| 國立政治大學 |
2009-9 |
Automatic term pair extraction from bilingual patent corpus
|
Tseng, Y.-H.;Liu, Chaolin; 劉昭麟 |
| 元智大學 |
Oct-14 |
Automatic test case generation for structural testing of function block diagrams
|
Yi-Chen Wu; C.F. Fan |
| 臺大學術典藏 |
2018-09-10T05:27:17Z |
Automatic Test Case Generation with Region-Related Coverage Annotations for Real-Time Systems
|
G.-D. Huang; F. Wang; FARN WANG |
| 國立交通大學 |
2018-08-21T05:54:01Z |
Automatic Test Environment Deployment and Service Testing Model in the Cloud
|
Lo, Win-Tsung; Sheu, Ruey-Kai; Yuan, Shyan-Ming; Luo, Guo-Heng |
| 國立交通大學 |
2017-04-21T06:49:10Z |
Automatic Test Environment Deployment and Service Testing Model in the Cloud
|
Lo, Win-Tsung; Sheu, Ruey-Kai; Yuan, Shyan-Ming; Luo, Guo-Heng |
| 臺大學術典藏 |
2020-06-29T01:20:17Z |
Automatic test pattern generation
|
Cheng, K.-T.T.;Wang, L.-C.;Li, H.;Li, J.C.-M.; Cheng, K.-T.T.; Wang, L.-C.; Li, H.; Li, J.C.-M.; CHIEN-MO LI |
| 臺大學術典藏 |
2018-09-10T09:50:54Z |
Automatic Test Pattern Generation for Delay Defects Using Timed Characteristic Functions
|
Shin-Yann Ho;Shuo-Ren Lin;Ko-Lung Yuan;Chien-Yen Kuo;Kuan-Yu Liao;Jie-Hong Rol Jiang;Chien-Mo Li; Shin-Yann Ho; Shuo-Ren Lin; Ko-Lung Yuan; Chien-Yen Kuo; Kuan-Yu Liao; Jie-Hong Rol Jiang; Chien-Mo Li; CHIEN-MO LI |
| 臺大學術典藏 |
2018-09-10T09:50:56Z |
Automatic Test Pattern Generation for Delay Defects Using Timed Characteristic Functions
|
Shin-Yann Ho;Shuo-Ren Lin;Ko-Lung Yuan;Chien-Yen Kuo;Kuan-Yu Liao;Jie-Hong R. Jiang;Chien-Mo James Li; Shin-Yann Ho; Shuo-Ren Lin; Ko-Lung Yuan; Chien-Yen Kuo; Kuan-Yu Liao; Jie-Hong R. Jiang; Chien-Mo James Li; JIE-HONG JIANG |
| 臺大學術典藏 |
2020-06-11T06:11:15Z |
Automatic test pattern generation for delay defects using timed characteristic functions.
|
Ho, Shin-Yann;Lin, Shuo-Ren;Yuan, Ko-Lung;Kuo, Chien-Yen;Liao, Kuan-Yu;Jiang, Jie-Hong R.;Li, Chien-Mo James; Ho, Shin-Yann; Lin, Shuo-Ren; Yuan, Ko-Lung; Kuo, Chien-Yen; Liao, Kuan-Yu; Jiang, Jie-Hong R.; Li, Chien-Mo James; JIE-HONG JIANG |
| 臺大學術典藏 |
2022-09-21T23:31:01Z |
Automatic Test Program Generation for Transition Delay Faults in Pipelined Processors
|
Chen, Kai Hsun; Yang, Bo Yi; Liang, Jia Ruei; Chen, Hung Lin; JIUN-LANG HUANG |
