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显示项目 526731-526740 / 2346788 (共234679页)
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| 國立聯合大學 |
2009 |
Investigation of High Temperature sintered Thick Film Resistors
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Chi-Shiung Hsi, Y. Yang, C. Chou, W. Lin, and W. Wu |
| 國立中山大學 |
1990 |
Investigation of High- Intensity Beam Characteristics on Welding Cavity Shape and Temperature Distribution
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P.S. Wei; T.H. Wu; Y.T. Chow |
| 國立交通大學 |
2014-12-08T15:12:04Z |
Investigation of High-Frequency Noise Characteristics in Tensile-Strained nMOSFETs
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Wang, Sheng-Chun; Su, Pin; Chen, Kun-Ming; Chen, Bo-Yuan; Huang, Guo-Wei; Hung, Cheng-Chou; Huang, Sheng-Yi; Fan, Cheng-Wen; Tzeng, Chih-Yuh; Chou, Sam |
| 國立交通大學 |
2014-12-08T15:27:39Z |
Investigation of high-power device and process for field emission display
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Yeh, CF; Liu, JS; Huang, CM |
| 國立成功大學 |
2023-03 |
Investigation of High-Sensitivity NO2 Gas Sensors with Ga2O3 Nanorod Sensing Membrane Grown by Hydrothermal Synthesis Method
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Chu;Shao-Yu;Wu;Mu-Ju;Yeh;Tsung-Han;Lee;Ching-Ting;Lee;Hsin-Ying |
| 元智大學 |
Mar-23 |
Investigation of High-Sensitivity NO2 Gas Sensors with Ga2O3 Nanorod Sensing Membrane Grown by Hydrothermal Synthesis Method
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李清庭; S. Y. Chu; M. J. Wu; T. H. Yeh; H. Y. Lee |
| 國立交通大學 |
2014-12-08T15:24:48Z |
Investigation of hot carrier degradation modes in LDMOS by using a novel three-region charge pumping technique
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Cheng, C. C.; Tu, K. C.; Wang, Tahui; Hsieh, T. H.; Tzeng, J. T.; Jong, Y. C.; Liou, R. S.; Pan, Sam C.; Hsu, S. L. |
| 國立交通大學 |
2017-04-21T06:50:13Z |
Investigation of Hot Carrier Reliability of Ultrathin Poly-Si Nanobelt Junctionless (UTNB-JL) Transistors on Different Underlying Insulators
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Chang, Jen-Hong; Chung, Chun-Chih; Lin, Jer-Yi; Chao, Tien-Sheng |
| 國立交通大學 |
2014-12-08T15:22:53Z |
Investigation of Hot-Carrier Stress Effect on High-Frequency Performance of Laterally Diffused Metal-Oxide-Semiconductor Transistors
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Chen, Kun-Ming; Mou, Zong-Wen; Kuo, Hao-Chung; Chiu, Chia-Sung; Chen, Bo-Yuan; Liu, Wen-De; Chen, Ming-Yi; Yang, Yu-Chi; Wang, Kai-Li; Huang, Guo-Wei |
| 國立成功大學 |
2009-04 |
Investigation of Hot-Carrier-Induced Degradation Mechanisms in p-Type High-Voltage Drain Extended Metal-Oxide-Semiconductor Transistors
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Chen, Jone F.; Chen, Shiang-Yu; Wu, Kuo-Ming; Liu, C. M. |
显示项目 526731-526740 / 2346788 (共234679页)
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每页显示[10|25|50]项目
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