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顯示項目 621116-621125 / 2348719 (共234872頁) << < 62107 62108 62109 62110 62111 62112 62113 62114 62115 62116 > >> 每頁顯示[10|25|50]項目
| 元智大學 |
2007-05 |
Novel method for measuring temperature distribution within fuel cell using microsensors
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李其源; 謝箕烈; 吳冠緯 |
| 元智大學 |
2004-08 |
Novel method for measuring the thickness of quartz using a plate wave sensor
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李其源 |
| 臺大學術典藏 |
2018-09-10T04:49:50Z |
Novel method for measuring the thickness of quartz using a plate wave sensor
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Lee, C.-Y.; Cheng, Y.-C.; Chen, Y.-Y.; Chang, P.-Z.; Dai, C.-L.; Chen, P.-H.; Pao, S.-Y.; Chen, W.-J.; PING-HEI CHEN |
| 國立臺灣大學 |
2006-01 |
novel method for rapid fabrication of a microlens array using micro transfer molding with soft mold
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Chang, C.-Y.; Yang, S.-Y.; Huang, L.-S.; Jeng, T.-M. |
| 國立臺灣大學 |
1994 |
Novel Method for the Preparation of Metal Cyclopropenyl Complexes from Vinylidene Complexes with an Electron-Withdrawing Substituent
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Ting, Pei-Chen; Lin, Yin-Chih; Cheng, Ming-Chu; Wang, Yu |
| 臺大學術典藏 |
2018-09-10T04:47:53Z |
Novel method for the preparation of metal cyclopropenyl complexes from vinylidene complexes with an electron-withdrawing substituent
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Ting, P.-C.;Lin, Y.-C.;Cheng, M.-C.;Wang, Y.; Ting, P.-C.; Lin, Y.-C.; Cheng, M.-C.; Wang, Y.; YING-CHIH LIN |
| 國立交通大學 |
2014-12-08T15:16:57Z |
Novel method of converting metallic-type carbon nanotubes to semiconducting-type carbon nanotube field-effect transistors
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Chen, Bae-Horng; Wei, Jeng-Hua; Lo, Po-Yuan; Pei, Zing-Way; Chao, Tien-Sheng; Lin, Horng-Chin; Huang, Tiao-Yuan |
| 淡江大學 |
2008-08 |
Novel Method of Growing Ultrananocrystalline Diamond Tips and Their Field Emission Property Study
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Joseph, P. T.; Chen, Li-ju; Tai, Nyan-hwa; Palnitkar, Umesh; Cheng, Hsiu-fung; 林諭男; Lin, I-nan |
| 國立成功大學 |
2004-11-16 |
Novel method of pentacene alignment using photoaligned polyimide and its application in thin-film transistors
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Chou, W. Y.; Kuo, C. W.; Cheng, Horng-Long; Mai, Yu-Shen; Lin, S. T.; Liao, Chi-Chang; Chang, C. C.; Tang, F. C.; Hwang, Jenn-Shyong |
| 臺大學術典藏 |
2021-11-22T09:11:37Z |
Novel Method to Investigate the Critical Depth of Cut of Ground Si Wafer
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Young, H.T.; Liao, H.T.; HONG-TSU YOUNG |
顯示項目 621116-621125 / 2348719 (共234872頁) << < 62107 62108 62109 62110 62111 62112 62113 62114 62115 62116 > >> 每頁顯示[10|25|50]項目
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