-Shing |
| 國立中山大學 |
2007 |
Hot Workability of the Mg65Cu20Y10Ag5 Amorphous/ NanoZrO2 Composite Alloy within Supercooled Temperature Region
|
L.J. Chang;G.R. Fang;Jason S.C. Jang;I.S. Lee;Jacob C. Huang;Chi Y.A. Tsao |
| 淡江大學 |
2008-08 |
Hot Zone in a Hydrocyclone for Particles Escape from Overflow
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Hsu, Chih-yuan; Wu, Rome-ming |
| 國立成功大學 |
2009-04 |
Hot-Carrier and Fowler-Nordheim (FN) Tunneling Stresses on RF Reliability of 40-nm PMOSFETs With and Without SiGe Source/Drain
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Tang, Mao-Chyuan; Fang, Yean-Kuen; Chen, David C.; Yeh, Chune-Sin |
| 東海大學 |
2004 |
Hot-Carrier Degradation Rate of High-Voltage Lateral Diffused Metal-Oxide-Semiconductor Field-Effect Transistors under Maximum Substrate Current Stress Conditions
|
Chen, S.-H., Gong, J., Wu, M.-C., Su, A.Y.-K. |
| 國立成功大學 |
2013-05 |
Hot-Carrier Effect on Amorphous In-Ga-Zn-O Thin-Film Transistors With a Via-Contact Structure
|
Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Yu-Te; Liao, Po-Yung; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Chun; Chen, Bo-Wei; Chu, Ann-Kuo; Chou, Cheng-Hsu; Chung, Wang-Cheng; Chang, Jung-Fang |
| 國立交通大學 |
2014-12-08T15:18:59Z |
Hot-carrier effects in p-channel modified Schottky-barrier FinFETs
|
Lin, CP; Tsui, BY |
| 國立交通大學 |
2014-12-08T15:39:08Z |
Hot-carrier effects on power characteristics of SiGeHBTs
|
Huang, SY; Chen, KM; Huang, GW; Tseng, HC; Hsu, TL; Chang, CY; Huang, TY |
| 國立交通大學 |
2014-12-08T15:18:55Z |
Hot-carrier induced degradations on RF power characteristics of SiGe heterojunction bipolar transistors
|
Huang, SY; Chen, KM; Huang, GW; Liang, V; Tseng, HC; Hsu, TL; Chang, CY |
| 國立交通大學 |
2014-12-08T15:25:51Z |
Hot-carrier induced degradations on RF power characteristics of SiGe heterojunction bipolar transistors
|
Huang, SY; Chen, KM; Huang, GW; Hsu, TL; Tseng, HC; Chang, CY |
| 國立交通大學 |
2020-02-02T23:55:33Z |
Hot-Carrier Injection-Induced Disturb and Improvement Methods in 3D NAND Flash Memory
|
Lin, Wei-Liang; Tsai, Wen-Jer; Cheng, C. C.; Lu, Chun-Chang; Ku, S. H.; Chang, Y. W.; Wu, Guan-Wei; Liu, Lenvis; Hwang, S. W.; Lu, Tao-Cheng; Chen, Kuang-Chao; Tseng, Tseung-Yuen; Lu, Chih-Yuan |
| 國立交通大學 |
2014-12-08T15:41:39Z |
Hot-carrier-induced degradation for partially depleted SOI 0.25-0.1 mu m CMOSFET with 2-nm thin gate oxide
|
Yeh, WK; Wang, WH; Fang, YK; Chen, MC; Yang, FL |
| 國立成功大學 |
2002-12 |
Hot-carrier-induced degradation for partially depleted SOI 0.25-0.1 mu m CMOSFET with 2-nm thin gate oxide
|
Yeh, Wen-Kuan; Wang, Wen-Han; Fang, Yean-Kuen; Chen, Mao-Chieh; Yang, Fu-Liang |
| 國立成功大學 |
2003-04 |
Hot-carrier-induced degradation on 0.1 mu m partially depleted silicon-on-insulator complementary metal-oxide-semiconductor field-effect-transistor
|
Yeh, Wen-Kuan; Wang, Wen-Han; Fang, Yean-Kuen; Yang, Fu-Liang |
| 國立彰化師範大學 |
1993-09 |
Hot-electron Bistability in Quantum-dot Structures
|
Goodnick, S. M. ; Wu, Jong-Ching; Wybourne, M. N. ; Smith, Doran D. |
| 臺大學術典藏 |
1994 |
Hot-Electron Distribution in Multiple Quantum Well Infrared Photodetectors
|
Newman, P. G.; Chang, W. H.; Kuan, Chieh-Hsiung; Tsui, D. C.; Choi, K. K.; 管傑雄; Tsui, D. C.; Choi, K. K.; Newman, P. G.; Chang, W. H.; Kuan, Chieh-Hsiung; Tsui, D. C.; Choi, K. K. |
| 國立臺灣大學 |
1994 |
Hot-Electron Distribution in Multiple Quantum Well Infrared Photodetectors
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管傑雄; Tsui, D. C.; Choi, K. K.; Newman, P. G.; Chang, W. H.; Kuan, Chieh-Hsiung; Tsui, D. C.; Choi, K. K.; Newman, P. G.; Chang, W. H. |
| 國立成功大學 |
2006-12 |
Hot-electron effects on AlGaAs/InGaAs/GaAs PHEMTs under accelerated DC stresses
|
Huang, Hou-Kuei; Wang, Chou-Sern; Houng, Mau-Phon; Wang, Yeong-Her |
| 國立交通大學 |
2014-12-08T15:44:35Z |
Hot-electron relaxation via optical phonon emissions in GaAs/AlxGa1-xAs quantum well structures: dependence upon the alloy composition and barrier width
|
Sun, KW; Chang, HY; Wang, CM; Wang, SY; Lee, CP |
| 國立交通大學 |
2014-12-08T15:37:06Z |
Hot-electron-induced electron trapping in 0.13 mu m nMOSFETs with ultrathin (EOT=1.6 nm) nitrided gate oxide
|
Chen, CW; Chien, CH; Perng, TH; Chang, CY |
| 臺北醫學大學 |
2013 |
Hot-hole Programmed Sol-gel Derived SONOS-Type Flash Memory
|
You, Yvonne;Yang, Wen-Luh;You, Hsin-Chiang;Wu, Chi-Chang |
| 臺北醫學大學 |
2013 |
Hot-hole Programmed Sol-gel Derived SONOS-Type Flash Memory
|
You, Yvonne;Yang, Wen-Luh;You, Hsin-Chiang;Wu, Chi-Chang |
| 國立臺灣科技大學 |
2012 |
Hot-injection synthesis of monodispersed Cu 2ZnSn(S xSe 1-x) 4 nanocrystals: Tunable composition and optical properties
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Ou, K.-L.;Fan, J.-C.;Chen, J.-K.;Huang, C.-C.;Chen, L.-Y.;Ho, J.-H.;Chang, J.-Y. |
| 臺北醫學大學 |
2012 |
Hot-injection synthesis of monodispersed Cu2ZnSn(SxSe1 x)4 nanocrystals
|
Ou, Keng-Liang;Fan, Jian-Cin;Chen, Jem-Kun;Huang, Chih-Ching;Chen, Liang-Yih;Ho, Jinn-Hsuan;Chang, Jia-Yaw |
顯示項目 470176-470200 / 2307984 (共92320頁)
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