| 國立交通大學 |
2014-12-08T15:18:01Z |
Full-field absolute phase measurements in the heterodyne interferometer with an electro-optic modulator
|
Chen, Y. L.; Hsieh, H. C.; Wu, W. T.; Su, D. C. |
| 臺大學術典藏 |
2020-01-13T08:16:58Z |
Full-field analysis and image forces for piezoelectric bimaterials
|
Ma, C.-C.; Wu, W.-C.; Lee, J.-M.; CHIEN-CHING MA |
| 國立臺灣大學 |
2008-01 |
Full-field Analysis and Image Forces for Piezoelectric Bimaterials(Invited Paper)
|
Ma, Chien-Ching; Wu, Wen-Cha; Le, Jui-Mu |
| 臺大學術典藏 |
2018-09-10T07:31:13Z |
Full-field analysis of a functionally graded magnetoelectroelastic nonhomogeneous layered half-plane
|
Ma, C.-C.; Lee, J.-M.; CHIEN-CHING MA |
| 臺大學術典藏 |
2018-09-10T04:09:50Z |
Full-field analysis of a planar anisotropic layered half-plane for concentrated forces and edge dislocations
|
Ma, C.-C.; Lin, R.-L.Ma, Chien-Ching; Lin, Ru-Li; Ma, Chien-Ching; CHIEN-CHING MA; Lin, Ru-Li |
| 國立臺灣大學 |
2002 |
Full-field analysis of a planar anisotropic layered half-plane for concentrated forces and edge dislocations
|
Ma, Chien-Ching; Lin, Ru-Li |
| 淡江大學 |
2002-08 |
Full-field analysis of an anisotropic finite crack subjected to an anti-plane point impact loading
|
應宜雄; Ing, Yi-shyong; Ma, Chien-ching |
| 國立成功大學 |
2009-08-10 |
Full-field and full-range sequential measurement of the slow axis angle and phase retardation of linear birefringent materials
|
Yu, Tsung-Chih; Shan, Hsu; Pham, Thi Thu Hien; Lo, Yu-Lung |
| 臺大學術典藏 |
2020-01-13T08:21:36Z |
Full-field chromatic confocal surface profilometry employing digital micromirror device correspondence for minimizing lateral cross talks
|
Chen, L.-C.; Chang, Y.-W.; Li, H.-W.; LIANG-CHIA CHEN |
| 臺大學術典藏 |
2020-01-13T08:21:37Z |
Full-field chromatic confocal surface profilometry employing DMD correspondence for minimizing lateral cross talks
|
Chen, L.-C.; Li, H.-W.; Chang, Y.-W.; LIANG-CHIA CHEN |
| 臺大學術典藏 |
2021-10-14T01:16:04Z |
Full-field chromatic confocal surface profilometry employing DMD correspondence for minimizing lateral cross talks
|
Liang-Chia Chen; Yi-Wei Chang; Hau-Wei Li; LIANG-CHIA CHEN |
| 國立臺灣海洋大學 |
2012 |
Full-Field Deflection Measurement of the Flexible Transparent Sheets
|
Jiong-Shiun Hsu;Bor-Jiunn Wen;Po-Yu Chen |
| 臺大學術典藏 |
2001 |
Full-Field Experimental Investigations on Resonant Vibration of Cracked Rectangular Cantilever Plates
|
Ma, Chien-Ching; Hsieh, Dong-Ming; Ma, Chien-Ching; Hsieh, Dong-Ming |
| 國立臺灣大學 |
2001 |
Full-Field Experimental Investigations on Resonant Vibration of Cracked Rectangular Cantilever Plates
|
Ma, Chien-Ching; Hsieh, Dong-Ming |
| 國立臺灣海洋大學 |
2008-08 |
Full-field Hard X-Ray Microscopy below 30 Nanometers: a Challenging Nanofabrication Achievement
|
Giorgio Margaritondo; Yu-Tung Chen; Tsung-Nan Lo; Yong S. Chu; Jaemock Yi; Chi-Jen Liu; Jun-Yue Wang; Cheng-Liang Wang; Chen-Wei Chiu; Tzu-En Hua; Yeukuang Hwu; Qun Shen; Gung-Chian Yin; Keng S. Liang; Hong-Ming Lin; Jung-Ho Je |
| 國立成功大學 |
2006-11-01 |
Full-field heterodyne polariscope with an image signal processing method for principal axis and phase retardation measurements
|
Lo, Yu-Lung; Chih, Hung-Wei; Yeh, Cheng-Yen; Yu, Tsung-Chih |
| 臺大學術典藏 |
2021-10-07T08:46:31Z |
Full-field measurement of carbon fiber composite under tensile test using digital image correlation
|
Chien-Ching Ma; Ching-Yuan Chang; Wan-Hsuan Chou; CHIEN-CHING MA |
| 臺大學術典藏 |
2018-09-10T15:20:32Z |
Full-field Measurement of Deformation and Vibration using Digital Image Correlation
|
Liang-Chih Chen; Ching-Yuan Chang; Wei-Chen Lee; Chien-Ching Ma; CHIEN-CHING MA |
| 臺大學術典藏 |
2020-01-13T08:21:32Z |
Full-field measurement of deformation and vibration using digital image correlation
|
Chen, L.-C.; Chang, C.-Y.; Lee, W.-C.; Ma, C.-C.; LIANG-CHIA CHEN |
| 臺大學術典藏 |
2022-09-21T23:30:09Z |
Full-field Measurement of Deformation and Vibration using Digital Image Correlation
|
LIANG-CHIH CHEN; Chang, Ching Yuan; Lee, Wei Chen; CHIEN-CHING MA |
| 國立交通大學 |
2014-12-08T15:09:50Z |
Full-field measurement of the phase retardation for birefringent elements by using common path heterodyne interferometry
|
Chen, Yen-Liang; Su, Der-Chin |
| 臺大學術典藏 |
2020-01-13T08:21:46Z |
Full-field micro surface profilometry using digital fringe projection with spatial encoding principle
|
Chen, L.-C.; Liao, C.-C.; Lai, M.-J.; LIANG-CHIA CHEN |
| 國立成功大學 |
2011-10 |
Full-field microimaging with 8 keV X-rays achieves a spatial resolutions better than 20 nm
|
Chen, Tsung-Yu; Chen, Yu-Tung; Wang, Cheng-Liang; Kempson, Ivan M.; Lee, Wah-Keat; Chu, Yong S.; Hwu, Y.; Margaritondo, G. |
| 國立臺灣海洋大學 |
2011-10 |
Full-field microimaging with 8 keV X-rays achieves a spatial resolutions better than 20 nm
|
G. Margaritondo; Tsung-Yu Chen; Yu-Tung Chen; Cheng-Liang Wang; Ivan M. Kempson; Wah-Keat Lee; Yong S. Chu; Y. Hwu |
| 臺大學術典藏 |
2019-09-09T00:54:16Z |
Full-field microsurface profilometry using image correlation without vertical scanning
|
Nguyen, Duc Trung;Wu, Guo Wei;LIANG-CHIA CHEN; LIANG-CHIA CHEN; Wu, Guo Wei; Nguyen, Duc Trung |
