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教育部委托研究计画 计画执行:国立台湾大学图书馆
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显示项目 231891-231900 / 2348487 (共234849页)
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每页显示[10|25|50]项目
| 國立交通大學 |
2014-12-08T15:27:09Z |
Breakdown characteristics of ultra-thin gate oxides caused by plasma charging
|
Chen, CC; Lin, HC; Chang, CY; Chien, CH; Huang, TY |
| 國立臺灣大學 |
2001 |
Breakdown characteristics of ultrathin gate oxides (<4 nm) in metal–oxide–semiconductor structure subjected to substrate injection
|
Huang, Chia-Hong; Hwu, Jenn-Gwo |
| 國立交通大學 |
2014-12-08T15:41:52Z |
Breakdown modes and their evolution in ultrathin gate oxide
|
Lin, HC; Lee, DY; Huang, TY |
| 國立成功大學 |
2015-03-30 |
Breakdown of Bose-Einstein Distribution in Photonic Crystals
|
Lo, Ping-Yuan; Xiong, Heng-Na; Zhang, Wei-Min |
| 臺大學術典藏 |
2020-05-22T05:37:20Z |
Breakdown of Fourier’s Law in Nanotube Thermal Conductors
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Chang, C.W.; Okawa, D.; Garcia, H.; Majumdar, A.; Zettl, A. |
| 淡江大學 |
1995-07-20 |
Breakdown of Rigid-Unit vibrations in layered semiconductors under pressure : application to germanium sulfide
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Hsueh, H.C. |
| 國立成功大學 |
2014-02 |
Breakdown of the Bretherton law due to wall slippage
|
Li, Yen-Ching; Liao, Ying-Chih; Wen, Ten-Chin; Wei, Hsien-Hung |
| 臺大學術典藏 |
2018-09-10T14:54:37Z |
Breakdown of the Bretherton law due to wall slippage
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Li, Y.-C.; Liao, Y.-C.; Wen, T.-C.; Wei, H.-H.; YING-CHIH LIAO |
| 國立暨南國際大學 |
2008 |
Breakdown spots propagation in ultra-thin SiO2 films under repetitive ramped voltage stress using conductive atomic force microscopy
|
林式庭?; Lin, ST |
| 國立暨南國際大學 |
2008 |
Breakdown spots propagation in ultra-thin SiO2 films under repetitive ramped voltage stress using conductive atomic force microscopy
|
吳幼麟?; Wu, YL |
显示项目 231891-231900 / 2348487 (共234849页)
<< < 23185 23186 23187 23188 23189 23190 23191 23192 23193 23194 > >>
每页显示[10|25|50]项目
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