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臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
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Institution Date Title Author
國立成功大學 2002-11 Breakdown and stress-induced oxide degradation mechanisms in MOSFETs Chen, J. H.; Wei, C. T.; Hung, S. M.; Wong, Shyh-Chyi; Wang, Yeong-Her
國立臺灣大學 2008 Breakdown Behavior of 40-nm PD-SOI NMOS Device Considering STI-Induced Mechanical Stress Effect Su, V.C.; Lin, I.S.; Kuo, J.B.; Lin, G.S.; Chen, D.; Yeh, C.S.; Tsai, C.T.; Ma, M.
臺大學術典藏 2018-09-10T07:08:18Z Breakdown Behavior of 40-nm PD-SOI NMOS Device Considering STI-Induced Mechanical Stress Effect I. S. Lin;V. C. Su;J. B. Kuo;D. Chen;C. S. Yeh;C. T. Tsai;M. Ma; I. S. Lin; V. C. Su; J. B. Kuo; D. Chen; C. S. Yeh; C. T. Tsai; M. Ma; JAMES-B KUO
亞洲大學 2023 Breakdown Behavior of a Nitrogen Implanted AlGaN/GaN HEMT Transistor with different Metal Contact Positions RAMYASRI, MOGARALA
國立高雄師範大學 2001 Breakdown Characteristics of Ultra-thin Gate Oxide ( < 4nm ) in MOS Structure Subjected Substrate Injection Chia-Hong Huang;Jenn-Gwo Hwu; 黃嘉宏
國立交通大學 2014-12-08T15:27:09Z Breakdown characteristics of ultra-thin gate oxides caused by plasma charging Chen, CC; Lin, HC; Chang, CY; Chien, CH; Huang, TY
國立臺灣大學 2001 Breakdown characteristics of ultrathin gate oxides (<4 nm) in metal–oxide–semiconductor structure subjected to substrate injection Huang, Chia-Hong; Hwu, Jenn-Gwo
國立交通大學 2014-12-08T15:41:52Z Breakdown modes and their evolution in ultrathin gate oxide Lin, HC; Lee, DY; Huang, TY
國立成功大學 2015-03-30 Breakdown of Bose-Einstein Distribution in Photonic Crystals Lo, Ping-Yuan; Xiong, Heng-Na; Zhang, Wei-Min
臺大學術典藏 2020-05-22T05:37:20Z Breakdown of Fourier’s Law in Nanotube Thermal Conductors Chang, C.W.; Okawa, D.; Garcia, H.; Majumdar, A.; Zettl, A.
淡江大學 1995-07-20 Breakdown of Rigid-Unit vibrations in layered semiconductors under pressure : application to germanium sulfide Hsueh, H.C.
國立成功大學 2014-02 Breakdown of the Bretherton law due to wall slippage Li, Yen-Ching; Liao, Ying-Chih; Wen, Ten-Chin; Wei, Hsien-Hung
臺大學術典藏 2018-09-10T14:54:37Z Breakdown of the Bretherton law due to wall slippage Li, Y.-C.; Liao, Y.-C.; Wen, T.-C.; Wei, H.-H.; YING-CHIH LIAO
國立暨南國際大學 2008 Breakdown spots propagation in ultra-thin SiO2 films under repetitive ramped voltage stress using conductive atomic force microscopy 林式庭?; Lin, ST
國立暨南國際大學 2008 Breakdown spots propagation in ultra-thin SiO2 films under repetitive ramped voltage stress using conductive atomic force microscopy 吳幼麟?; Wu, YL
國立臺灣大學 1982 Breakdown Voltage of Junction Passivated Power Rectifier 林浩雄; Hwang, C. C.; 胡振國; Chiou, Y. L.; Lin, Hao-Hsiung; Hwang, C. C.; Hwu, Jenn-Gwo; Chiou, Y. L.
國立成功大學 2016-08-18 Breakdown voltage walkout resulting from hot-carrier-induced interface states in n-type LDMOS transistors Chen, J. F.; Feng, Y. -S.
國立交通大學 2014-12-08T15:06:31Z BREAKDOWN-INITIATED NEGATIVE-RESISTANCE DEVICE WITH MOST-TRANSISTOR STRUCTURE YU, GJ; TSAI, C; YU, SY
亞洲大學 2007-09 Breakfast consumption, body mass index, and body fat percentage among colloge students in Taiwan. 蒙美津;Mong, Mei-Chin;蒙美津;Mong, Mei-Chin
亞洲大學 2007.09 Breakfast consumption, body mass index, and body fat percentage among colloge students in Taiwan. 蒙美津;Mong, Mei-Chin
國家衛生研究院 2015-07 Breakfast is associated with the metabolic syndrome and school performance among Taiwanese children Ho, CY;Huang, YC;Lo, YTC;Wahlqvist, ML;Lee, MS
國立成功大學 2024 Breaking Barriers for a Green Future: A Comprehensive Study on Pre-treatment Techniques for Empty Fruit Bunches in the Bio-Based Economy Javanmard;A;Daud, Wan;W, M.A.;Patah;M, F.A.;Zuki, Mohamed;F, M.;Ai;S, P.;Azman;D, Q.;Chen;W, -H.
國立成功大學 2023 Breaking Boundaries in Retrieval Systems: Unsupervised Domain Adaptation with Denoise-Finetuning Chen, Chen C.-W.;Yang, C.-W.;Lin, C.-Y.;Kao, H.-Y.
國立交通大學 2014-12-08T15:10:33Z Breaking concept boundaries to enhance creative potential: Using integrated concept maps for conceptual self-awareness Kao, Gloria Yi-Ming; Lin, Sunny S. J.; Sun, Chuen-Tsai
國立屏東大學 2006 Breaking criterion on internal solitary wave propagation 陳震遠;Tseng*, I-Fan;Hsieh, Chih-Min;Tseng, Chun-Chieh;Ch, Lien-Tung

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