English  |  正體中文  |  简体中文  |  Total items :0  
Visitors :  52770353    Online Users :  683
Project Commissioned by the Ministry of Education
Project Executed by National Taiwan University Library
 
臺灣學術機構典藏系統 (Taiwan Academic Institutional Repository, TAIR)
About TAIR

Browse By

News

Copyright

Related Links

Jump to: [ Chinese Items ] [ 0-9 ] [ A B C D E F G H I J K L M N O P Q R S T U V W X Y Z ]
or enter the first few letters:   

Showing items 306596-306620 of 2348719  (93949 Page(s) Totally)
<< < 12259 12260 12261 12262 12263 12264 12265 12266 12267 12268 > >>
View [10|25|50] records per page

Institution Date Title Author
國立臺灣大學 2000-03 Defect Inspection and Analysis of Color Filter Panel Wu, M. H.; Chen, C. S.; Fuh, H. Y.
元智大學 2009-12 Defect inspection in low-contrast LCD images using Hough transform-based non-stationary line detection 李韋辰; 蔡篤銘
元智大學 2011-02 Defect inspection in low-contrast LCD images using Hough transform-based nonstationary line detection Wei-Chen Li; Du-Ming Tsai
元智大學 2018-05-20 Defect inspection of liquid-crystal-display (LCD) panels in repetitive pattern images using 2D Fourier image reconstruction Du-Ming Tsai; Morris Fan; Yan Hsin Tseng
元智大學 2018-05-20 Defect Inspection of Liquid-Crystal-Display (LCD) Panels in Repetitive Pattern Images Using 2D Fourier Image Reconstruction Du-Ming Tsai; Yan-Hsin Tseng; S. K. Morris Fan
元智大學 2004-12 Defect Inspection of Patterned TFT-LCD Panels Usinga Fast Sub-image Based SVD C.-J. Lu (呂奇傑); 蔡篤銘
元智大學 2004-10 Defect inspection of patterned thin film transistor-liquid crystal display panels using a fast sub-image-based singular value decomposition C.-J. Lu(呂奇傑); 蔡篤銘
亞洲大學 2016-05 Defect Inspection of Patterned Thin-film Ceramic Light-emitting Diode Substrate Using a Fast Randomized Principal Component Analysis 劉曉薇;Hsiao-Wei,Liu;陳思翰;Ssu-Han,Chen*;彭德保;Der-Baau,Perng;
亞洲大學 2016-05 Defect Inspection of Patterned Thin-film Ceramic Light-emitting Diode Substrate Using a Fast Randomized Principal Component Analysis 劉曉薇;Liu, Hsiao-Wei;陳思翰;Chen, Ssu-Han;*;彭德保;Perng, Der-Baau
亞洲大學 2016-05 Defect Inspection of Patterned Thin-film Ceramic Light-emitting Diode Substrate Using a Fast Randomized Principal Component Analysis Perng;, 劉曉薇;Hsiao-Wei Liu;陳思翰;Ssu-Han Chen;*;彭德保;Der-Baau
亞洲大學 2016-05 Defect Inspection of Patterned Thin-film Ceramic Light-emitting Diode Substrate Using a Fast Randomized Principal Component Analysis Perng;, 劉曉薇;Hsiao-Wei Liu;陳思翰;Ssu-Han Chen;*;彭德保;Der-Baau
國立成功大學 2023-05-4 Defect Inspection Using Modified YoloV4 on a Stitched Image of a Spinning Tool Lin;Bor-Haur;Chen;Ju-Chin;Lien;James, Jenn-Jier
國立中山大學 1990 Defect Microstructure and Dehydroxylation Mechanism of Interstratified Phyllosilicates in Heng-Chun Chromitite: A TEM Study P. Shen;S.L. Hwang;H.T. Chu
國立中山大學 1988 Defect Microstructure in Aluminized Coatings P. Shen;D. Gan;S.L. Hwang
國立中山大學 1987 Defect Microstructure of Interstratified Phyllosilicates in Heng-Chun Chromitite Y.J. Su;S.Y. Chen;H.Y. Lu;P. Shen
國立中山大學 1990 Defect Microstructures of a Calcite Marble, Eastern Taiwan H.H. Liu;S. Chen;P. Shen;T.F. Yui
國立交通大學 2017-04-21T06:49:14Z Defect Mode Lasing in metal-coated GaN Grating Structure at Room Temperature Chen, Kuo-Ju; Hsu, Wan-Hai; Liao, Wei-Chun; Shih, Min-Hsiung; Kuo, Hao-Chung
國立高雄師範大學 1989-10 Defect Model and the Current-Voltage Characteristics in dielectric thin films 林財庫; Tsair-Kuh Lin
國立高雄師範大學 1990 Defect Model for the conduction and breakdown in thin dielectric films 林財庫; Tsair-Kuh Lin
國立成功大學 2005-06 Defect modes in a stacked structure of chiral photonic crystals Chen, Jiun-Yeu; Chen, Lien-Wen
國立臺灣大學 1997 Defect of Cell-Mediated Immune Response against Hepatitis B Virus; An Indication for Pathogenesis of Hepatitis-B-Virus-Associated Membranous Nephropathy Lin, Ching-Yuang; Lin, Chiou-Chyn; Chang, Gwong-Jen J.; King, Chwan-Chuen
臺大學術典藏 2021-01-27T07:49:29Z Defect Passivation by Amide-Based Hole-Transporting Interfacial Layer Enhanced Perovskite Grain Growth for Efficient p-i-n Perovskite Solar Cells Wang, S.-Y.;Chen, C.-P.;Chung, C.-L.;Hsu, C.-W.;Hsu, H.-L.;Wu, T.-H.;Zhuang, J.-Y.;Chang, C.-J.;Chen, H.M.;Chang, Y.J.; Wang, S.-Y.; Chen, C.-P.; Chung, C.-L.; Hsu, C.-W.; Hsu, H.-L.; Wu, T.-H.; Zhuang, J.-Y.; Chang, C.-J.; Chen, H.M.; Chang, Y.J.; HAO MING CHEN
國立臺灣科技大學 2014 Defect prediction for new products during the development phase Chu, T.-P.;Wang, F.-K.
國立成功大學 2007-04 Defect prevention in software processes: An action-based approach Chang, Ching-Pao; Chu, Chih-Ping
國立臺灣海洋大學 2009-03 Defect Reduction of Multi-walled Carbon Nanotubes by Rapid Vacuum Arc Annealing Jeff T.H. Tsai;Anders A. Tseng

Showing items 306596-306620 of 2348719  (93949 Page(s) Totally)
<< < 12259 12260 12261 12262 12263 12264 12265 12266 12267 12268 > >>
View [10|25|50] records per page