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Showing items 231896-231905 of 2348487 (234849 Page(s) Totally) << < 23185 23186 23187 23188 23189 23190 23191 23192 23193 23194 > >> View [10|25|50] records per page
| 淡江大學 |
1995-07-20 |
Breakdown of Rigid-Unit vibrations in layered semiconductors under pressure : application to germanium sulfide
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Hsueh, H.C. |
| 國立成功大學 |
2014-02 |
Breakdown of the Bretherton law due to wall slippage
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Li, Yen-Ching; Liao, Ying-Chih; Wen, Ten-Chin; Wei, Hsien-Hung |
| 臺大學術典藏 |
2018-09-10T14:54:37Z |
Breakdown of the Bretherton law due to wall slippage
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Li, Y.-C.; Liao, Y.-C.; Wen, T.-C.; Wei, H.-H.; YING-CHIH LIAO |
| 國立暨南國際大學 |
2008 |
Breakdown spots propagation in ultra-thin SiO2 films under repetitive ramped voltage stress using conductive atomic force microscopy
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林式庭?; Lin, ST |
| 國立暨南國際大學 |
2008 |
Breakdown spots propagation in ultra-thin SiO2 films under repetitive ramped voltage stress using conductive atomic force microscopy
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吳幼麟?; Wu, YL |
| 國立臺灣大學 |
1982 |
Breakdown Voltage of Junction Passivated Power Rectifier
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林浩雄; Hwang, C. C.; 胡振國; Chiou, Y. L.; Lin, Hao-Hsiung; Hwang, C. C.; Hwu, Jenn-Gwo; Chiou, Y. L. |
| 國立成功大學 |
2016-08-18 |
Breakdown voltage walkout resulting from hot-carrier-induced interface states in n-type LDMOS transistors
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Chen, J. F.; Feng, Y. -S. |
| 國立交通大學 |
2014-12-08T15:06:31Z |
BREAKDOWN-INITIATED NEGATIVE-RESISTANCE DEVICE WITH MOST-TRANSISTOR STRUCTURE
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YU, GJ; TSAI, C; YU, SY |
| 亞洲大學 |
2007-09 |
Breakfast consumption, body mass index, and body fat percentage among colloge students in Taiwan.
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蒙美津;Mong, Mei-Chin;蒙美津;Mong, Mei-Chin |
| 亞洲大學 |
2007.09 |
Breakfast consumption, body mass index, and body fat percentage among colloge students in Taiwan.
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蒙美津;Mong, Mei-Chin |
Showing items 231896-231905 of 2348487 (234849 Page(s) Totally) << < 23185 23186 23187 23188 23189 23190 23191 23192 23193 23194 > >> View [10|25|50] records per page
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