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Institution	Date	Title	Author
國家衛生研究院	2011-08	Host-viral effects of chromatin assembly factor 1 interaction with HCMV IE2	Lee, SB;Lee, CF;Ou, DS;Dulal, K;Chang, LH;Ma, CH;Huang, CF;Zhu, H;Lin, YS;Juan, LJ
臺大學術典藏	2018-09-10T03:28:01Z	Hosted particle positions and dipole moments of protein-filled reverse micelles	Chen, P.;Tsao, H.-K.;Lu, C.-Y.D.; Chen, P.; Tsao, H.-K.; Lu, C.-Y.D.; CHUN-YI,DAVID LU
嘉南藥理大學	2009	Hosteur	EBSCO-HTC
義守大學	2010-07	Hostile area or facility monitoring with an optimal wireless sensor network deployment	Jenn-Long Liu;Jiann-Horng Lin
國立彰化師範大學	2007	HOSTs 在卵巢癌細胞中的表現	李曉微
國立彰化師範大學	2008	HOSTs在乳癌組織中的表現	莊雅惠
國立政治大學	2007-08	HOT and the Problem Posed by Anton's Syndrome when accompanied by Hallucinations	藍亭;梁益堉
國立高雄師範大學	2003	Hot carrier cooling study of ZnCdSe epilayers	李孟恩; D. J. Jang;W. C. Chou;C. S. Yang;C. T. Kuo;Meng-En Lee
國立中山大學	2003	Hot Carrier Cooling Study of ZnCdSe Epilayers	D.J. Jang;W.C. Chou;C.S. Yang;C.T. Kuo;M.E. Lee
東海大學	2002	Hot carrier degradation in deep sub-micron nitride spacer lightly doped drain N-channel metal-oxide-semiconductor transistors	Tsai, J.-L.a, Huang, K.-Y.a, Lai, J.-H.b, Gong, J.a, Yang, F.-J.b, Lin, S.-Y.a
國立交通大學	2014-12-08T15:25:51Z	Hot carrier degradation in LDMOS power transistors	Cheng, CC; Wu, JW; Lee, CC; Shao, JH; Wang, T
國立交通大學	2014-12-08T15:39:25Z	Hot carrier degradations of dynamic threshold silicon on insulator p-type metal-oxide-semiconductor field effect transistors	Chao, TS; Lee, YJ; Huang, CY; Lin, HC; Li, YM; Huang, TY
國立中山大學	2003	Hot carrier dynamics of ZnCdSe epilayers	D.J. Jang;C.S. Yang;W.C. Chou;K.T Kuo;M.S. Lee
國立交通大學	2014-12-08T15:30:23Z	Hot carrier effect on gate-induced drain leakage current in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors	Dai, Chih-Hao; Chang, Ting-Chang; Chu, Ann-Kuo; Kuo, Yuan-Jui; Ho, Szu-Han; Hsieh, Tien-Yu; Lo, Wen-Hung; Chen, Ching-En; Shih, Jou-Miao; Chung, Wan-Lin; Dai, Bai-Shan; Chen, Hua-Mao; Xia, Guangrui; Cheng, Osbert; Huang, Cheng Tung
國立交通大學	2014-12-08T15:24:06Z	Hot Carrier Effect on Gate-Induced Drain Leakage Current in n-MOSFETs with HfO2/Ti1-xNx Gate Stacks	Dai, Chih-Hao; Chang, Ting-Chang; Chu, Ann-Kuo; Kuo, Yuan-Jui; Ho, Szu-Han; Hsieh, Tien-Yu; Lo, Wen-Hung; Chen, Ching-En; Shih, Jou-Miao; Chung, Wan-Lin; Dai, Bai-Shan; Chen, Hua-Mao; Xia, Guangrui; Cheng, Osbert; Huang, Cheng Tung
國立交通大學	2014-12-08T15:42:33Z	Hot carrier induced degradation in the low temperature processed polycrystalline silicon thin film transistors using the dynamic stress	Chang, KM; Chung, YH; Lin, GM
臺大學術典藏	2021-09-21T23:19:42Z	Hot carrier induced photothermal effect on metal-semiconductor schottky junction	Sun, Ruei Lien; Lai, Hsin Han; CHING-FUH LIN
亞洲大學	2014-06-10	Hot Carrier Injection (HCI) Reliability and Isolation Voltage Calibration of 80V High-Side NLDMOS and Transient Voltage Suppressor (TVS) Diode	Kurniawan, Erry Dwi
國立成功大學	2023	Hot Carrier Injection Reliability of Fabricated N- and P-Type Multi FinFETs with Different TiN Stacks	Chen, Y.-L.;Yeh, W.-K.;Hsu, Hsu H.-T.;Chen, K.-H.;Lin, W.-C.;Yu, T.-H.;Chou, H.-T.;Godwin, Raj D.;Godfrey, D.
元智大學	2008-01	Hot carrier photoluminescence in InN epilayers	柯正浩; M.D. Yang; Y.P. Chen; G.W. Shu; J.L. Shen; S.C. Hung; G.C. Chi; T.Y. Lin; Y.C. Lee; C.T. Chen
國立臺灣海洋大學	2008	Hot carrier photoluminescence in InN epilayers	M. D. Yang;Y. P. Chen;G. W. Shu;J. L Shen;S. C. Hung;G. C. Chi;T. Y. Lin;Y. C. Lee;C. T. Chen;C. H. Ko
國立臺灣大學	2000	Hot carrier recombination model of visible electroluminescence from metal oxide silicon tunneling diodes	Liu, C. W.; Chang, S. T.; Liu, W. T.; Chen, Miin-Jang; Lin, Ching-Fuh
中原大學	2000-12	Hot carrier recombination model of visible electroluminescence from metal-oxide-silicon tunneling diodes	C. W. Liu;S. T. Chang;W. T. Liu;Miin-Jang Chen;Ching-Fuh Lin
臺大學術典藏	2018-09-10T03:29:44Z	Hot carrier recombination model of visible electroluminescence from metal-oxide-silicon tunneling diodes	Liu, C.W.; Chang, S.T.; Liu, W.T.; Chen, M.-J.; Lin, C.-F.; CHEE-WEE LIU
臺大學術典藏	2018-09-10T03:29:28Z	Hot carrier recombination model of visible electroluminescence from metal-oxide-silicon tunneling diodes	Liu, C.W.; Chang, S.T.; Liu, W.T.; Chen, M.-J.; Lin, C.-F.; CHING-FUH LIN
國立交通大學	2014-12-08T15:44:34Z	Hot carrier reliability improvement by utilizing phosphorus transient enhanced diffusion for input/output devices of deep submicron CMOS technology	Wang, HCH; Diaz, CH; Liew, BK; Sun, JYC; Wang, TH
國立暨南國際大學	2013	Hot carrier-induced emission from the InGaN/GaN light-emitting diode by characterizing reverse-bias electroluminescence	陳祥; Chen, H
臺大學術典藏	2018-09-10T14:55:46Z	Hot carriers in epitaxial graphene sheets with and without hydrogen intercalation: Role of substrate coupling	Lo, S.-T.; Chuang, C.; Woo, T.-P.; Lee, H.-Y.; Liu, C.-W.; Liu, C.-I.; Huang, L.-I.; Liu, C.-H.; Yang, Y.; Chang, C.-Y.S.; Li, L.-J.; Mende, P.C.; Feenstra, R.M.; Elmquist, R.E.; Liang, C.-T.; CHI-TE LIANG
臺大學術典藏	2019-12-27T01:16:42Z	Hot carriers in epitaxial graphene sheets with and without hydrogen intercalation: Role of substrate coupling	Liu, F.-H.; Lo, S.-T.; Chuang, C.; Woo, T.-P.; Lee, H.-Y.; Liu, C.-W.; Liu, C.-I.; Huang, L.-I.; Liu, C.-H.; Yang, Y.; Chang, C.-Y.S.; Li, L.-J.; Mende, P.C.; Feenstra, R.M.; Elmquist, R.E.; Liang, C.-T.; TAK-PONG WOO
中華大學	2011	Hot Compressive Flow Behavior of Inconel 600 Superalloy	吳泓瑜; Wu, Horng-yu
中華大學	2013	Hot compressive flow stress modeling of homogenized AZ61 Mg alloy using strain-dependent constitutive equations	吳泓瑜; Wu, Horng-yu
國立虎尾科技大學	2006	Hot corrosion behavior of laser-glazed plasma-sprayed yttria-stabilized zirconia thermal barrier coatings in the presence of V2O5	Tsai, P.C.;Lee, J.H.;Hsu, C.S.
國立交通大學	2014-12-08T15:30:32Z	Hot Cracking in AZ31 and AZ61 Magnesium Alloy	Huang, C. J.; Cheng, C. M.; Chou, C. P.; Chen, F. H.
國立交通大學	2014-12-08T15:19:02Z	Hot cracking of welds on heat treatable aluminium alloys	Cheng, CM; Chou, CP; Lee, IK; Lin, HY
國立臺灣海洋大學	2013-02	Hot cracking susceptibility of alloy 52M weld overlays onto CF8 stainless steel	H. A. Chu; M. C. Young; H. C. Chu; C. Chen; L.W. Tsay
國立成功大學	2016-11-20	Hot deformation behaviour and microstructural evolution of biomedical Ti-13Nb-13Zr alloy in high strain rate range	Lee, Woei-Shyan; Kao, Chung-Hao
中華大學	2012	Hot deformation characteristics and strain-dependent constitutive analysis of Inconel 600 superalloy	吳泓瑜; Wu, Horng-yu
中華大學	2012	Hot deformation characteristics of as-cast and homogenized AZ61 Mg alloys under compression	吳泓瑜; Wu, Horng-yu
國立交通大學	2014-12-08T15:47:12Z	Hot ductility behaviour of 18%Ni maraging steel	Chen, MH; Chou, CP
國立交通大學	2014-12-08T15:02:07Z	Hot ductility behaviour of Al-Li alloy AA2091-T3	Hwang, RY; Chou, CP
臺大學術典藏	2019-07-15T04:23:56Z	Hot electron based surface plasmon resonance sensor with Au-TiO2-Ti planar micro-comb structure Schottky diodes	Wang C.;Chen L.-Q.;Chen Y.-M.;Lin C.-W.; Wang C.; Chen L.-Q.; Chen Y.-M.; Lin C.-W.
淡江大學	2003-03-20	Hot embossing auto-leveling apparatus and method	趙崇禮; Chao, Choung-lii; Huang; Jung-yan; Tsai, Chu-shu; Mu, Chuan-kang; Yang, Jauh-jung; Huang, Cheng-chun ; Liu, Ming-yueh
國立聯合大學	2008	Hot embossing by Joule heating	J. C. Lee, I. C. Leu*, G. L. Lai and M. H. Hon
國立聯合大學	2007	Hot Embossing by Joule Heating	J. C. Lee, I. C. Leu, G. L. Lai and M. H. Hon,
國立成功大學	2008-01	Hot embossing by Joule heating	Lee, Jui-Chi; Leu, Ing-Chi; Lai, K. L.; Hon, Min-Hsiung
國立中山大學	2008	Hot Embossing of Micro-Lens Array on Bulk Metallic Glass	C.T. Pan;T.T. Wu;M.F. Chen;Y.M. Hwang;Y.C. Chang;C.J. Lee;J.C. Huang
南亞技術學院	2006-05	Hot embossing of microfluidic platform	Chien, RD
臺大學術典藏	2019-09-09T00:54:16Z	Hot embossing of microstructure with moving induction heating and gas-assisted pressuring	Hung, Wei Cheng;SEN-YEU YANG;Ke, Kun Cheng;Kao, Ching Chieh; Kao, Ching Chieh; Ke, Kun Cheng; SEN-YEU YANG; Hung, Wei Cheng
臺大學術典藏	2020-01-13T08:23:12Z	Hot embossing of microstructure with moving induction heating and gas-assisted pressuring	Kao, C.-C.; Ke, K.-C.; Hung, W.-C.; Yang, S.-Y.; SEN-YEU YANG
國立交通大學	2014-12-08T15:08:25Z	Hot Embossing of Parallel v-Groove Microstructures on Glass	Hsu, Ray-Quen; Wang, Hsing-Bun; Liang, Da-Lan

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