|
English
|
正體中文
|
简体中文
|
總筆數 :0
|
|
造訪人次 :
52730773
線上人數 :
541
教育部委託研究計畫 計畫執行:國立臺灣大學圖書館
|
|
|
顯示項目 526796-526805 / 2348674 (共234868頁) << < 52675 52676 52677 52678 52679 52680 52681 52682 52683 52684 > >> 每頁顯示[10|25|50]項目
| 臺大學術典藏 |
2018-09-10T04:35:27Z |
Investigation of B1 Field Behavior of MRI by Debye's Potential Method
|
W.H.Chang; S.K.Jeng; W.P.Kuan; J.H.Chen; JYH-HORNG CHEN |
| 國立交通大學 |
2015-07-21T08:31:30Z |
Investigation of Backgate-Bias Dependence of Intrinsic Variability for UTB Hetero-Channel MOSFETs Considering Quantum Confinement
|
Yu, Chang-Hung; Su, Pin |
| 國立交通大學 |
2014-12-08T15:35:55Z |
Investigation of Backgate-Bias Dependence of Threshold-Voltage Sensitivity to Process and Temperature Variations for Ultra-Thin-Body Hetero-Channel MOSFETs
|
Yu, Chang-Hung; Su, Pin |
| 國立交通大學 |
2015-07-21T08:29:05Z |
Investigation of Backgate-Biasing Effect for Ultrathin-Body III-V Heterojunction Tunnel FET
|
Fan, Ming-Long; Hu, Vita Pi-Ho; Hsu, Chih-Wei; Su, Pin; Chuang, Ching-Te |
| 臺大學術典藏 |
2015 |
Investigation of Backgate-Biasing Effect for Ultrathin-Body III-V Heterojunction Tunnel FET
|
C.-W. Hsu; Pin Su; C.-T. Chuang; 胡璧合; VITA PI-HO HU; Y.-N. Chen; V. P.-H. Hu; M.-L. Fan; Pin Su; C.-T. Chuang; VITA PI-HO HU; C.-W. Hsu; Y.-N. Chen; V. P.-H. Hu; M.-L. Fan; M.-L. Fan;V. P.-H. Hu;Y.-N. Chen;C.-W. Hsu;Pin Su;C.-T. Chuang |
| 國立勤益科技大學 |
2008-05 |
Investigation of ballistic impact properties and fracture mechanisms of Ti3SiC2 ternary ceramics
|
Lo, Wen-Tse;Jeng, Ching-An;Huang, Jow-Lay;Lu, Horng-Hwa;Lii, Ding-Fwu |
| 義守大學 |
2008-05 |
Investigation of ballistic impact properties and fracture mechanisms of Ti3SiC2 ternary ceramics
|
Wen-Tse Lo;Ching-An Jeng;Jow-Lay Huang;Horng-Hw Lu;Ding-Fwu Lii |
| 國立成功大學 |
2008-05-08 |
Investigation of ballistic impact properties and fracture mechanisms of Ti3SiC2 ternary ceramics
|
Lo, Wen-Tse; Jeng, Ching-An; Huang, Jow-Lay; Lu, Horng-Hwa; Lii, Ding-Fwu |
| 國立臺灣海洋大學 |
2009-06-01 |
Investigation of Baltic Dry Indexes
|
Chung, Y.S.;Chung, Cheng-Chi |
| 元智大學 |
2014-05-07 |
Investigation of Band Edge Potential Fluctuation Induced by Intrinsic Defects in Cu2ZnSnSe4
|
Dan-Hua Hsieh; Jui-Fu Yang; Fang-I Lai; Hao-Chung Kuo |
顯示項目 526796-526805 / 2348674 (共234868頁) << < 52675 52676 52677 52678 52679 52680 52681 52682 52683 52684 > >> 每頁顯示[10|25|50]項目
|