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顯示項目 927456-927465 / 2351361 (共235137頁)
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| 臺大學術典藏 |
2020-04-24T08:53:12Z |
X-ray photoelectron spectroscopy and high resolution electron microscopy studies of Aurivillius compounds: Bi4-xLaxTi3O12(x=0, 0.5, 0.75, 1.0, 1.5, and 2.0)
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Chu, M.-W.; Ganne, M.; Caldes, M.T.; Brohan, L. |
| 國立成功大學 |
2009-07-14 |
X-ray Photoelectron Spectroscopy and in Situ X-ray Absorption Spectroscopy Studies on Reversible Insertion/Desertion of Dicyanamide Anions into/from Manganese Oxide in Ionic Liquid
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Chang, Jeng-Kuei; Lee, Ming-Tsung; Tsai, Wen-Ta; Deng, Ming-Jay; Sun, I-Wen |
| 國立臺灣海洋大學 |
2013-10 |
X-ray photoelectron spectroscopy and transmission electron microscopy study of internally oxidized Nb–Ru coatings
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Yung-I Chen; Sin-Min Chen; Li-Chun Chang; Hsiu-Nuan Chu |
| 國立交通大學 |
2014-12-08T15:10:56Z |
X-ray photoelectron spectroscopy energy band alignment of spin-on CoTiO(3) high-k dielectric prepared by sol-gel spin coating method
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Kao, Kuo-Hsing; Chuang, Shiow-Huey; Wu, Woei-Cherng; Chao, Tien-Sheng; Chen, Jian-Hao; Ma, Ming-Wen; Gao, Reui-Hong; Chiang, Michael Y. |
| 國立交通大學 |
2019-04-02T06:01:07Z |
X-ray photoelectron spectroscopy energy band alignment of spin-on CoTiO3 high-k dielectric prepared by sol-gel spin coating method
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Kao, Kuo-Hsing; Chuang, Shiow-Huey; Wu, Woei-Cherng; Chao, Tien-Sheng; Chen, Jian-Hao; Ma, Ming-Wen; Gao, Reui-Hong; Chiang, Michael Y. |
| 國立成功大學 |
2000-04 |
X-ray photoelectron spectroscopy investigation of substrate surface pretreatments for diamond nucleation by microwave plasma chemical vapor deposition
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Chiang, Ming-Jeng; Hon, Min-Hsiung |
| 國立交通大學 |
2014-12-08T15:43:40Z |
X-ray photoelectron spectroscopy of gate-quality silicon oxynitride films produced by annealing plasma-nitrided Si(100) in nitrous oxide
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Chen, HW; Landheer, D; Chao, TS; Hulse, JE; Huang, TY |
| 國立彰化師範大學 |
2000-07 |
X-ray Photoelectron Spectroscopy Study of (NH4)2Sx-treated Mg-doped GaN Layers
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Lin, Yow-Jon; Tsai, Chang-Da; Lyu, Yen-Tang; Lee, Ching-Ting |
| 臺大學術典藏 |
2003 |
X-ray photoemission spectroscopy characterization of the electrode-ferroelectric interfaces in Pt/Bi4Ti3O12/Pt and Pt/Bi3.25La0.75Ti3O12/Pt capacitors: Possible influence of defect structure on fatigue properties
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Brohan, L.; Gautier, E.; Caldes, T.; Ganne, M.; Chu, M.-W. |
| 臺大學術典藏 |
2020-03-31T08:25:14Z |
X-ray photoemission study in Re0.7Ca0.3 MnO 3 epitaxial films
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Hsu, D.; Mani, A.; Chuang, C. H.; Chen, C. H.; Lin, M. T.; Lin, J. G. |
顯示項目 927456-927465 / 2351361 (共235137頁)
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