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顯示項目 527856-527865 / 2346275 (共234628頁)
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機構 日期 題名 作者
淡江大學 2005-11 Investigation on problems of interface cracks between piezoelectric and purely elastic materials Tsai, Chung-han; 應宜雄; Ing, Yi-shyong; Chen, Xi-hong
中原大學 1999 Investigation on Process Characteristics and Application of Injection-Compression Molding Process Shia-Chung Chen;Yung-Chung Chen;Lei-Ti Huang;Hsin-Shu Peng
元智大學 2006-11 Investigation on Production Polyhydroxyalkanoates from Aeromonas hydrophila Strain 吳和生; 魏毓宏; Yen-An Gong; Chi-Wei Lo; Hsiao-Ming Wan
國立交通大學 2019-08-23T01:09:55Z Investigation on psychological capital Chin-Tsu Chen; Chun-Fu Chen
國立交通大學 2014-12-08T15:22:48Z Investigation on residual stress and stress-optical coefficient for flexible electronics by photoelasticity Lee, Y. C.; Liu, T. S.; Wu, C. I.; Lin, W. Y.
國家衛生研究院 2021-10-12 Investigation on returning to work in liver cancer survivors in Taiwan: A 5-year follow-up study Yang, SW;Chen, WL;Wu, WT;Wang, CC
國立交通大學 2017-04-21T06:48:25Z Investigation on RF characteristics of stacked P-I-N polysilicon diodes for ESD protection design in 0.18-mu m CMOS technology Shiu, Yu-Da; Chuang, Che-Hao; Ker, Ming-Dou
國立交通大學 2014-12-08T15:10:44Z Investigation on Robustness of CMOS Devices Against Cable Discharge Event (CDE) Under Different Layout Parameters in a Deep-Submicrometer CMOS Technology Ker, Ming-Dou; Lai, Tai-Hsiang
義守大學 2008-11 Investigation on Robustness of CMOS Devices Against Cable Discharge Event (CDE) Under Different Layout Parameters in a Deep-Submicrometer CMOS Technology Ming-Dou Ker;Tai-Hsiang Lai
國立交通大學 2014-12-08T15:32:12Z Investigation on Safe Operating Area and ESD Robustness in a 60-V BCD Process with Different Deep P-Well Test Structures Dai, Chia-Tsen; Ker, Ming-Dou

顯示項目 527856-527865 / 2346275 (共234628頁)
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