|
顯示項目 526991-527000 / 2348685 (共234869頁)
<< < 52695 52696 52697 52698 52699 52700 52701 52702 52703 52704 > >>
每頁顯示[10|25|50]項目
| 國立成功大學 |
2020 |
Investigation of deformation pattern and sliding mode in dip slopes using discrete element method
|
Lin, C.-H.;Weng, M.-C.;Li, H.-H. |
| 國立成功大學 |
2021-05 |
Investigation of Degradation Behavior During Illuminated Negative Bias Temperature Stress in P-Channel Low-Temperature Polycrystalline Silicon Thin-Film Transistors
|
Wang;Yu-Xuan;Chang;Ting-Chang;Tai;Mao-Chou;Wu;Chia-Chuan;Tu;Yu-Fa;Chen;Jian-Jie;Huang;Wei-Chen;Shih;Yu-Shan;Chen;Yu-An;Huang;Jen-Wei;Sze;Simon |
| 元智大學 |
2011-02 |
Investigation of degradation behavior of membrane electrode assembly with polytetrafluoroethylene/Nafion composite membrane
|
Ting-Chu Jao; Guo-Bin Jung; Pei-Hung Chi; Shih-Tsung Ke; Chan S.-H. |
| 元智大學 |
2011-02 |
Investigation of degradation behavior of membrane electrode assembly with polytetrafluoroethylene/Nafion composite membrane
|
Ting-Chu Jao; Guo-Bin Jung; Pei-Hung Chi; Shih-Tsung Ke; Chan S.-H. |
| 國立彰化師範大學 |
2003-04 |
Investigation of Degradation for Ohmic Performance of Oxidized Au/Ni/Mg-doped GaN
|
Lin, Yow-Jon; Li, Zhen-Dao; Hsu, Chou-Wei; Chien, Feng-Tso; Lee, Ching-Ting; Shao, Sheng-Tien; Chang, Hsing-Cheng |
| 國立臺灣科技大學 |
2006 |
Investigation of degradation in beryllium chalcogenide II-VI semiconductors
|
Tsai, W.C.;Cheng, C.L.;Chen, T.T.;Chen, Y.F.;Huang, Y.S.;Firszt, F.;Meczynska, H.;Marasek, A.;Legowski, S.;Strzakolski, K. |
| 臺大學術典藏 |
2018-09-10T05:50:16Z |
Investigation of degradation in beryllium chalcogenide II-VI semiconductors
|
Tsai, W.C.;Cheng, C.L.;Chen, T.T.;Chen, Y.F.;Huang, Y.S.;Firszt, F.;M?czy?ska, H.;Marasek, A.;??gowski, S.;Strzako?ski, K.; Tsai, W.C.; Cheng, C.L.; Chen, T.T.; Chen, Y.F.; Huang, Y.S.; Firszt, F.; M?czy?ska, H.; Marasek, A.; ??gowski, S.; Strzako?ski, K.; YANG-FANG CHEN |
| 國立交通大學 |
2018-08-21T05:56:42Z |
Investigation of Degradation of Single-Cell PV Module by Pressure Cooker Test and Damp Heat Test
|
Tung, Chao-Ming; Li, Yu-Tai; Yang, Wei-Lun; Wu, Hung-Sen; Yu, Peichen |
| 國立交通大學 |
2019-08-02T02:24:17Z |
Investigation of Degradation Phenomena in GaN-on-Si Power MIS-HEMTs under Source Current and Drain Bias Stresses
|
Yang, Chih-Yi; Wu, Tian-Li; Hsieh, Tin-En; Chang, Edward Yi |
| 南台科技大學 |
1996 |
Investigation of Demand-side Photovoltaic and Battery Energy Storage System(PVBESS) under Peak-Solar-Synchronism Operation
|
蔡明村; C. E. Lin ; M. T. Tsai ; C. L. Huang |
顯示項目 526991-527000 / 2348685 (共234869頁)
<< < 52695 52696 52697 52698 52699 52700 52701 52702 52703 52704 > >>
每頁顯示[10|25|50]項目
|
