|
顯示項目 473976-473985 / 2346288 (共234629頁) << < 47393 47394 47395 47396 47397 47398 47399 47400 47401 47402 > >> 每頁顯示[10|25|50]項目
| 中國醫藥大學 |
2014-05 |
Hold腎求好腎 注意腎臟病的各階段警訊
|
汪碧雲 |
| 國立臺灣大學 |
2002 |
Hole and electron field-effect mobilities in nanocrystalline silicon deposited at 150C
|
Cheng, I-Chun; Wagner, Sigurd |
| 臺大學術典藏 |
2018-09-10T04:12:41Z |
Hole and electron field-effect mobilities in nanocrystalline silicon deposited at 150°C
|
Cheng, I.-C.; Wagner, S.; I-CHUN CHENG |
| 國立臺灣大學 |
2004 |
Hole concentration in the three-CuO2-plane copper-oxide superconductor Cu-1223
|
Karppinen, M; Yamauchi, H; Morita, Y; Kitabatake, M; Motohashi, T; Liu, RS; Lee, JM; Chen, JM |
| 臺大學術典藏 |
2018-09-10T04:48:15Z |
Hole concentration in the three-CuO2-plane copper-oxide superconductor Cu-1223
|
RU-SHI LIU; Chen, J. M.; Karppinen, M.;Yamauchi, H.;Morita, Y.;Kitabatake, M.;Motohashi, T.;Liu, R. S.;Lee, J. M.;Chen, J. M.; Karppinen, M.; Yamauchi, H.; Morita, Y.; Kitabatake, M.; Motohashi, T.; Liu, R. S.; Lee, J. M. |
| 臺大學術典藏 |
2006 |
Hole Confinement and 1/ f Noise Characteristics of SiGe Double-Quantum-Well p-Type Metal–Oxide–Semiconductor Field-Effect Transistors
|
Lin, Yu Min; Wu, San Lein; Chang, Shoou Jinn; Chen, Pang Shiu; Liu, Chee Wee; Lin, Yu Min; Wu, San Lein; Chang, Shoou Jinn; Chen, Pang Shiu; Liu, Chee Wee |
| 國立臺灣大學 |
2006 |
Hole Confinement and 1/ f Noise Characteristics of SiGe Double-Quantum-Well p-Type Metal–Oxide–Semiconductor Field-Effect Transistors
|
Lin, Yu Min; Wu, San Lein; Chang, Shoou Jinn; Chen, Pang Shiu; Liu, Chee Wee |
| 國立成功大學 |
2006-05 |
Hole confinement and 1/f noise characteristics of SiGe double-quantum-well p-type metal-oxide-semiconductor field-effect transistors
|
Lin, Yu-Min; Wu, San-Lein; Chang, Shoou-Jinn; Chen, Pang-Shiu; Liu, C. W. |
| 臺大學術典藏 |
2018-09-10T05:58:50Z |
Hole confinement and 1/f noise characteristics of SiGe double-quantum-well p-Type metal-oxide-semiconductor field-effect transistors
|
Lin, Y.M.; San Lein, W.U.; Chang, S.J.; Chen, P.S.; Liu, C.W.; CHEE-WEE LIU |
| 國立臺灣大學 |
2006 |
Hole confinement at Si/SiGe heterojunction of strained-Si N and PMOS devices
|
Wei, J.-Y.; Maikap, S.; Lee, M.H.; Lee, C.C.; Liu, C.W. |
顯示項目 473976-473985 / 2346288 (共234629頁) << < 47393 47394 47395 47396 47397 47398 47399 47400 47401 47402 > >> 每頁顯示[10|25|50]項目
|