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显示项目 526796-526805 / 2348674 (共234868页)
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机构 日期 题名 作者
臺大學術典藏 2018-09-10T04:35:27Z Investigation of B1 Field Behavior of MRI by Debye's Potential Method W.H.Chang; S.K.Jeng; W.P.Kuan; J.H.Chen; JYH-HORNG CHEN
國立交通大學 2015-07-21T08:31:30Z Investigation of Backgate-Bias Dependence of Intrinsic Variability for UTB Hetero-Channel MOSFETs Considering Quantum Confinement Yu, Chang-Hung; Su, Pin
國立交通大學 2014-12-08T15:35:55Z Investigation of Backgate-Bias Dependence of Threshold-Voltage Sensitivity to Process and Temperature Variations for Ultra-Thin-Body Hetero-Channel MOSFETs Yu, Chang-Hung; Su, Pin
國立交通大學 2015-07-21T08:29:05Z Investigation of Backgate-Biasing Effect for Ultrathin-Body III-V Heterojunction Tunnel FET Fan, Ming-Long; Hu, Vita Pi-Ho; Hsu, Chih-Wei; Su, Pin; Chuang, Ching-Te
臺大學術典藏 2015 Investigation of Backgate-Biasing Effect for Ultrathin-Body III-V Heterojunction Tunnel FET C.-W. Hsu; Pin Su; C.-T. Chuang; 胡璧合; VITA PI-HO HU; Y.-N. Chen; V. P.-H. Hu; M.-L. Fan; Pin Su; C.-T. Chuang; VITA PI-HO HU; C.-W. Hsu; Y.-N. Chen; V. P.-H. Hu; M.-L. Fan; M.-L. Fan;V. P.-H. Hu;Y.-N. Chen;C.-W. Hsu;Pin Su;C.-T. Chuang
國立勤益科技大學 2008-05 Investigation of ballistic impact properties and fracture mechanisms of Ti3SiC2 ternary ceramics Lo, Wen-Tse;Jeng, Ching-An;Huang, Jow-Lay;Lu, Horng-Hwa;Lii, Ding-Fwu
義守大學 2008-05 Investigation of ballistic impact properties and fracture mechanisms of Ti3SiC2 ternary ceramics Wen-Tse Lo;Ching-An Jeng;Jow-Lay Huang;Horng-Hw Lu;Ding-Fwu Lii
國立成功大學 2008-05-08 Investigation of ballistic impact properties and fracture mechanisms of Ti3SiC2 ternary ceramics Lo, Wen-Tse; Jeng, Ching-An; Huang, Jow-Lay; Lu, Horng-Hwa; Lii, Ding-Fwu
國立臺灣海洋大學 2009-06-01 Investigation of Baltic Dry Indexes Chung, Y.S.;Chung, Cheng-Chi
元智大學 2014-05-07 Investigation of Band Edge Potential Fluctuation Induced by Intrinsic Defects in Cu2ZnSnSe4 Dan-Hua Hsieh; Jui-Fu Yang; Fang-I Lai; Hao-Chung Kuo

显示项目 526796-526805 / 2348674 (共234868页)
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