| 國立交通大學 |
2014-12-08T15:39:46Z |
Fault hamiltonicity and fault hamiltonian connectivity of the arrangement graphs
|
Hsu, HC; Li, TK; Tan, JJM; Hsu, LH |
| 臺大學術典藏 |
2019-12-20T01:46:05Z |
Fault impacts on solar power unit reliability
|
Bazzi, A.M.;Kim, K.A.;Johnson, B.B.;Krein, P.T.;Dominguez-Garc?a, A.; Bazzi, A.M.; Kim, K.A.; Johnson, B.B.; Krein, P.T.; Dominguez-García, A.; KATHERINE ANN KIM |
| 國立臺灣科技大學 |
2017-12 |
FAULT LEG DETECTION FOR OPEN-CIRCUIT FAULTS IN PWM VOLTAGE-SOURCE INVERTERS OF RENEWABLE ENERGY VIA THE FUZZY LOGIC DIAGNOSTIC METHOD
|
Chen, Cheng-Chang;Lin, Yu-Hsun;Ke, Bwo-Ren;Hsue, Ching-Wen;Hsieh, Han-Chang |
| 國立臺灣科技大學 |
2017 |
Fault leg detection for open-circuit faults in PWM voltage-source inverters of renewable energy via the fuzzy logic diagnostic method
|
Chen, Chen C.-C.;Lin, Y.-H.;Ke, B.-R.;Hsue, C.-W.;Hsieh, Hsieh H.-C. |
| 國立臺灣科技大學 |
2018 |
Fault Leveling Techniques for Yield and Reliability Enhancement of NAND Flash Memories
|
Lu S.-K.; Zhong S.-X.; Hashizume M. |
| 元智大學 |
Mar-21 |
Fault line detection using waveform fusion and one-dimensional convolutional neural network in resonant grounding distribution systems
|
Jianhong Gao; Moufa Guo; Chen D.-Y. |
| 國立中山大學 |
1999-11 |
Fault Location Identification by Using Power Outage Sensors
|
C.L. Su;C.N. Lu;C.C. Yin;K.C. Tu |
| 義守大學 |
2013-02 |
Fault location system for underground transmission line
|
Jun-Zhe Yang;Hung-Yu Lin |
| 國立臺灣海洋大學 |
2011 |
Fault measure of discrete event systems using probabilistic timed automata
|
Yi-Sheng Huang; Ho-Shan Chiang; MuDer Jeng |
| 臺大學術典藏 |
2018-09-10T07:43:08Z |
Fault Modeling and Testing of Retention Flip-Flops in Low Power Designs
|
B. C. Bai;A. K Li;J. C.M. Li;K. C. Wu; B. C. Bai; A. K Li; J. C.M. Li; K. C. Wu; CHIEN-MO LI |
| 國立交通大學 |
2014-12-08T15:29:08Z |
Fault Models and Test Methods for Subthreshold SRAMs
|
Lin, Chen-Wei; Chen, Hung-Hsin; Yang, Hao-Yu; Huang, Chin-Yuan; Chao, Mango C. -T.; Huang, Rei-Fu |
| 國立交通大學 |
2014-12-08T15:32:45Z |
Fault Models and Test Methods for Subthreshold SRAMs
|
Lin, Chen-Wei; Chen, Hung-Hsin; Yang, Hao-Yu; Chao, Mango C-T; Huang, Rei-Fu |
| 國立交通大學 |
2014-12-08T15:19:21Z |
Fault Models for Embedded-DRAM Macros
|
Chao, Mango C. -T.; Yang, Hao-Yu; Huang, Rei-Fu; Lin, Shih-Chin; Chin, Ching-Yu |
| 華夏技術學院 |
1988-12 |
Fault Models for Microprocessors
|
何宏發 |
| 中原大學 |
2008-11 |
Fault Monitoring of SMB Processes Using Visualized On-Line Concentration Patterns
|
Chen, Junghui;Hsu, Tong-Yang;Teck, Lester Chan Lik;Liang, Ming-Tsai;Liang, Ru-Chien |
| 國立高雄應用科技大學 |
2013-07 |
Fault Node Recovery Algorithm for a Wireless Sensor Network
|
Shih, Hong-Chi; Ho, Jiun-Huei; Liao, Bin-Yih; Pan, Jeng-Shyang |
| 國立政治大學 |
2006-07 |
Fault Repair Time Distribution in Network Reliability
|
陸行 |
| 國立中山大學 |
1989 |
Fault Restoration by Optimizing Switch Configuration in Distribution Systems
|
C.S. Chen; J.S. Wu |
| 國立臺灣科技大學 |
2013 |
Fault scrambling techniques for yield enhancement of embedded memories
|
Lu, S.-K.;Jheng, H.-C.;Hashizume, M.;Huang, J.-L.;Ning, P. |
| 臺大學術典藏 |
2018-09-10T09:50:53Z |
Fault Scrambling Techniques for Yield Enhancement of Embedded Memories
|
S.-K. Lu;H.-C. Jheng;M. Hashizume;J.-L. Huang;P. Ning; S.-K. Lu; H.-C. Jheng; M. Hashizume; J.-L. Huang; P. Ning; JIUN-LANG HUANG |
| 國立成功大學 |
2015-01 |
Fault section estimation in distribution systems using biogeography-based optimization approaches
|
Huang, Shyh-Jier; Liu, Xian-Zong |
| 國立交通大學 |
2017-04-21T06:56:47Z |
Fault Self-Detection Technique in Fiber Bragg Grating-Based Passive Sensor Network
|
Yeh, Chien-Hung; Tsai, Ning; Zhuang, Yuan-Hong; Chow, Chi-Wai; Liu, Wen-Feng |
| 臺大學術典藏 |
2020-06-29T01:20:09Z |
Fault Simulation and Test Generation
|
Li, J.C.-M.;Hsiao, M.S.; Li, J.C.-M.; Hsiao, M.S.; CHIEN-MO LI |
| 臺大學術典藏 |
2020-06-29T01:20:10Z |
Fault Simulation and Test Pattern Generation for Cross-gate Defects in FinFET Circuits
|
Chiang, K.-Y.;Ho, Y.-H.;Chen, Y.-W.;Pan, C.-S.;Li, J.C.-M.; Chiang, K.-Y.; Ho, Y.-H.; Chen, Y.-W.; Pan, C.-S.; Li, J.C.-M.; CHIEN-MO LI |
| 臺大學術典藏 |
2020-06-29T01:20:11Z |
Fault Simulation and Test Pattern Generation for Cross-gate Defects in FinFET Circuits.
|
Chen, Yo-Wei; Pan, Cheng-Sheng; Li, James Chien-Mo; CHIEN-MO LI; Ho, Yu-Hao; Chiang, Kuan-Ying; Chiang, Kuan-Ying;Ho, Yu-Hao;Chen, Yo-Wei;Pan, Cheng-Sheng;Li, James Chien-Mo |
