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機構 日期 題名 作者
國立交通大學 2014-12-08T15:41:39Z Hot-carrier-induced degradation for partially depleted SOI 0.25-0.1 mu m CMOSFET with 2-nm thin gate oxide Yeh, WK; Wang, WH; Fang, YK; Chen, MC; Yang, FL
國立成功大學 2002-12 Hot-carrier-induced degradation for partially depleted SOI 0.25-0.1 mu m CMOSFET with 2-nm thin gate oxide Yeh, Wen-Kuan; Wang, Wen-Han; Fang, Yean-Kuen; Chen, Mao-Chieh; Yang, Fu-Liang
國立成功大學 2003-04 Hot-carrier-induced degradation on 0.1 mu m partially depleted silicon-on-insulator complementary metal-oxide-semiconductor field-effect-transistor Yeh, Wen-Kuan; Wang, Wen-Han; Fang, Yean-Kuen; Yang, Fu-Liang
國立彰化師範大學 1993-09 Hot-electron Bistability in Quantum-dot Structures Goodnick, S. M. ; Wu, Jong-Ching; Wybourne, M. N. ; Smith, Doran D.
臺大學術典藏 1994 Hot-Electron Distribution in Multiple Quantum Well Infrared Photodetectors Newman, P. G.; Chang, W. H.; Kuan, Chieh-Hsiung; Tsui, D. C.; Choi, K. K.; 管傑雄; Tsui, D. C.; Choi, K. K.; Newman, P. G.; Chang, W. H.; Kuan, Chieh-Hsiung; Tsui, D. C.; Choi, K. K.
國立臺灣大學 1994 Hot-Electron Distribution in Multiple Quantum Well Infrared Photodetectors 管傑雄; Tsui, D. C.; Choi, K. K.; Newman, P. G.; Chang, W. H.; Kuan, Chieh-Hsiung; Tsui, D. C.; Choi, K. K.; Newman, P. G.; Chang, W. H.
國立成功大學 2006-12 Hot-electron effects on AlGaAs/InGaAs/GaAs PHEMTs under accelerated DC stresses Huang, Hou-Kuei; Wang, Chou-Sern; Houng, Mau-Phon; Wang, Yeong-Her
國立交通大學 2014-12-08T15:44:35Z Hot-electron relaxation via optical phonon emissions in GaAs/AlxGa1-xAs quantum well structures: dependence upon the alloy composition and barrier width Sun, KW; Chang, HY; Wang, CM; Wang, SY; Lee, CP
國立交通大學 2014-12-08T15:37:06Z Hot-electron-induced electron trapping in 0.13 mu m nMOSFETs with ultrathin (EOT=1.6 nm) nitrided gate oxide Chen, CW; Chien, CH; Perng, TH; Chang, CY
臺北醫學大學 2013 Hot-hole Programmed Sol-gel Derived SONOS-Type Flash Memory You, Yvonne;Yang, Wen-Luh;You, Hsin-Chiang;Wu, Chi-Chang

顯示項目 475941-475950 / 2348719 (共234872頁)
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