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Showing items 475826-475850 of 2348617 (93945 Page(s) Totally)
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| 國立成功大學 |
2014-02 |
Host-Nonspecific Iron Acquisition Systems and Virulence in the Zoonotic Serovar of Vibrio vulnificus
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Pajuelo, David; Lee, Chung-Te; Roig, Francisco J.; Lemos, Manuel L.; Hor, Lien-I; Amaro, Carmen |
| 國立交通大學 |
2016-03-28T00:04:23Z |
Host-only solid-state near-infrared light-emitting electrochemical cells based on interferometric spectral tailoring
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Hsu, Jia-Hong; Su, Hai-Ching |
| 國立成功大學 |
2015 |
Host-pathogen interactions in Vibrio vulnificus: responses of monocytes and vascular endothelial cells to live bacteria
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Murciano, Celia; Hor, Lien-I; Amaro, Carmen |
| 國立臺灣海洋大學 |
2013-03 |
Host-Specific Phenotypic Plasticity of the Turtle Barnacle Chelonibia testudinaria: A Widespread Generalist Rather than a Specialist
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Chi Chiu Cheang;Ling Ming Tsang;Ka Hou Chu;I-Jiunn Cheng;Benny K. K. Chan |
| 國家衛生研究院 |
2011-08 |
Host-viral effects of chromatin assembly factor 1 interaction with HCMV IE2
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Lee, SB;Lee, CF;Ou, DS;Dulal, K;Chang, LH;Ma, CH;Huang, CF;Zhu, H;Lin, YS;Juan, LJ |
| 義守大學 |
2011-08 |
Host-viral effects of chromatin assembly factor 1 interaction with HCMV IE2
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Sung-Bau Lee;Chung-Fan Lee;Derick S-C Ou;Kalpana Dulal;Liang-Hao Chang;Chen-Han Ma;Chien-Fu Huang;Hua Zhu;Young-Sun Lin;Li-Jung Juan |
| 臺大學術典藏 |
2018-09-10T03:28:01Z |
Hosted particle positions and dipole moments of protein-filled reverse micelles
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Chen, P.;Tsao, H.-K.;Lu, C.-Y.D.; Chen, P.; Tsao, H.-K.; Lu, C.-Y.D.; CHUN-YI,DAVID LU |
| 嘉南藥理大學 |
2009 |
Hosteur
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EBSCO-HTC |
| 義守大學 |
2010-07 |
Hostile area or facility monitoring with an optimal wireless sensor network deployment
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Jenn-Long Liu;Jiann-Horng Lin |
| 國立彰化師範大學 |
2007 |
HOSTs 在卵巢癌細胞中的表現
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李曉微 |
| 國立彰化師範大學 |
2008 |
HOSTs在乳癌組織中的表現
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莊雅惠 |
| 國立政治大學 |
2007-08 |
HOT and the Problem Posed by Anton's Syndrome when accompanied by Hallucinations
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藍亭;梁益堉 |
| 國立高雄師範大學 |
2003 |
Hot carrier cooling study of ZnCdSe epilayers
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李孟恩; D. J. Jang;W. C. Chou;C. S. Yang;C. T. Kuo;Meng-En Lee |
| 國立中山大學 |
2003 |
Hot Carrier Cooling Study of ZnCdSe Epilayers
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D.J. Jang;W.C. Chou;C.S. Yang;C.T. Kuo;M.E. Lee |
| 東海大學 |
2002 |
Hot carrier degradation in deep sub-micron nitride spacer lightly doped drain N-channel metal-oxide-semiconductor transistors
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Tsai, J.-L.a, Huang, K.-Y.a, Lai, J.-H.b, Gong, J.a, Yang, F.-J.b, Lin, S.-Y.a |
| 國立交通大學 |
2014-12-08T15:25:51Z |
Hot carrier degradation in LDMOS power transistors
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Cheng, CC; Wu, JW; Lee, CC; Shao, JH; Wang, T |
| 國立交通大學 |
2014-12-08T15:39:25Z |
Hot carrier degradations of dynamic threshold silicon on insulator p-type metal-oxide-semiconductor field effect transistors
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Chao, TS; Lee, YJ; Huang, CY; Lin, HC; Li, YM; Huang, TY |
| 國立中山大學 |
2003 |
Hot carrier dynamics of ZnCdSe epilayers
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D.J. Jang;C.S. Yang;W.C. Chou;K.T Kuo;M.S. Lee |
| 國立交通大學 |
2014-12-08T15:30:23Z |
Hot carrier effect on gate-induced drain leakage current in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors
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Dai, Chih-Hao; Chang, Ting-Chang; Chu, Ann-Kuo; Kuo, Yuan-Jui; Ho, Szu-Han; Hsieh, Tien-Yu; Lo, Wen-Hung; Chen, Ching-En; Shih, Jou-Miao; Chung, Wan-Lin; Dai, Bai-Shan; Chen, Hua-Mao; Xia, Guangrui; Cheng, Osbert; Huang, Cheng Tung |
| 國立交通大學 |
2014-12-08T15:24:06Z |
Hot Carrier Effect on Gate-Induced Drain Leakage Current in n-MOSFETs with HfO2/Ti1-xNx Gate Stacks
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Dai, Chih-Hao; Chang, Ting-Chang; Chu, Ann-Kuo; Kuo, Yuan-Jui; Ho, Szu-Han; Hsieh, Tien-Yu; Lo, Wen-Hung; Chen, Ching-En; Shih, Jou-Miao; Chung, Wan-Lin; Dai, Bai-Shan; Chen, Hua-Mao; Xia, Guangrui; Cheng, Osbert; Huang, Cheng Tung |
| 國立交通大學 |
2014-12-08T15:42:33Z |
Hot carrier induced degradation in the low temperature processed polycrystalline silicon thin film transistors using the dynamic stress
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Chang, KM; Chung, YH; Lin, GM |
| 臺大學術典藏 |
2021-09-21T23:19:42Z |
Hot carrier induced photothermal effect on metal-semiconductor schottky junction
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Sun, Ruei Lien; Lai, Hsin Han; CHING-FUH LIN |
| 亞洲大學 |
2014-06-10 |
Hot Carrier Injection (HCI) Reliability and Isolation Voltage Calibration of 80V High-Side NLDMOS and Transient Voltage Suppressor (TVS) Diode
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Kurniawan, Erry Dwi |
| 國立成功大學 |
2023 |
Hot Carrier Injection Reliability of Fabricated N- and P-Type Multi FinFETs with Different TiN Stacks
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Chen, Y.-L.;Yeh, W.-K.;Hsu, Hsu H.-T.;Chen, K.-H.;Lin, W.-C.;Yu, T.-H.;Chou, H.-T.;Godwin, Raj D.;Godfrey, D. |
| 元智大學 |
2008-01 |
Hot carrier photoluminescence in InN epilayers
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柯正浩; M.D. Yang; Y.P. Chen; G.W. Shu; J.L. Shen; S.C. Hung; G.C. Chi; T.Y. Lin; Y.C. Lee; C.T. Chen |
Showing items 475826-475850 of 2348617 (93945 Page(s) Totally)
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