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Showing items 647321-647345 of 2348406 (93937 Page(s) Totally)
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| 大葉大學 |
2015-12-18 |
Oxide layer in metal-oxide-semiconductor field effect transistor and its effect on threshold voltage
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Fan, Jung-Chuan;Lee, Tsung-Che;Lee, Li-Ying;Lee, Shih-Fong |
| 大葉大學 |
2016-07-11 |
Oxide layer in metal-oxide-semiconductor field effect transistor and its effect on threshold voltage
|
Fan, Jung-Chuan;Lee, Shih-Fong |
| 國立成功大學 |
2009-11-18 |
Oxide mediated liquid-solid growth of high aspect ratio aligned gold silicide nanowires on Si(110) substrates
|
Bhatta, Umananda M.; Rath, Ashutosh; Dash, Jatis K.; Ghatak, Jay; Lai Yi-Feng; Liu, Chuan-Pu; Satyam, P. V. |
| 臺大學術典藏 |
1990-07 |
Oxide Resistance Characterization in MOS structures by the Voltage Decay Method
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Hwu, Jenn-Gwo; Ho, I-Hsiu; Hwu, Jenn-Gwo; Ho, I-Hsiu |
| 國立臺灣大學 |
1990-07 |
Oxide Resistance Characterization in MOS structures by the Voltage Decay Method
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Hwu, Jenn-Gwo; Ho, I-Hsiu |
| 臺大學術典藏 |
2018-09-10T04:13:01Z |
Oxide roughness effect on tunneling current of MOS diodes
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Hsu, B.-C.; Chen, K.-F.; Lai, C.-C.; Lee, S.W.; Liu, C.W.; CHEE-WEE LIU |
| 國立臺灣大學 |
2002 |
Oxide roughness effect on tunneling current of MOS diodes
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Hsu, B.-C.; Chen, K.-F.; Lai, C.-C.; Lee, S.W.; Liu, C.W. |
| 臺大學術典藏 |
2018-09-10T03:48:04Z |
Oxide roughness enhanced reliability of MOS tunneling diodes
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Lin, C.-H.; Lee, M.H.; Hsu, B.-C.; Chen, K.-F.; Shie, C.-R.; Liu, C.W.; CHEE-WEE LIU |
| 國立臺灣大學 |
2001-12 |
Oxide roughness enhanced reliability of MOS tunneling diodes
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Lin, C.H.; Lee, M.H.; Hsu, B.C.; Chen, K.F.; Shie, C.R.; Liu, C.W. |
| 臺大學術典藏 |
2018-09-10T07:01:14Z |
Oxide scalability in Al [sub 2] O [sub 3]/Ga [sub 2] O [sub 3](Gd [sub 2] O [sub 3])/In [sub 0.20] Ga [sub 0.80] As/GaAs heterostructures
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Tung, LT; Hong, M; Kwo, J; Tsai, W; MINGHWEI HONG; Chang, P; Shiu, KH; Chiang, CH; Lee, YJ; Lee, WC |
| 臺大學術典藏 |
2019-12-27T07:49:41Z |
Oxide scalability in Al2 O3 Ga2 O3 (Gd2 O3) In0.20 Ga0.80 AsGaAs heterostructures
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Shiu, K.H.; Chiang, C.H.; Lee, Y.J.; Lee, W.C.; Chang, P.; Tung, L.T.; Hong, M.; Kwo, J.; Tsai, W.; MINGHWEI HONG |
| 臺大學術典藏 |
2018-09-10T07:01:20Z |
Oxide scalability in Al2O3/Ga2O3 (Gd2O3)/In0. 20Ga0. 80As/GaAs heterostructures
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Shiu, KH; Chiang, CH; Lee, YJ; Lee, WC; Chang, P; Tung, LT; Hong, M; Kwo, J; Tsai, W; MINGHWEI HONG |
| 臺大學術典藏 |
2022-09-21T23:30:16Z |
Oxide Semiconductor Field-Effect Transistor for High-Resolution Displays Capable of Deep Black Display
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Okazaki, Yutaka; Sawai, Hiromi; Endo, Masami; Motoyoshi, Ryousuke; Shimada, Daigo; Kunitake, Hitoshi; Yamazaki, Shunpei; Huang, Kou Chang; Yoshida, Hiroshi; Chen, Min Cheng; MING-HAN LIAO; Chang, Shou Zen |
| 國立臺灣科技大學 |
2012 |
Oxide solar cells fabricated using zinc oxide and plasma-oxidized cuprous oxide
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Chan, Y.-M.;Wu, Y.-T.;Jou, S. |
| 國立交通大學 |
2014-12-08T15:46:47Z |
Oxide thickness dependence of plasma charging damage
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Lin, HC; Chen, CC; Wang, MF; Hsien, SK; Chien, CH; Huang, TY; Chang, CY |
| 國立聯合大學 |
2004 |
Oxide Thickness Dependent Suboxide Width and Its Effect on Inversion Tunneling Current
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胡振國, Y.P.Lin and J.G.Hwu |
| 國立臺灣大學 |
2004 |
Oxide Thickness Dependent Suboxide Width and Its Effect on Inversion Tunneling Current
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Lin, Yen-Po; Hwu, Jenn-Gwo |
| 國立交通大學 |
2014-12-08T15:21:32Z |
Oxide Thinning and Structure Scaling Down Effect of Low-Temperature Poly-Si Thin-Film Transistors
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Ma, William Cheng-Yu; Chiang, Tsung-Yu; Lin, Je-Wei; Chao, Tien-Sheng |
| 國立交通大學 |
2014-12-08T15:45:02Z |
Oxide thinning percolation statistical model for soft breakdown in ultrathin gate oxides
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Chen, MJ; Kang, TK; Liu, CH; Chang, YJ; Fu, KY |
| 國立交通大學 |
2017-04-21T06:50:01Z |
Oxide-Based RRAM: Unified Microscopic Principle for both Unipolar and Bipolar Switching
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Gao, B.; Kang, J. F.; Chen, Y. S.; Zhang, F. F.; Chen, B.; Huang, P.; Liu, L. F.; Liu, X. Y.; Wang, Y. Y.; Tran, X. A.; Wang, Z. R.; Yu, H. Y.; Chin, Albert |
| 臺大學術典藏 |
2021-09-02T00:03:42Z |
Oxide-confined VCSEL with metal apertures for high-speed 850nm transmission
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Min S.-Y;Cheng H.-T;Pan J.-S;Lin W.-H;Wu C.-H.; Min S.-Y; Cheng H.-T; Pan J.-S; Lin W.-H; Wu C.-H.; CHAO-HSIN WU |
| 臺大學術典藏 |
2020-06-29T01:15:35Z |
Oxide-Confined VCSELs for High-Speed Optical Interconnects
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Feng, M.;Wu, C.-H.;Holonyak, N.; Feng, M.; Wu, C.-H.; Holonyak, N.; CHAO-HSIN WU |
| 國立交通大學 |
2014-12-08T15:42:45Z |
Oxide-confined vertical-cavity surface-emitting lasers pumped Nd : YVO4 microchip lasers
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Lan, YP; Chen, YF; Huang, KF; Lai, HC; Pan, JS |
| 國立成功大學 |
1998 |
Oxide-GaAs Interfacial Electronic Properties Characterized by Modulation Spectroscopy of Photoreflectance
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Hwang, J. S.; Wang, Y. C.; Chou, W. Y.; Tyan, S. L.; Hong, M.; Mannaerts, J. P.; Kwo, J. |
| 臺大學術典藏 |
2018-09-10T07:01:20Z |
Oxide-GaAs interfacial electronic properties characterized by modulation spectroscopy of photoreflectance
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Hwang, JS;Wang, YC;Chou, WY;Tyan, SL;Hong, M;Mannaerts, JP;Kwo, J;others; Hwang, JS; Wang, YC; Chou, WY; Tyan, SL; Hong, M; Mannaerts, JP; Kwo, J; others; MINGHWEI HONG |
Showing items 647321-647345 of 2348406 (93937 Page(s) Totally)
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