| 國立成功大學 |
2005-04 |
Interface modification in organic thin film transistors
|
Wu, Bo-Tan; Su, Yan-Kuin; Tu, Ming-Lung; Wang, An-Chang; Chen, You-Sian; Chiou, Yu-Zung; Chiou, Yii-Tay; Chu, Chun-Hsun |
| 臺大學術典藏 |
2018-09-10T09:22:03Z |
Interface modification of a highly air-stable polymer solar cell
|
Yang, P.-C.; Sun, J.-Y.; Ma, S.-Y.; Shen, Y.-M.; Lin, Y.-H.; Chen, C.-P.; Lin, C.-F.; CHING-FUH LIN |
| 國立交通大學 |
2014-12-08T15:36:14Z |
Interface morphology and electrical properties of bonded GaAs/GaAs wafers at different temperatures
|
Chang, S. C.; Wu, Y. S.; Chang, N. |
| 國立交通大學 |
2014-12-08T15:29:06Z |
Interface Morphology Investigation of Bonded p-GaAs/p-Si Wafers
|
Hsieh, Cheng-Yu; YewChung; Wu, Sermon |
| 國立中山大學 |
1996 |
Interface of CuIn1-xGaxSe2/GaAs Heterostructure
|
B.H. Tseng;S.B. Lin |
| 國立中山大學 |
1993 |
Interface of First-Stage Aluminized Coating in Inconel 600
|
A. Chien;D. Gan;P. Shen |
| 國立中山大學 |
1993 |
Interface of First-Stage Aluminized Coating on Inconel 600
|
A. Chien;D. Gan;P. Shen |
| 臺大學術典藏 |
2018-09-10T03:26:34Z |
Interface of sputter-deposited TiNi thin film on (100) Si wafer
|
Wu, S.K.; Wang, J.Y.; Wu, I.J.; Lin, H.C.; SHYI-KAAN WU |
| 中國醫藥大學 |
2002-12-26 |
Interface on Implant
|
傅立志(Fuh,William Lih-Jyh) |
| 國立交通大學 |
2017-04-21T06:48:41Z |
Interface Polarization Fluctuation Effect of Ferroelectric Hafnium-Zirconium-Oxide Ferroelectric Memory with Nearly Ideal Subthreshold Slope
|
Chiu, Yu-Chien; Cheng, Chun-Hu; Fan, Chia-Chi; Chen, Po-Chun; Chang, Chun-Yen; Lee, Min-Hung; Liu, Chien; Yen, Shiang-Shiou; Hsu, Hsiao-Hsuan |
| 輔英科技大學 |
2003-12-14 |
Interface Pressure and Gait Analysis in Different Walking Speeds and on The Below-Knee Amputees With A SACH Foot Prosthesis.
|
石旭生 |
| 臺大學術典藏 |
1987 |
Interface Properties of Al/Ta205/Si02/Si (P) Capacitor
|
Hwu, Jenn-Gwo; Wang, Way-Seen; Hwu, Jenn-Gwo; Wang, Way-Seen |
| 國立臺灣大學 |
1987 |
Interface Properties of Al/Ta205/Si02/Si (P) Capacitor
|
胡振國; 王維新; Hwu, Jenn-Gwo; Wang, Way-Seen |
| 臺大學術典藏 |
2018-09-10T03:46:47Z |
Interface reactions of high-k Y2O3 gate oxides with Si
|
Busch, BW;Kwo, J;Hong, M;Mannaerts, JP;Sapjeta, BJ;Schulte, WH;Garfunkel, E;Gustafsson, T; Busch, BW; Kwo, J; Hong, M; Mannaerts, JP; Sapjeta, BJ; Schulte, WH; Garfunkel, E; Gustafsson, T; MINGHWEI HONG |
| 國立東華大學 |
2005 |
Interface relaxation and electronic corrugation in the Pb/Si (111) -Pb- alpha - sqrt Interface relaxation and electronic corrugation in the Pb/Si (111) -Pb- alpha - sqrt
|
M. Hupalo; V.Yeh; T. L. Chan; C. Z.Wang; K. M. Ho; M. C. Tringides |
| 臺大學術典藏 |
2018-09-10T06:24:14Z |
Interface resistance and transparency in ferromagnet/superconductor Co Nbx Ti1-x multilayers (x=1, 0.6, and 0.4)
|
Huang, S.-Y.; Lee, S.F.; Hsu, S.Y.; Yao, Y.D.; SSU-YEN HUANG |
| 國立交通大學 |
2014-12-08T15:13:41Z |
Interface resistance and transparency in ferromagnet/superconductor Co/NbxTi1-x multilayers (x = 1, 0.6, and 0.4)
|
Huang, S.-Y.; Lee, S. F.; Hsu, S. Y.; Yao, Y. D. |
| 國立中山大學 |
1995 |
Interface roughness scattering in thin GaInP/GaAs quantum wells
|
S. Elhamri;M. Ahoujja;K. Ravindran;D.B. Mast;R.S. Newrock;W.C. Mitchel;Ikai Lo;M. Razeghi;X. He |
| 國立中山大學 |
1994 |
Interface roughness scattering in thin undoped GaInP/GaAs quantum wells
|
W.C. Mitchel;G.J. Brown;Ikai Lo;S. Elhamri;M. Ahoujja;K. Ravindran;R.S. Newrock;M. Razeghi;X.G. He |
| 淡江大學 |
2011-09 |
Interface Settings and the Improvement Proposal of the Astronomy News Integrated System for the Museum Curator
|
Chen, Yulin; Urata, Mayu; Mouri, Katsuhiro; Yasuda, Takami |
| 國立交通大學 |
2017-10-06T06:17:46Z |
Interface Study of Metal-Semiconductor Systems
|
張俊彥; 施敏; C.Y.Chang; S.M.Sze |
| 國立交通大學 |
2020-07-01T05:21:17Z |
Interface Theory of Benzenoids
|
Langner, Johanna; Witek, Henryk A. |
| 國立交通大學 |
2020-07-01T05:21:17Z |
Interface Theory of Benzenoids: Basic Applications
|
Langner, Johanna; Witek, Henryk A. |
| 臺大學術典藏 |
2021-09-02T00:03:55Z |
Interface Trap Density Reduction Due to AlGeO Interfacial Layer Formation by Al Capping on Al2O3/GeOx/Ge Stack
|
Huang C.-H;Huang Y.-S;Chang D.-Z;Lin T.-Y;Liu C.W.; Huang C.-H; Huang Y.-S; Chang D.-Z; Lin T.-Y; Liu C.W.; CHEE-WEE LIU |
| 亞洲大學 |
2012-09 |
Interface Trap Distribution for HCI Reliability Assessment on Bend Gate Structure by 3D TCAD Simulation
|
高立學;Gau, Li-Shiue |
