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Institution Date Title Author
國立高雄應用科技大學 2013-07 Fault Node Recovery Algorithm for a Wireless Sensor Network Shih, Hong-Chi; Ho, Jiun-Huei; Liao, Bin-Yih; Pan, Jeng-Shyang
國立政治大學 2006-07 Fault Repair Time Distribution in Network Reliability 陸行
國立中山大學 1989 Fault Restoration by Optimizing Switch Configuration in Distribution Systems C.S. Chen; J.S. Wu
國立臺灣科技大學 2013 Fault scrambling techniques for yield enhancement of embedded memories Lu, S.-K.;Jheng, H.-C.;Hashizume, M.;Huang, J.-L.;Ning, P.
臺大學術典藏 2018-09-10T09:50:53Z Fault Scrambling Techniques for Yield Enhancement of Embedded Memories S.-K. Lu;H.-C. Jheng;M. Hashizume;J.-L. Huang;P. Ning; S.-K. Lu; H.-C. Jheng; M. Hashizume; J.-L. Huang; P. Ning; JIUN-LANG HUANG
國立成功大學 2015-01 Fault section estimation in distribution systems using biogeography-based optimization approaches Huang, Shyh-Jier; Liu, Xian-Zong
國立交通大學 2017-04-21T06:56:47Z Fault Self-Detection Technique in Fiber Bragg Grating-Based Passive Sensor Network Yeh, Chien-Hung; Tsai, Ning; Zhuang, Yuan-Hong; Chow, Chi-Wai; Liu, Wen-Feng
臺大學術典藏 2020-06-29T01:20:09Z Fault Simulation and Test Generation Li, J.C.-M.;Hsiao, M.S.; Li, J.C.-M.; Hsiao, M.S.; CHIEN-MO LI
臺大學術典藏 2020-06-29T01:20:10Z Fault Simulation and Test Pattern Generation for Cross-gate Defects in FinFET Circuits Chiang, K.-Y.;Ho, Y.-H.;Chen, Y.-W.;Pan, C.-S.;Li, J.C.-M.; Chiang, K.-Y.; Ho, Y.-H.; Chen, Y.-W.; Pan, C.-S.; Li, J.C.-M.; CHIEN-MO LI
臺大學術典藏 2020-06-29T01:20:11Z Fault Simulation and Test Pattern Generation for Cross-gate Defects in FinFET Circuits. Chen, Yo-Wei; Pan, Cheng-Sheng; Li, James Chien-Mo; CHIEN-MO LI; Ho, Yu-Hao; Chiang, Kuan-Ying; Chiang, Kuan-Ying;Ho, Yu-Hao;Chen, Yo-Wei;Pan, Cheng-Sheng;Li, James Chien-Mo

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