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Showing items 872801-872810 of 2346288 (234629 Page(s) Totally)
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| 國立交通大學 |
2018-08-21T05:53:33Z |
Thickness Effect on Operational Modes of ZnGa2O4 MOSFETs
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Cheng, Li-Chung; Huang, Chiung-Yi; Horng, Ray-Hua |
| 國立成功大學 |
2009-08-31 |
Thickness effect on the formation of SiC nanoparticles in sandwiched Si/C/Si and C/Si multilayers
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Chung, Chen-Kuei; Wu, Bo-Hsiung; Chen, T. S.; Peng, C. C.; Lai, C. W. |
| 國立交通大學 |
2014-12-08T15:38:17Z |
Thickness effect on ultrafast thermalization of carriers in above-band-gap states in ZnO epitaxial films
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Ou, Po-Chi; Lin, Ja-Hon; Chang, Chi-An; Liu, Wei-Rein; Hsieh, Wen-Feng |
| 國立東華大學 |
2009-12 |
Thickness effects of LaNiO3 buffer layer on SrZrO3 resistive switching thin films
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林群傑; Lin, Chun-Chieh; Lai, Cheng-Fu |
| 國立交通大學 |
2014-12-08T15:14:27Z |
Thickness effects on the electrical characteristics of Ba0.7Sr0.3TiO3 capacitors with nano-Cr interlayer
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Ho, Chia-Cheng; Chiou, Bi-Shiou; Chang, Li-Chun |
| 國立成功大學 |
2008-10 |
Thickness for Optimizing of Organic Layer and Multi-Layer Anode on Luminance Efficiency in White-Light Top-Emission Organic Light-Emitting Diodes
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Huang, Jian-Ji; Ueng, Herng-Yih; Su, Yan-Kuin; Lin, Shin-Ju; Juang, Fuh-Shyang |
| 國立臺灣大學 |
2007 |
Thickness limit in perpendicular magnetic anisotropy L10 FePt(0 0 1) thin film
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Sun, An-Cheng; Hsu, Jen-Hwa; Kuo, P.C.; Huang, H.L.; Lu, H.C.; Wang, S.F. |
| 國立臺灣大學 |
2011 |
Thickness measurement of colloidal opal crystal growth by Bragg reflection
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Lin, Ming-Zheng; Li, Guan-Hui; Chern, Ming-Yau; Lan, Chung-Wen |
| 臺大學術典藏 |
2018-09-10T08:36:15Z |
Thickness measurement of colloidal opal crystal growth by Bragg reflection
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Lin, M.-Z.;Li, G.-H.;Chern, M.-Y.;Lan, C.-W.; Lin, M.-Z.; Li, G.-H.; Chern, M.-Y.; Lan, C.-W.; MING-YAU CHERN |
| 臺大學術典藏 |
2011 |
Thickness measurement of colloidal opal crystal growth by Bragg reflection
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Lin, M.-Z.; Li, G.-H.; Chern, M.-Y.; Lan, C.-W.; CHUNG-WEN LAN |
Showing items 872801-872810 of 2346288 (234629 Page(s) Totally)
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