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显示项目 527201-527210 / 2348674 (共234868页)
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| 國立交通大學 |
2014-12-08T15:08:55Z |
Investigation of GaN-based light emitting diodes with nano-hole patterned sapphire substrate (NHPSS) by nano-imprint lithography
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Huang, H. W.; Lin, C. H.; Huang, J. K.; Lee, K. Y.; Lin, C. F.; Yu, C. C.; Tsai, J. Y.; Hsueh, R.; Kuo, H. C.; Wang, S. C. |
| 國立成功大學 |
2011-06 |
Investigation of GaN-Based Light-Emitting Diodes Grown on Patterned Sapphire Substrates by Contact-Transferred and Mask-Embedded Lithography
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Kao, Chien-Chih; Su, Yan-Kuin; Hsieh, Yi-Ta; Lee, Yung-Chun; Cheng, Chiao-Yang; Lin, Chuing-Liang |
| 國立交通大學 |
2014-12-08T15:37:34Z |
Investigation of GaN-based light-emitting diodes using double photonic crystal patterns
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Huang, H. W.; Lai, Fang-I; Kuo, S. Y.; Huang, J. K.; Lee, K. Y. |
| 元智大學 |
2011-01 |
Investigation of GaN-based light-emitting diodes using double photonic crystal patterns
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H. W. Huang; Fang-I Lai; S.Y. Kuo; J. K. Huang; K.Y. Lee |
| 國立成功大學 |
2024-02-01 |
Investigation of GaN-Based Micro-LEDs with Effective Tetramethylammonium Hydroxide Treatment
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Wang;Zhen-Jin;Ye;Xin-Liang;Su;Li-Yun;Tu;Wei-Chen;Yang;Chih-Chiang;Su;Yan-Kuin |
| 國立交通大學 |
2014-12-08T15:11:10Z |
Investigation of GaN-based vertical-injection light-emitting diodes with GaN nano-cone structure by ICP etching
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Huang, H. W.; Lin, C. H.; Yu, C. C.; Lee, K. Y.; Lee, B. D.; Kuo, H. C.; Kuo, S. Y.; Leung, K. M.; Wang, S. C. |
| 國立交通大學 |
2014-12-08T15:33:13Z |
Investigation of Gate Oxide Short in FinFETs and the Test Methods for FinFET SRAMs
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Lin, Chen-Wei; Chao, Mango C. -T.; Hsu, Chih-Chieh |
| 中原大學 |
2009-08 |
Investigation of Gate Oxide Wear out Using Polysilazane-base Inorganic as Shallow Trench Filling
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Ching-Yuan. Ho; Kai-Yao. Shih; Jr Hau He |
| 國立交通大學 |
2014-12-08T15:33:46Z |
Investigation of gate-bias stress and hot-carrier stress-induced instability of InGaZnO thin-film transistors under different environments
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Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Te; Jian, Fu-Yen; Lin, Chia-Sheng; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
| 國立成功大學 |
2013-09 |
Investigation of gate-bias stress and hot-carrier stress-induced instability of InGaZnO thin-film transistors under different environments
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Hsieh, Tien-Yu; Chang, Ting-Chang; Chen, Te-Chih; Tsai, Ming-Yen; Chen, Yu-Te; Jian, Fu-Yen; Lin, Chia-Sheng; Tsai, Wu-Wei; Chiang, Wen-Jen; Yan, Jing-Yi |
显示项目 527201-527210 / 2348674 (共234868页)
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每页显示[10|25|50]项目
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