| 國立東華大學 |
2009-12 |
Thickness effects of LaNiO3 buffer layer on SrZrO3 resistive switching thin films
|
林群傑; Lin, Chun-Chieh; Lai, Cheng-Fu |
| 國立交通大學 |
2014-12-08T15:14:27Z |
Thickness effects on the electrical characteristics of Ba0.7Sr0.3TiO3 capacitors with nano-Cr interlayer
|
Ho, Chia-Cheng; Chiou, Bi-Shiou; Chang, Li-Chun |
| 國立成功大學 |
2008-10 |
Thickness for Optimizing of Organic Layer and Multi-Layer Anode on Luminance Efficiency in White-Light Top-Emission Organic Light-Emitting Diodes
|
Huang, Jian-Ji; Ueng, Herng-Yih; Su, Yan-Kuin; Lin, Shin-Ju; Juang, Fuh-Shyang |
| 國立臺灣大學 |
2007 |
Thickness limit in perpendicular magnetic anisotropy L10 FePt(0 0 1) thin film
|
Sun, An-Cheng; Hsu, Jen-Hwa; Kuo, P.C.; Huang, H.L.; Lu, H.C.; Wang, S.F. |
| 國立臺灣大學 |
2011 |
Thickness measurement of colloidal opal crystal growth by Bragg reflection
|
Lin, Ming-Zheng; Li, Guan-Hui; Chern, Ming-Yau; Lan, Chung-Wen |
| 臺大學術典藏 |
2018-09-10T08:36:15Z |
Thickness measurement of colloidal opal crystal growth by Bragg reflection
|
Lin, M.-Z.;Li, G.-H.;Chern, M.-Y.;Lan, C.-W.; Lin, M.-Z.; Li, G.-H.; Chern, M.-Y.; Lan, C.-W.; MING-YAU CHERN |
| 臺大學術典藏 |
2011 |
Thickness measurement of colloidal opal crystal growth by Bragg reflection
|
Lin, M.-Z.; Li, G.-H.; Chern, M.-Y.; Lan, C.-W.; CHUNG-WEN LAN |
| 國立交通大學 |
2014-12-08T15:13:35Z |
Thickness scaling and reliability comparison for the inter-poly high-kappa dielectrics
|
Chen, Yung-Yu; Chien, Chao-Hsin |
| 國立交通大學 |
2019-04-02T06:00:58Z |
Thickness Study of Er-Doped Magnesium Zinc Oxide Diode by Spray Pyrolysis
|
Hsu, Yu-Ting; Lee, Che-Chi; Lan, Wen-How; Huang, Kai-Feng; Chang, Kuo-Jen; Lin, Jia-Ching; Lee, Shao-Yi; Lin, Wen-Jen; Wang, Mu-Chun; Huang, Chien-Jung |
| 臺大學術典藏 |
2019-12-20T08:42:49Z |
Thickness variations in electrolytes for planar solid oxide fuel cells
|
Kao, Ching-Ti; Tuan, Wei-Hsing; Chang, Shu-Wei; SHU-WEI CHANG |
| 臺大學術典藏 |
2020-05-12T02:53:39Z |
Thickness variations in electrolytes for planar solid oxide fuel cells
|
Kao, C.-T.; Tuan, W.-H.; Chang, S.-W.; WEI-HSING TUAN |
| 中國文化大學 |
1995-07 |
Thickness Vibration of 1-3 Piezoelectric Composite Plate
|
鄭乃忠 |
| 臺大學術典藏 |
2022-03-22T15:04:48Z |
Thickness-controlled porous hexagonal NiO nanodiscs electrodes for use in supercapacitors: How nanodiscs thickness influences electrochemical performance
|
Chavhan, Madhav P.; Slovak, Vaclav; CHUNG-HSIN LU |
| 臺大學術典藏 |
2019-12-27T06:48:23Z |
Thickness-Dependent Binding Energy Shift in Few-Layer MoS 2 Grown by Chemical Vapor Deposition
|
Lin, Y.-K.; Lin, Y.-K.; YANG-FANG CHEN et al. |
| 國立臺灣科技大學 |
2016 |
Thickness-Dependent Binding Energy Shift in Few-Layer MoS2 Grown by Chemical Vapor Deposition
|
Lin, Y.-K;Chen, R.-S;Chou, T.-C;Lee, Y.-H;Chen, Y.-F;Chen, K.-H;Chen, L.-C. |
| 國立臺灣科技大學 |
2016 |
Thickness-dependent carrier transport and optically enhanced transconductance gain in III-VI multilayer InSe
|
Ho, C.-H. |
| 國立臺灣科技大學 |
2014 |
Thickness-dependent electrical conductivities and ohmic contacts in transition metal dichalcogenides multilayers
|
Chen, R.-S.;Tang, C.-C.;Shen, W.-C.;Huang, Y.-S. |
| 淡江大學 |
2009 |
Thickness-Dependent Electronic Structure of Intermetallic CeCo2 Nanothin Films Studied by X-ray Absorption Spectroscopy
|
Dong, Chung-Li; Chen, Chi-Liang; Asokan, Kandasami; Chang, Ching-Lin; Chen, Yang-Yuan; Lee, Jyh-Fu; Guo, Jinghua |
| 元智大學 |
Nov-20 |
Thickness-Dependent Exciton Dynamics in Thermally Evaporated Rubrene Thin Films
|
Chia-Hsun Chen; Pin-Hao Sher; Wing-Kit Choi; Christopher J. Bardeen; Tien-Lung Chiu; Juen-Kai Wang; Jiun-Haw Lee |
| 國立成功大學 |
2023 |
Thickness-Dependent Ferroelectricity in Freestanding Hf0.5Zr0.5O2 Membranes
|
Liu, Y.-C.;Chen, B.-C.;Wei, C.-C.;Ho, S.-Z.;Liou, Y.-D.;Kaur, P.;Rahul, N.;Chen, Y.-C.;Yang, J.-C. |
| 國立成功大學 |
2024-02-23 |
Thickness-Dependent Ferroelectricity in Freestanding Hf0.5Zr0.5O2 Membranes
|
Liu;Yu-Chen;Chen;Bo-Cia;Wei;Chia-Chun;Ho;Sheng-Zhu;Liou;Yi-De;Kaur;Puneet;Chen;Yi-Chun;Yang;Jan-Chi |
| 國立交通大學 |
2014-12-08T15:28:21Z |
Thickness-dependent lattice relaxation and the associated optical properties of ZnO epitaxial films grown on Si (111)
|
Liu, W. -R.; Lin, B. H.; Kuo, C. C.; Lee, W. C.; Hong, M.; Kwo, J.; Hsu, C. -H.; Hsieh, W. F. |
| 臺大學術典藏 |
2018-09-10T09:20:51Z |
Thickness-dependent lattice relaxation and the associated optical properties of ZnO epitaxial films grown on Si (111)
|
Liu, W-R; Lin, BH; Kuo, CC; Lee, WC; Hong, M; Kwo, J; Hsu, C-H; Hsieh, WF; MINGHWEI HONG |
| 修平科技大學 |
2003-08 |
Thickness-Dependent Leakage Current of (Polyvinylidene Fluoride/Lead Titanate) Pyroelectric detectors
|
M. C. Kao;C. M. Wang;H. Z. Chen;M. S. Lee;Y. C. Chen |
| 國立中山大學 |
2003 |
Thickness-Dependent Leakage Current of (Polyvinylidene Fluoride/Lead Titanate) Pyroelectric Detectors
|
M.C. KAO; C.M. Wang; H.Z. Chen; M.S. Lee; Y.C. Chen |
