| 國立臺灣科技大學 |
2003 |
Investigation of DC electric arc furnace average power factor calculation using IEEE standard 1459
|
Chi-Jui Wu;Cheng-Ping Huang;Tsu-Hsun Fu;Tzu-Chih Zhao;Hung-Shian Kuo |
| 國立交通大學 |
2014-12-08T15:16:56Z |
Investigation of DC hot-carrier degradation at elevated temperatures for n-channel metal-oxide-semiconductor field-effect-transistor of 0.13 mu m technology
|
Lin, JC; Chen, SY; Chen, HW; Jhou, ZW; Lin, HC; Chou, S; Ko, J; Lei, TF; Haung, HS |
| 國立臺灣科技大學 |
2016 |
Investigation of defect free SiGe nanowire biosensor modified by dual plasma technology
|
Chen, Y.-M;Chang, T.-Y;Lai, C.-H;Chang, K.-M;Chen, Chen C.-F;Lai, Y.-L;Whang, A.J.-W;Lai, H.-L;Hsu, T.-R. |
| 國立交通大學 |
2017-04-21T06:56:03Z |
Investigation of Defect Free SiGe Nanowire Biosensor Modified by Dual Plasma Technology
|
Chen, Yi-Ming; Chang, Tai-Yuan; Lai, Chiung-Hui; Chang, Kow-Ming; Chen, Chu-Feng; Lai, Yi-Lung; Whang, Allen Jong-Woei; Lai, Hui-Lung; Hsu, Terng-Ren |
| 國立成功大學 |
2014-11 |
Investigation of defect modes in a defective photonic crystal with a semiconductor metamaterial defect
|
Wu, Meng-Ru; Wu, Chien-Jang; Chang, Shoou-Jinn |
| 國立成功大學 |
2015-08-24 |
Investigation of defect-induced abnormal body current in fin field-effect-transistors
|
Liu, Kuan-Ju; Chang, Ting-Chang; Chen, Ching-En; Yang, Ren-Ya; Tsai, Jyun-Yu; Lu, Ying-Hsin; Liu, Xi-Wen; Cheng, Osbert; Huang, Cheng-Tung |
| 國立交通大學 |
2015-12-02T02:59:24Z |
Investigation of defect-induced abnormal body current in fin field-effect-transistors
|
Liu, Kuan-Ju; Chang, Ting-Chang; Chen, Ching-En; Yang, Ren-Ya; Tsai, Jyun-Yu; Lu, Ying-Hsin; Liu, Xi-Wen; Cheng, Osbert; Huang, Cheng-Tung |
| 國立臺灣大學 |
1989 |
Investigation of defects in amorphous silicon films using positron annihilation
|
Chen, Yang-Fang; Wang, Chia-Chi; Tseng, Poh-Kun; Lue, Jun-Tseng |
| 臺大學術典藏 |
2018-09-10T07:26:33Z |
Investigation of defects in amorphous silicon films using positron annihilation
|
Chen, Y.-F.;Wang, C.-C.;Tseng, P.-K.;Lue, J.-T.; Chen, Y.-F.; Wang, C.-C.; Tseng, P.-K.; Lue, J.-T.; YANG-FANG CHEN |
| 國立交通大學 |
2017-04-21T06:49:32Z |
Investigation of defects in organic semiconductors by charge based Deep Level Transient Spectroscopy (Q-DLTS)
|
Nguyen, T. P.; Renaud, C.; Le Rendu, P.; Yang, S. H. |
| 南台科技大學 |
2023-04 |
Investigation of deformation of viscoelastic materials is applied with hollow touch force
|
Yu-Jung Lee |
| 國立成功大學 |
2020 |
Investigation of deformation pattern and sliding mode in dip slopes using discrete element method
|
Lin, C.-H.;Weng, M.-C.;Li, H.-H. |
| 國立成功大學 |
2021-05 |
Investigation of Degradation Behavior During Illuminated Negative Bias Temperature Stress in P-Channel Low-Temperature Polycrystalline Silicon Thin-Film Transistors
|
Wang;Yu-Xuan;Chang;Ting-Chang;Tai;Mao-Chou;Wu;Chia-Chuan;Tu;Yu-Fa;Chen;Jian-Jie;Huang;Wei-Chen;Shih;Yu-Shan;Chen;Yu-An;Huang;Jen-Wei;Sze;Simon |
| 元智大學 |
2011-02 |
Investigation of degradation behavior of membrane electrode assembly with polytetrafluoroethylene/Nafion composite membrane
|
Ting-Chu Jao; Guo-Bin Jung; Pei-Hung Chi; Shih-Tsung Ke; Chan S.-H. |
| 元智大學 |
2011-02 |
Investigation of degradation behavior of membrane electrode assembly with polytetrafluoroethylene/Nafion composite membrane
|
Ting-Chu Jao; Guo-Bin Jung; Pei-Hung Chi; Shih-Tsung Ke; Chan S.-H. |
| 國立彰化師範大學 |
2003-04 |
Investigation of Degradation for Ohmic Performance of Oxidized Au/Ni/Mg-doped GaN
|
Lin, Yow-Jon; Li, Zhen-Dao; Hsu, Chou-Wei; Chien, Feng-Tso; Lee, Ching-Ting; Shao, Sheng-Tien; Chang, Hsing-Cheng |
| 國立臺灣科技大學 |
2006 |
Investigation of degradation in beryllium chalcogenide II-VI semiconductors
|
Tsai, W.C.;Cheng, C.L.;Chen, T.T.;Chen, Y.F.;Huang, Y.S.;Firszt, F.;Meczynska, H.;Marasek, A.;Legowski, S.;Strzakolski, K. |
| 臺大學術典藏 |
2018-09-10T05:50:16Z |
Investigation of degradation in beryllium chalcogenide II-VI semiconductors
|
Tsai, W.C.;Cheng, C.L.;Chen, T.T.;Chen, Y.F.;Huang, Y.S.;Firszt, F.;M?czy?ska, H.;Marasek, A.;??gowski, S.;Strzako?ski, K.; Tsai, W.C.; Cheng, C.L.; Chen, T.T.; Chen, Y.F.; Huang, Y.S.; Firszt, F.; M?czy?ska, H.; Marasek, A.; ??gowski, S.; Strzako?ski, K.; YANG-FANG CHEN |
| 國立交通大學 |
2018-08-21T05:56:42Z |
Investigation of Degradation of Single-Cell PV Module by Pressure Cooker Test and Damp Heat Test
|
Tung, Chao-Ming; Li, Yu-Tai; Yang, Wei-Lun; Wu, Hung-Sen; Yu, Peichen |
| 國立交通大學 |
2019-08-02T02:24:17Z |
Investigation of Degradation Phenomena in GaN-on-Si Power MIS-HEMTs under Source Current and Drain Bias Stresses
|
Yang, Chih-Yi; Wu, Tian-Li; Hsieh, Tin-En; Chang, Edward Yi |
| 南台科技大學 |
1996 |
Investigation of Demand-side Photovoltaic and Battery Energy Storage System(PVBESS) under Peak-Solar-Synchronism Operation
|
蔡明村; C. E. Lin ; M. T. Tsai ; C. L. Huang |
| 臺大學術典藏 |
2018-09-10T06:38:20Z |
Investigation of depilatory mechanism by use of multiphoton fluorescent microscopy
|
Lin, C.-Y.;Lee, G.-N.;Jee, S.-H.;Dong, C.-Y.;Lin, S.-J.; SHIOU-HWA JEE |
| 臺大學術典藏 |
2007 |
Investigation of depilatory mechanism by use of multiphoton fluorescent microscopy
|
Shiou-Hwa Jee; SHIOU-HWA JEE |
| 臺大學術典藏 |
2022-09-16T03:41:54Z |
Investigation of depilatory mechanism by use of multiphoton fluorescent microscopy
|
Lin C.-Y.; Lee G.-N.; Jee S.-H.; Dong C.-Y.; SUNG-JAN LIN |
| 臺大學術典藏 |
2022-09-16T03:41:58Z |
Investigation of depilatory mechanism by use of multiphoton fluorescent microscopy
|
Lin C.-Y.; Lee G.-N.; Jee S.-H.; Dong C.-Y.; SUNG-JAN LIN |
