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显示项目 470671-470695 / 2310117 (共92405页)
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| 國立交通大學 |
2014-12-08T15:39:25Z |
Hot carrier degradations of dynamic threshold silicon on insulator p-type metal-oxide-semiconductor field effect transistors
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Chao, TS; Lee, YJ; Huang, CY; Lin, HC; Li, YM; Huang, TY |
| 國立中山大學 |
2003 |
Hot carrier dynamics of ZnCdSe epilayers
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D.J. Jang;C.S. Yang;W.C. Chou;K.T Kuo;M.S. Lee |
| 國立交通大學 |
2014-12-08T15:30:23Z |
Hot carrier effect on gate-induced drain leakage current in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors
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Dai, Chih-Hao; Chang, Ting-Chang; Chu, Ann-Kuo; Kuo, Yuan-Jui; Ho, Szu-Han; Hsieh, Tien-Yu; Lo, Wen-Hung; Chen, Ching-En; Shih, Jou-Miao; Chung, Wan-Lin; Dai, Bai-Shan; Chen, Hua-Mao; Xia, Guangrui; Cheng, Osbert; Huang, Cheng Tung |
| 國立交通大學 |
2014-12-08T15:24:06Z |
Hot Carrier Effect on Gate-Induced Drain Leakage Current in n-MOSFETs with HfO2/Ti1-xNx Gate Stacks
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Dai, Chih-Hao; Chang, Ting-Chang; Chu, Ann-Kuo; Kuo, Yuan-Jui; Ho, Szu-Han; Hsieh, Tien-Yu; Lo, Wen-Hung; Chen, Ching-En; Shih, Jou-Miao; Chung, Wan-Lin; Dai, Bai-Shan; Chen, Hua-Mao; Xia, Guangrui; Cheng, Osbert; Huang, Cheng Tung |
| 國立交通大學 |
2014-12-08T15:42:33Z |
Hot carrier induced degradation in the low temperature processed polycrystalline silicon thin film transistors using the dynamic stress
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Chang, KM; Chung, YH; Lin, GM |
| 臺大學術典藏 |
2021-09-21T23:19:42Z |
Hot carrier induced photothermal effect on metal-semiconductor schottky junction
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Sun, Ruei Lien; Lai, Hsin Han; CHING-FUH LIN |
| 亞洲大學 |
2014-06-10 |
Hot Carrier Injection (HCI) Reliability and Isolation Voltage Calibration of 80V High-Side NLDMOS and Transient Voltage Suppressor (TVS) Diode
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Kurniawan, Erry Dwi |
| 國立成功大學 |
2023 |
Hot Carrier Injection Reliability of Fabricated N- and P-Type Multi FinFETs with Different TiN Stacks
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Chen, Y.-L.;Yeh, W.-K.;Hsu, Hsu H.-T.;Chen, K.-H.;Lin, W.-C.;Yu, T.-H.;Chou, H.-T.;Godwin, Raj D.;Godfrey, D. |
| 元智大學 |
2008-01 |
Hot carrier photoluminescence in InN epilayers
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柯正浩; M.D. Yang; Y.P. Chen; G.W. Shu; J.L. Shen; S.C. Hung; G.C. Chi; T.Y. Lin; Y.C. Lee; C.T. Chen |
| 國立臺灣海洋大學 |
2008 |
Hot carrier photoluminescence in InN epilayers
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M. D. Yang;Y. P. Chen;G. W. Shu;J. L Shen;S. C. Hung;G. C. Chi;T. Y. Lin;Y. C. Lee;C. T. Chen;C. H. Ko |
| 國立臺灣大學 |
2000 |
Hot carrier recombination model of visible electroluminescence from metal oxide silicon tunneling diodes
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Liu, C. W.; Chang, S. T.; Liu, W. T.; Chen, Miin-Jang; Lin, Ching-Fuh |
| 中原大學 |
2000-12 |
Hot carrier recombination model of visible electroluminescence from metal-oxide-silicon tunneling diodes
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C. W. Liu;S. T. Chang;W. T. Liu;Miin-Jang Chen;Ching-Fuh Lin |
| 臺大學術典藏 |
2018-09-10T03:29:44Z |
Hot carrier recombination model of visible electroluminescence from metal-oxide-silicon tunneling diodes
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Liu, C.W.; Chang, S.T.; Liu, W.T.; Chen, M.-J.; Lin, C.-F.; CHEE-WEE LIU |
| 臺大學術典藏 |
2018-09-10T03:29:28Z |
Hot carrier recombination model of visible electroluminescence from metal-oxide-silicon tunneling diodes
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Liu, C.W.; Chang, S.T.; Liu, W.T.; Chen, M.-J.; Lin, C.-F.; CHING-FUH LIN |
| 國立交通大學 |
2014-12-08T15:44:34Z |
Hot carrier reliability improvement by utilizing phosphorus transient enhanced diffusion for input/output devices of deep submicron CMOS technology
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Wang, HCH; Diaz, CH; Liew, BK; Sun, JYC; Wang, TH |
| 國立暨南國際大學 |
2013 |
Hot carrier-induced emission from the InGaN/GaN light-emitting diode by characterizing reverse-bias electroluminescence
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陳祥; Chen, H |
| 臺大學術典藏 |
2018-09-10T14:55:46Z |
Hot carriers in epitaxial graphene sheets with and without hydrogen intercalation: Role of substrate coupling
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Lo, S.-T.; Chuang, C.; Woo, T.-P.; Lee, H.-Y.; Liu, C.-W.; Liu, C.-I.; Huang, L.-I.; Liu, C.-H.; Yang, Y.; Chang, C.-Y.S.; Li, L.-J.; Mende, P.C.; Feenstra, R.M.; Elmquist, R.E.; Liang, C.-T.; CHI-TE LIANG |
| 臺大學術典藏 |
2019-12-27T01:16:42Z |
Hot carriers in epitaxial graphene sheets with and without hydrogen intercalation: Role of substrate coupling
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Liu, F.-H.; Lo, S.-T.; Chuang, C.; Woo, T.-P.; Lee, H.-Y.; Liu, C.-W.; Liu, C.-I.; Huang, L.-I.; Liu, C.-H.; Yang, Y.; Chang, C.-Y.S.; Li, L.-J.; Mende, P.C.; Feenstra, R.M.; Elmquist, R.E.; Liang, C.-T.; TAK-PONG WOO |
| 中華大學 |
2011 |
Hot Compressive Flow Behavior of Inconel 600 Superalloy
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吳泓瑜; Wu, Horng-yu |
| 中華大學 |
2013 |
Hot compressive flow stress modeling of homogenized AZ61 Mg alloy using strain-dependent constitutive equations
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吳泓瑜; Wu, Horng-yu |
| 國立虎尾科技大學 |
2006 |
Hot corrosion behavior of laser-glazed plasma-sprayed yttria-stabilized zirconia thermal barrier coatings in the presence of V2O5
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Tsai, P.C.;Lee, J.H.;Hsu, C.S. |
| 國立交通大學 |
2014-12-08T15:30:32Z |
Hot Cracking in AZ31 and AZ61 Magnesium Alloy
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Huang, C. J.; Cheng, C. M.; Chou, C. P.; Chen, F. H. |
| 國立交通大學 |
2014-12-08T15:19:02Z |
Hot cracking of welds on heat treatable aluminium alloys
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Cheng, CM; Chou, CP; Lee, IK; Lin, HY |
| 國立臺灣海洋大學 |
2013-02 |
Hot cracking susceptibility of alloy 52M weld overlays onto CF8 stainless steel
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H. A. Chu; M. C. Young; H. C. Chu; C. Chen; L.W. Tsay |
| 國立成功大學 |
2016-11-20 |
Hot deformation behaviour and microstructural evolution of biomedical Ti-13Nb-13Zr alloy in high strain rate range
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Lee, Woei-Shyan; Kao, Chung-Hao |
显示项目 470671-470695 / 2310117 (共92405页)
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