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顯示項目 557376-557385 / 2348570 (共234857頁)
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| 臺大學術典藏 |
1990 |
Low Leakage Current and High Breakdown Voltage P﹢N Diode
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Sun, Tai-Ping; Lee, Si-Chen; Yang, Seng-Jenn; Sun, Tai-Ping; 李嗣涔; 楊聲震; Sun, Tai-Ping; Lee, Si-Chen; Yang, Seng-Jenn |
| 國立臺灣大學 |
1990 |
Low Leakage Current and High Breakdown Voltage P﹢N Diode
|
Sun, Tai-Ping; 李嗣涔; 楊聲震; Sun, Tai-Ping; Lee, Si-Chen; Yang, Seng-Jenn |
| 國立成功大學 |
2002-04-15 |
Low leakage current Cu(Ti)/SiO2 interconnection scheme with a self-formed TiOx diffusion barrier
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Liu, C. J.; Chen, Jen-Sue |
| 國立中山大學 |
2005 |
Low Leakage Current Flrorinated LPD-SiO2/MOCVD-TiO2 Films
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Ming-Kwei Lee; Jung-Jie Huang; Tsung-Shun Wu |
| 國立交通大學 |
2014-12-08T15:36:26Z |
Low Leakage Current GaN MIS-HEMT with SiNx Gate Insulator using N-2 Plasma Treatment
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Liu, S. C.; Wang, H. C.; Chang, E. Y. |
| 國立交通大學 |
2014-12-08T15:25:49Z |
Low leakage reliability characterization methodology for advanced CMOS with gate oxide in the 1nm range
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Chung, SS; Feng, HJ; Hsieh, YS; Liu, A; Lin, WM; Chen, DF; Ho, JH; Huang, KT; Yang, CK; Cheng, O; Sheng, YC; Wu, DY; Shiau, WT; Chien, SC; Liao, K; Sun, SW |
| 東海大學 |
2013 |
Low leakage TCAM for IP lookup using two-side self-gating
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Chang, Y.-J.; Tsai, K.-L.; Tsai, H.-J. |
| 中山醫學大學 |
2009 |
Low level energy diode laser treatment on burning mouth syndrome
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Huang, Yu-Feng |
| 亞洲大學 |
2009-09 |
Low Level Laser Stimulation of K1 Acupoint Induced Precuneus Activations
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謝長倭;Hsieh, Chang-Wei |
| 臺大學術典藏 |
2020-06-11T06:47:16Z |
Low level laser stimulation of K1 acupoint induced precuneus activations
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Hsieh, C.-W.;Hsieh, C.-H.;Wu, J.-H.;Wang, Q.-F.;Chen, J.-H.; Hsieh, C.-W.; Hsieh, C.-H.; Wu, J.-H.; Wang, Q.-F.; Chen, J.-H.; JYH-HORNG CHEN |
顯示項目 557376-557385 / 2348570 (共234857頁)
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