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Institution Date Title Author
臺大學術典藏 2019-12-27T07:49:25Z Defect density reduction of the Al2O3/GaAs(001) interface by using H2S molecular beam passivation Merckling, C.;Chang, Y.C.;Lu, C.Y.;Penaud, J.;Brammertz, G.;Scarrozza, M.;Pourtois, G.;Kwo, J.;Hong, M.;Dekoster, J.;Meuris, M.;Heyns, M.;Caymax, M.; Merckling, C.; Chang, Y.C.; Lu, C.Y.; Penaud, J.; Brammertz, G.; Scarrozza, M.; Pourtois, G.; Kwo, J.; Hong, M.; Dekoster, J.; Meuris, M.; Heyns, M.; Caymax, M.; MINGHWEI HONG
元智大學 2005-04 Defect detection in colored texture surfaces using Gabor filters 蔡篤銘; C.-P. Lin (林志賓); K.-T. Huang (黃國唐)
元智大學 Jan-19 Defect detection in electronic surfaces using template-based Fourier image reconstruction Du-Ming Tsai
元智大學 2007-12 Defect detection in inhomogeneously textured sputtered surfaces using 3D Fourier image reconstruction 蔡篤銘; C. C. Kuo
元智大學 2006-08 Defect detection in low-contrast glass substrates using anisotropic diffusion 蔡篤銘; Shin-Min Chao; Yan-Hsin Tseng; Yuan-Ruei Jhang
元智大學 Aug-15 Defect detection in multi-crystal solar cells using clustering with uniformity measures Du-Ming Tsai; Guan-Nan Li; Wei-Chen Li; Wei-Yao Chiu
元智大學 Aug-15 Defect detection in multi-crystal solar cells using clustering with uniformity measures Du-Ming Tsai; Guan-Nan Li; Wei-Chen Li; Wei-Yao Chiu
元智大學 2008-09 Defect detection in periodically patterned surfaces using independent component analysis 蔡篤銘; 賴夏枝
元智大學 Sep-20 Defect Detection in Printed Circuit Boards Using You-Only-Look-Once Convolutional Neural Networks Venkat Anil Adibhatla; Huan-Chuang Chih; Chi-Chang Hsu; Joseph Cheng; Maysam F. Abbod; J.S. Shieh
元智大學 2013-02 Defect Detection in Solar Modules Using ICA Basis Images Du-Ming Tsai; Shih-Chieh Wu; Wei-Yao Chiu
元智大學 2013 Defect Detection in Solar Modules Using ICA Basis Images Du-Ming Tsai; Shih-Chieh Wu; Wei-Yao Chiu
元智大學 2005-12 Defect detection of backlight panel surfaces using independent component analysis filering scheme 蔡篤銘; Chi-Jie Lu (呂奇傑); Ping-Chieh Lin (林品杰); Yan-Hsin Tseng (曾彥馨)
元智大學 2002-08 Defect detection of gold-plated surfaces on PCBs using entropy measures 蔡篤銘; B. T. Lin
臺大學術典藏 2022-03-22T08:26:00Z Defect detection of grinded and polished workpieces using faster R-CNN Liu M.-W;Lin Y.-H;Lo Y.-C;Shih C.-H;Lin P.-C.; Liu M.-W; Lin Y.-H; Lo Y.-C; Shih C.-H; Lin P.-C.; PEI-CHUN LIN
臺大學術典藏 2022-03-22T08:28:48Z Defect detection of grinded and polished workpieces using faster R-CNN Liu M.-W;Lin Y.-H;Lo Y.-C;Shih C.-H;Lin P.-C.; Liu M.-W; Lin Y.-H; Lo Y.-C; Shih C.-H; Lin P.-C.; PEI-CHUN LIN
臺大學術典藏 2022-03-22T08:28:48Z Defect detection of grinded and polished workpieces using faster R-CNN Liu M.-W;Lin Y.-H;Lo Y.-C;Shih C.-H;Lin P.-C.; Liu M.-W; Lin Y.-H; Lo Y.-C; Shih C.-H; Lin P.-C.; PEI-CHUN LIN
臺大學術典藏 2021-10-21T23:27:23Z Defect detection of grinded and polished workpieces using faster R-CNN Liu, Ming Wei; Lin, Yu Heng; Lo, Yuan Chieh; Shih, Chih Hsuan; PEI-CHUN LIN
元智大學 2004-12 Defect Detection of Patterned TFT-LCD Surfaces Using Independent Component Analysis C.-J. Lu (呂奇傑); 蔡篤銘
元智大學 2012-04 Defect detection of solar cells in electroluminescence images using Fourier image reconstruction Du-Ming Tsai; Shih-Chieh Wu; Wei-Chen Li
元智大學 2012-08 Defect detection of solar cells in electroluminescence images using Fourier image reconstruction Du-Ming Tsai; Shih-Chieh Wu; Wei-Chen Li
元智大學 2010-03 Defect detection of uneven brightness in low-contrast images using basis image representation 曾彥馨; 蔡篤銘
國立交通大學 2019-04-02T06:04:18Z Defect Detection on Randomly Textured Surfaces by Convolutional Neural Networks Jung, S. Y.; Tsai, Y. H.; Chiu, W. Y.; Hu, J. S.; Sun, C. T.
淡江大學 2023-03-30 Defect diamond-like tellurides as infrared nonlinear optical materials with giant second-harmonic generation tensor Mengran Sun, Chunxiao Li, Jinlong Shi, Ming-Hsien Lee , Jiyong Yao
臺大學術典藏 2022-06-30T02:06:07Z Defect Engineering in Ambipolar Layered Materials for Mode-Regulable Nociceptor Li M.; Yang F.-S.; Hsu H.-C.; Chen W.-H.; Kuo C.N.; Chen J.-Y.; Yang S.-H.; Yang T.-H.; Lin C.-Y.; Chou Y.; Lee M.-P.; Chang Y.-M.; Yang Y.-C.; Lee K.-C.; Chou Y.-C.; Lien C.-H.; Lin C.-L.; Chiu Y.-P.; Lue C.S.; Lin S.-P.; Lin Y.-F.; Li M.; Chou Y.-C.; YI-CHIA CHOU
國立成功大學 2021-01 Defect Engineering in Ambipolar Layered Materials for Mode-Regulable Nociceptor Li;Mengjiao;Yang;Feng-Shou;Hsu;Hung-Chang;Chen;Wan-Hsin;Kuo;Nung, Chia;Chen;Jiann-Yeu;Yang;Shao-Heng;Yang;Ting-Hsun;Lin;Che-Yi;Chou;Yi;Lee;Mu-Pai;Chang;Yuan-Ming;Yang;Yung-Cheng;Lee;Ko-Chun;Chou;Yi-Chia;Lien;Chen-Hsin;Lin;Chun-Liang;Chiu;Ya-Ping;Lue;Shan, Chin;Lin;Shu-Ping;Lin;Yen-Fu

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