| 元智大學 |
2004-12 |
Defect Inspection of Patterned TFT-LCD Panels Usinga Fast Sub-image Based SVD
|
C.-J. Lu (呂奇傑); 蔡篤銘 |
| 元智大學 |
2004-10 |
Defect inspection of patterned thin film transistor-liquid crystal display panels using a fast sub-image-based singular value decomposition
|
C.-J. Lu(呂奇傑); 蔡篤銘 |
| 亞洲大學 |
2016-05 |
Defect Inspection of Patterned Thin-film Ceramic Light-emitting Diode Substrate Using a Fast Randomized Principal Component Analysis
|
劉曉薇;Hsiao-Wei,Liu;陳思翰;Ssu-Han,Chen*;彭德保;Der-Baau,Perng; |
| 亞洲大學 |
2016-05 |
Defect Inspection of Patterned Thin-film Ceramic Light-emitting Diode Substrate Using a Fast Randomized Principal Component Analysis
|
劉曉薇;Liu, Hsiao-Wei;陳思翰;Chen, Ssu-Han;*;彭德保;Perng, Der-Baau |
| 亞洲大學 |
2016-05 |
Defect Inspection of Patterned Thin-film Ceramic Light-emitting Diode Substrate Using a Fast Randomized Principal Component Analysis
|
Perng；, 劉曉薇；Hsiao-Wei Liu；陳思翰；Ssu-Han Chen；*；彭德保；Der-Baau |
| 亞洲大學 |
2016-05 |
Defect Inspection of Patterned Thin-film Ceramic Light-emitting Diode Substrate Using a Fast Randomized Principal Component Analysis
|
Perng；, 劉曉薇；Hsiao-Wei Liu；陳思翰；Ssu-Han Chen；*；彭德保；Der-Baau |
| 國立成功大學 |
2023-05-4 |
Defect Inspection Using Modified YoloV4 on a Stitched Image of a Spinning Tool
|
Lin;Bor-Haur;Chen;Ju-Chin;Lien;James, Jenn-Jier |
| 國立中山大學 |
1990 |
Defect Microstructure and Dehydroxylation Mechanism of Interstratified Phyllosilicates in Heng-Chun Chromitite: A TEM Study
|
P. Shen;S.L. Hwang;H.T. Chu |
| 國立中山大學 |
1988 |
Defect Microstructure in Aluminized Coatings
|
P. Shen;D. Gan;S.L. Hwang |
| 國立中山大學 |
1987 |
Defect Microstructure of Interstratified Phyllosilicates in Heng-Chun Chromitite
|
Y.J. Su;S.Y. Chen;H.Y. Lu;P. Shen |
| 國立中山大學 |
1990 |
Defect Microstructures of a Calcite Marble, Eastern Taiwan
|
H.H. Liu;S. Chen;P. Shen;T.F. Yui |
| 國立交通大學 |
2017-04-21T06:49:14Z |
Defect Mode Lasing in metal-coated GaN Grating Structure at Room Temperature
|
Chen, Kuo-Ju; Hsu, Wan-Hai; Liao, Wei-Chun; Shih, Min-Hsiung; Kuo, Hao-Chung |
| 國立高雄師範大學 |
1989-10 |
Defect Model and the Current-Voltage Characteristics in dielectric thin films
|
林財庫; Tsair-Kuh Lin |
| 國立高雄師範大學 |
1990 |
Defect Model for the conduction and breakdown in thin dielectric films
|
林財庫; Tsair-Kuh Lin |
| 國立成功大學 |
2005-06 |
Defect modes in a stacked structure of chiral photonic crystals
|
Chen, Jiun-Yeu; Chen, Lien-Wen |
| 國立臺灣大學 |
1997 |
Defect of Cell-Mediated Immune Response against Hepatitis B Virus; An Indication for Pathogenesis of Hepatitis-B-Virus-Associated Membranous Nephropathy
|
Lin, Ching-Yuang; Lin, Chiou-Chyn; Chang, Gwong-Jen J.; King, Chwan-Chuen |
| 臺大學術典藏 |
2021-01-27T07:49:29Z |
Defect Passivation by Amide-Based Hole-Transporting Interfacial Layer Enhanced Perovskite Grain Growth for Efficient p-i-n Perovskite Solar Cells
|
Wang, S.-Y.;Chen, C.-P.;Chung, C.-L.;Hsu, C.-W.;Hsu, H.-L.;Wu, T.-H.;Zhuang, J.-Y.;Chang, C.-J.;Chen, H.M.;Chang, Y.J.; Wang, S.-Y.; Chen, C.-P.; Chung, C.-L.; Hsu, C.-W.; Hsu, H.-L.; Wu, T.-H.; Zhuang, J.-Y.; Chang, C.-J.; Chen, H.M.; Chang, Y.J.; HAO MING CHEN |
| 國立臺灣科技大學 |
2014 |
Defect prediction for new products during the development phase
|
Chu, T.-P.;Wang, F.-K. |
| 國立成功大學 |
2007-04 |
Defect prevention in software processes: An action-based approach
|
Chang, Ching-Pao; Chu, Chih-Ping |
| 國立臺灣海洋大學 |
2009-03 |
Defect Reduction of Multi-walled Carbon Nanotubes by Rapid Vacuum Arc Annealing
|
Jeff T.H. Tsai;Anders A. Tseng |
| 臺大學術典藏 |
2018-09-10T08:38:11Z |
Defect related negative temperature coefficiency of short circuit current of Cu(In, Ga)Se 2 solar cells
|
Cheng, T.-H.;Chen, J.Y.;Hsu, W.W.;Liu, C.W.;Hsiao, C.Y.;Tseng, H.R.; Cheng, T.-H.; Chen, J.Y.; Hsu, W.W.; Liu, C.W.; Hsiao, C.Y.; Tseng, H.R.; CHIH-WEN LIU |
| 臺大學術典藏 |
2020-06-16T06:33:22Z |
Defect related negative temperature coefficiency of short circuit current of Cu(In, Ga)Se 2 solar cells
|
Cheng, T.-H.;Chen, J.Y.;Hsu, W.W.;Liu, C.W.;Hsiao, C.Y.;Tseng, H.R.; Cheng, T.-H.; Chen, J.Y.; Hsu, W.W.; Liu, C.W.; Hsiao, C.Y.; Tseng, H.R.; CHEE-WEE LIU |
| 國立交通大學 |
2014-12-08T15:08:14Z |
Defect selective passivation in GaN epitaxial growth and its application to light emitting diodes
|
Lo, M. -H.; Tu, P. -M.; Wang, C. -H.; Cheng, Y. -J.; Hung, C. -W.; Hsu, S. -C.; Kuo, H. -C.; Zan, H. -W.; Wang, S. -C.; Chang, C. -Y.; Liu, C. -M. |
| 淡江大學 |
2009-12 |
Defect selective passivation in GaN epitaxial growth and its application to light emitting diodes
|
Lo, M.-H.; Tu, P.-M.; Wang, C.-H.; Cheng, Y.-J.; Hung, C.-W.; Hsu, S.-C.; Kuo, H.-C.; Zan, H.-W.; Wang, S.-C.; Chang, C.-Y.; Liu, C.-M. |
| 國立高雄第一科技大學 |
2009.01 |
Defect spatial pattern recognition using a hybrid SOM–SVM approach in semiconductor manufacturing
|
Li, Te-Sheng;Huang, Cheng-Lung; 黃承龍 |
