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顯示項目 526921-526930 / 2346788 (共234679頁)
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| 臺大學術典藏 |
2020-02-26T01:36:30Z |
Investigation of low back pain using system modeling
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Khan, M.F.; Malik, A.S.; Xia, L.; Wang, J.-L.; Nikkhoo, M.; Parnianpour, M.; Khan, M.I.; JAW-LIN WANG |
| 臺大學術典藏 |
2018-09-10T18:05:15Z |
Investigation of low frequency electrolytic solution behavior with an accurate electrical impedance method
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Ho, K.-C.; Su, V.-C.; Huang, D.-Y.; Lee, M.-L.; Chou, N.-K.; Kuan, C.-H.; Nai-Kuan Chou |
| 臺大學術典藏 |
2020-03-09T07:30:33Z |
Investigation of low frequency electrolytic solution behavior with an accurate electrical impedance method
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Ho K.-C.;Su V.-C.;Huang D.-Y.;Lee M.-L.;Nai-Kuan Chou;Kuan C.-H.; Ho K.-C.; Su V.-C.; Huang D.-Y.; Lee M.-L.; NAI-KUAN CHOU; Kuan C.-H. |
| 國立交通大學 |
2014-12-08T15:24:28Z |
Investigation of Low Frequency Noise in Uniaxial Strained PMOSFETs
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Kuo, Jack J. -Y.; Chen, William P. -N.; Su, Pin |
| 國立交通大學 |
2019-04-02T05:58:50Z |
Investigation of low operation voltage InZnSnO thin-film transistors with different high-k gate dielectric by physical vapor deposition
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Ruan, Dun-Bao; Liu, Po-Tsun; Chiu, Yu-Chuan; Kan, Kai-Zhi; Yu, Min-Chin; Chien, Ta-Chun; Chen, Yi-Heng; Kuo, Po-Yi; Sze, Simon M. |
| 國立交通大學 |
2017-04-21T06:49:30Z |
Investigation of Low Temperature Cu/In Bonding in 3D Integration
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Hsieh, Yu-Sheng; Shen, Ting-Ting; Chien, Yu-San; Chen, Kuan-Neng; Shinozaki, Yuko; Kawasaki, Naohiko |
| 國立臺灣海洋大學 |
2010 |
Investigation of Low-Cost Surface Processing Techniques for Large-Size Multicrystalline Silicon Solar Cells
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Yuang-Tung Cheng;Jyh-Jier Ho;William J. Lee;Song-Yeu Tsai;Yung-An Lu;Jia-Jhe Liou;Shun-Hsyung Chang;Kang L. Wang |
| 國立成功大學 |
2014 |
Investigation of Low-Frequency Noise Characterization of 28-nm High-k pMOSFET with Embedded SiGe Source/Drain
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Tsai, Shih-Chang; Wu, San-Lein; Chen, Jone-Fang; Wang, Bo-Chin; Huang, Po Chin; Tsai, Kai-Shiang; Kao, Tsung-Hsien; Yang, Chih-Wei; Chen, Cheng-Guo; Lo, Kun-Yuan; Cheng, Osbert; Fang, Yean-Kuen |
| 國立成功大學 |
2015-09-10 |
Investigation of Low-Frequency Noise in High-k First/Metal Gate Last HfO2 and ZrO2 nMOSFETs
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Wu, San-Lein; Wang, Bo Chin; Lu, Yu-Ying; Tsai, Shih-Chang; Chen, Jone-Fang; Chang, Shoou-Jinn; Chang, Sheng-Po; Hsu, Che-Hua; Yang, Chih Wei; Chen, Cheng-Guo; Cheng, Osbert; Huang, Po-Chin |
| 國立成功大學 |
2016-01 |
Investigation of low-frequency noise of 28-nm technology process of high-k/metal gate p-MOSFETs with fluorine incorporation
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Kao, Tsung-Hsien; Chang, Shoou-Jinn; Fang, Yean-Kuen; Huang, Po-Chin; Wang, Bo-Chin; Wu, Chung-Yi; Wu, San-Lein |
顯示項目 526921-526930 / 2346788 (共234679頁)
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