| 國立交通大學 |
2019-04-02T05:58:14Z |
Investigation of Electrical Characteristics on LaAlO3/ZrO2/IGZO TFTs with Microwave Annealing
|
Wu, Chien-Hung; Chang, Kow-Ming; Chen, Yi-Ming; Zhang, Yu-Xin; Cheng, Chia-Yao |
| 國立交通大學 |
2014-12-08T15:18:30Z |
Investigation of electrical characteristics on surrounding-gate and omega-shaped-gate nanowire FinFETs
|
Li, YM; Chou, HM; Lee, JW |
| 南台科技大學 |
2004 |
Investigation of Electrical Field Effect on Nickel Induced crystallization of Amorphous Si
|
許進明; Yu-zhi Zhang; Ching-Ming Hsu |
| 國立交通大學 |
2014-12-08T15:12:21Z |
Investigation of electrical pulse erasing method effect on current - Voltage characteristics of organic bistable device
|
Lee, Po-Tsung; Chang, Tzu-Yueh; Chen, Szu-Yuah |
| 國立聯合大學 |
2008 |
Investigation of electrical transient behavior for ultrasonic transducer in ON/OFF cycles
|
Kuo-Tsai Chang, Hsuang-Chang Chiang |
| 國立聯合大學 |
2007 |
Investigation of electrical transient behavior of an ultrasonic transducer under impulsive mechanical excitation
|
K.-T. Chang |
| 國立成功大學 |
2006-10-05 |
Investigation of electro-oxidation of methanol and benzyl alcohol at boron-doped diamond electrode: Evidence for the mechanism for fouling film formation
|
Chang, Chia-Chin; Chen, Li-Chia; Liu, Shyh-Jiun; Chang, Hsien-Chang |
| 元智大學 |
2017-06-22 |
Investigation of electrochemical approach for biochemical analysis of microbial culture system
|
Jian-An Su; Chi-Wei (John) Lan |
| 淡江大學 |
1998-01 |
Investigation of electrochemical behavior and mass-transfer process of C70 film. structure, size and temperature effect
|
王文竹; Wang, Wen-jwu; Chiu, H. S.; Lin, S. S.; Chang, C. S.; Chuang, K. S. |
| 義守大學 |
2016-04 |
Investigation of Electrochromic Properties of Novel Tungsten Trioxide Nano-structure Preparation Using Hydrothermal Process
|
Jia-Cian Hsieh;Wen-Jen Liu |
| 南台科技大學 |
2007 |
Investigation of Electrode Pattern Design for Nitride-based Light Emitting Diodes
|
邱裕中; 林陞羽; Chiou, Y.Z; Lin, S.Y. |
| 國立交通大學 |
2014-12-08T15:12:50Z |
Investigation of electroless Co(W,P) thin film as the diffusion barrier of underbump metallurgy
|
Wu, W. C.; Hsieh, Tsung-Eong; Pan, Hung-Chun |
| 國立交通大學 |
2014-12-08T15:16:17Z |
Investigation of electroless cobalt-phosphorous layer and its diffusion barrier properties of Pb-Sn solder
|
Liang, Muh-Wang; Yen, Hui-Ting; Hsieh, Tsung-Eong |
| 元智大學 |
2011-07 |
Investigation of Electromagnetic Interferences Caused by the Stacked I/O Connectors
|
H.-H. Chou; S-C Tuan; Chou H.-T.; Y-S Lee |
| 元智大學 |
2011-07 |
Investigation of Electromagnetic Interferences Caused by the Stacked I/O Connectors
|
H.-H. Chou; S-C Tuan; Chou H.-T.; Y-S Lee |
| 臺大學術典藏 |
2018-09-10T08:42:45Z |
Investigation of electromagnetic interferences caused by the stacked I/O connectors
|
Chou, H.-H.;Tuan, S.-C.;Chou, H.-T.;Lee, Y.-S.; Chou, H.-H.; Tuan, S.-C.; Chou, H.-T.; Lee, Y.-S.; HSI-TSENG CHOU |
| 國立臺灣科技大學 |
2009 |
Investigation of electromagnetic radiation from high power weather radar
|
Wen J.-Y.; Huang J.-F. |
| 國立成功大學 |
2014-11 |
Investigation of electromigration reliability of redistribution lines in wafer-level chip-scale packages
|
Kao, Chin-Li; Chen, Tei-Chen; Lai, Yi-Shao; Chiu, Ying-Ta |
| 國立交通大學 |
2020-01-02T00:04:18Z |
Investigation of Electron and Hole Lateral Migration in Silicon Nitride and Data Pattern Effects on ${V}_{{t}}$ Retention Loss in a Multilevel Charge Trap Flash Memory
|
Liu, Yu-Heng; Zhan, Ting-Chien; Wang, Tahui; Tsai, Wen-Jer; Lu, Tao-Cheng; Chen, Kuang-Chao; Lu, Chih-Yuan |
| 朝陽科技大學 |
2025-11-19 |
Investigation of Electron Transport Layer Influence on Asymmetric Bipolar Switching in Transparent BST-Based RRAM Devices
|
Chen, Kai-Huang; Kao, Ming-Cheng; Chen, Hsin-Chin; Wang, Yao-Chin; Cheng, Chien-Min; Xu, Wei-Min; 高銘政 |
| 國立交通大學 |
2014-12-08T15:43:08Z |
Investigation of electron-optical phonon interactions in moderate wide InxGa1-xAs/GaAs strained quantum wells
|
Lin, SD; Lee, HC; Sun, KW; Lee, CP |
| 元智大學 |
2011-02 |
INVESTIGATION OF ELECTRONIC PROPERTIES FORNANOTATANIA/METAL-ION-DOPED TITANIA SEMICONDUCTOR PREPARED BY SOL-GEL METHODS
|
馬智剛 （Chih-Kang Ma）; Chau-Kuang Liau |
| 國立彰化師範大學 |
2011-10 |
Investigation of Electronic Transport in Lateral NiFe/Al2O3/p-Si/Al2O3/NiFe Junctions
|
Lee, Y. C. ; Lin, C. W. ; Lee, H. M. ; Horng, Lance; Wu, J. C. |
| 義守大學 |
2007/12/20 |
Investigation of Electrostatic Charges Trapping during 12-Inch Deep Submicron VLSI Proces
|
Po-Ying Chen ; Chen, S.L. ; Tsai, M.H. ; Jing, M.H. ; Lin, T.-C. |
| 國立交通大學 |
2014-12-08T15:01:50Z |
Investigation of Electrostatic Integrity for Ultra-Thin-Body GeOI MOSFET Using Analytical Solution of Poisson's Equation
|
Hu, Vita Pi-Ho; Wu, Yu-Sheng; Su, Pin |
