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| 國立高雄應用科技大學 |
2013-07 |
Fault Node Recovery Algorithm for a Wireless Sensor Network
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Shih, Hong-Chi; Ho, Jiun-Huei; Liao, Bin-Yih; Pan, Jeng-Shyang |
| 國立政治大學 |
2006-07 |
Fault Repair Time Distribution in Network Reliability
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陸行 |
| 國立中山大學 |
1989 |
Fault Restoration by Optimizing Switch Configuration in Distribution Systems
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C.S. Chen; J.S. Wu |
| 國立臺灣科技大學 |
2013 |
Fault scrambling techniques for yield enhancement of embedded memories
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Lu, S.-K.;Jheng, H.-C.;Hashizume, M.;Huang, J.-L.;Ning, P. |
| 臺大學術典藏 |
2018-09-10T09:50:53Z |
Fault Scrambling Techniques for Yield Enhancement of Embedded Memories
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S.-K. Lu;H.-C. Jheng;M. Hashizume;J.-L. Huang;P. Ning; S.-K. Lu; H.-C. Jheng; M. Hashizume; J.-L. Huang; P. Ning; JIUN-LANG HUANG |
| 國立成功大學 |
2015-01 |
Fault section estimation in distribution systems using biogeography-based optimization approaches
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Huang, Shyh-Jier; Liu, Xian-Zong |
| 國立交通大學 |
2017-04-21T06:56:47Z |
Fault Self-Detection Technique in Fiber Bragg Grating-Based Passive Sensor Network
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Yeh, Chien-Hung; Tsai, Ning; Zhuang, Yuan-Hong; Chow, Chi-Wai; Liu, Wen-Feng |
| 臺大學術典藏 |
2020-06-29T01:20:09Z |
Fault Simulation and Test Generation
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Li, J.C.-M.;Hsiao, M.S.; Li, J.C.-M.; Hsiao, M.S.; CHIEN-MO LI |
| 臺大學術典藏 |
2020-06-29T01:20:10Z |
Fault Simulation and Test Pattern Generation for Cross-gate Defects in FinFET Circuits
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Chiang, K.-Y.;Ho, Y.-H.;Chen, Y.-W.;Pan, C.-S.;Li, J.C.-M.; Chiang, K.-Y.; Ho, Y.-H.; Chen, Y.-W.; Pan, C.-S.; Li, J.C.-M.; CHIEN-MO LI |
| 臺大學術典藏 |
2020-06-29T01:20:11Z |
Fault Simulation and Test Pattern Generation for Cross-gate Defects in FinFET Circuits.
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Chen, Yo-Wei; Pan, Cheng-Sheng; Li, James Chien-Mo; CHIEN-MO LI; Ho, Yu-Hao; Chiang, Kuan-Ying; Chiang, Kuan-Ying;Ho, Yu-Hao;Chen, Yo-Wei;Pan, Cheng-Sheng;Li, James Chien-Mo |
顯示項目 425476-425485 / 2348487 (共234849頁)
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