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Showing items 475831-475855 of 2348617 (93945 Page(s) Totally)
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| 國家衛生研究院 |
2011-08 |
Host-viral effects of chromatin assembly factor 1 interaction with HCMV IE2
|
Lee, SB;Lee, CF;Ou, DS;Dulal, K;Chang, LH;Ma, CH;Huang, CF;Zhu, H;Lin, YS;Juan, LJ |
| 臺大學術典藏 |
2018-09-10T03:28:01Z |
Hosted particle positions and dipole moments of protein-filled reverse micelles
|
Chen, P.;Tsao, H.-K.;Lu, C.-Y.D.; Chen, P.; Tsao, H.-K.; Lu, C.-Y.D.; CHUN-YI,DAVID LU |
| 嘉南藥理大學 |
2009 |
Hosteur
|
EBSCO-HTC |
| 義守大學 |
2010-07 |
Hostile area or facility monitoring with an optimal wireless sensor network deployment
|
Jenn-Long Liu;Jiann-Horng Lin |
| 國立彰化師範大學 |
2007 |
HOSTs 在卵巢癌細胞中的表現
|
李曉微 |
| 國立彰化師範大學 |
2008 |
HOSTs在乳癌組織中的表現
|
莊雅惠 |
| 國立政治大學 |
2007-08 |
HOT and the Problem Posed by Anton's Syndrome when accompanied by Hallucinations
|
藍亭;梁益堉 |
| 國立高雄師範大學 |
2003 |
Hot carrier cooling study of ZnCdSe epilayers
|
李孟恩; D. J. Jang;W. C. Chou;C. S. Yang;C. T. Kuo;Meng-En Lee |
| 國立中山大學 |
2003 |
Hot Carrier Cooling Study of ZnCdSe Epilayers
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D.J. Jang;W.C. Chou;C.S. Yang;C.T. Kuo;M.E. Lee |
| 東海大學 |
2002 |
Hot carrier degradation in deep sub-micron nitride spacer lightly doped drain N-channel metal-oxide-semiconductor transistors
|
Tsai, J.-L.a, Huang, K.-Y.a, Lai, J.-H.b, Gong, J.a, Yang, F.-J.b, Lin, S.-Y.a |
| 國立交通大學 |
2014-12-08T15:25:51Z |
Hot carrier degradation in LDMOS power transistors
|
Cheng, CC; Wu, JW; Lee, CC; Shao, JH; Wang, T |
| 國立交通大學 |
2014-12-08T15:39:25Z |
Hot carrier degradations of dynamic threshold silicon on insulator p-type metal-oxide-semiconductor field effect transistors
|
Chao, TS; Lee, YJ; Huang, CY; Lin, HC; Li, YM; Huang, TY |
| 國立中山大學 |
2003 |
Hot carrier dynamics of ZnCdSe epilayers
|
D.J. Jang;C.S. Yang;W.C. Chou;K.T Kuo;M.S. Lee |
| 國立交通大學 |
2014-12-08T15:30:23Z |
Hot carrier effect on gate-induced drain leakage current in high-k/metal gate n-channel metal-oxide-semiconductor field-effect transistors
|
Dai, Chih-Hao; Chang, Ting-Chang; Chu, Ann-Kuo; Kuo, Yuan-Jui; Ho, Szu-Han; Hsieh, Tien-Yu; Lo, Wen-Hung; Chen, Ching-En; Shih, Jou-Miao; Chung, Wan-Lin; Dai, Bai-Shan; Chen, Hua-Mao; Xia, Guangrui; Cheng, Osbert; Huang, Cheng Tung |
| 國立交通大學 |
2014-12-08T15:24:06Z |
Hot Carrier Effect on Gate-Induced Drain Leakage Current in n-MOSFETs with HfO2/Ti1-xNx Gate Stacks
|
Dai, Chih-Hao; Chang, Ting-Chang; Chu, Ann-Kuo; Kuo, Yuan-Jui; Ho, Szu-Han; Hsieh, Tien-Yu; Lo, Wen-Hung; Chen, Ching-En; Shih, Jou-Miao; Chung, Wan-Lin; Dai, Bai-Shan; Chen, Hua-Mao; Xia, Guangrui; Cheng, Osbert; Huang, Cheng Tung |
| 國立交通大學 |
2014-12-08T15:42:33Z |
Hot carrier induced degradation in the low temperature processed polycrystalline silicon thin film transistors using the dynamic stress
|
Chang, KM; Chung, YH; Lin, GM |
| 臺大學術典藏 |
2021-09-21T23:19:42Z |
Hot carrier induced photothermal effect on metal-semiconductor schottky junction
|
Sun, Ruei Lien; Lai, Hsin Han; CHING-FUH LIN |
| 亞洲大學 |
2014-06-10 |
Hot Carrier Injection (HCI) Reliability and Isolation Voltage Calibration of 80V High-Side NLDMOS and Transient Voltage Suppressor (TVS) Diode
|
Kurniawan, Erry Dwi |
| 國立成功大學 |
2023 |
Hot Carrier Injection Reliability of Fabricated N- and P-Type Multi FinFETs with Different TiN Stacks
|
Chen, Y.-L.;Yeh, W.-K.;Hsu, Hsu H.-T.;Chen, K.-H.;Lin, W.-C.;Yu, T.-H.;Chou, H.-T.;Godwin, Raj D.;Godfrey, D. |
| 元智大學 |
2008-01 |
Hot carrier photoluminescence in InN epilayers
|
柯正浩; M.D. Yang; Y.P. Chen; G.W. Shu; J.L. Shen; S.C. Hung; G.C. Chi; T.Y. Lin; Y.C. Lee; C.T. Chen |
| 國立臺灣海洋大學 |
2008 |
Hot carrier photoluminescence in InN epilayers
|
M. D. Yang;Y. P. Chen;G. W. Shu;J. L Shen;S. C. Hung;G. C. Chi;T. Y. Lin;Y. C. Lee;C. T. Chen;C. H. Ko |
| 國立臺灣大學 |
2000 |
Hot carrier recombination model of visible electroluminescence from metal oxide silicon tunneling diodes
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Liu, C. W.; Chang, S. T.; Liu, W. T.; Chen, Miin-Jang; Lin, Ching-Fuh |
| 中原大學 |
2000-12 |
Hot carrier recombination model of visible electroluminescence from metal-oxide-silicon tunneling diodes
|
C. W. Liu;S. T. Chang;W. T. Liu;Miin-Jang Chen;Ching-Fuh Lin |
| 臺大學術典藏 |
2018-09-10T03:29:44Z |
Hot carrier recombination model of visible electroluminescence from metal-oxide-silicon tunneling diodes
|
Liu, C.W.; Chang, S.T.; Liu, W.T.; Chen, M.-J.; Lin, C.-F.; CHEE-WEE LIU |
| 臺大學術典藏 |
2018-09-10T03:29:28Z |
Hot carrier recombination model of visible electroluminescence from metal-oxide-silicon tunneling diodes
|
Liu, C.W.; Chang, S.T.; Liu, W.T.; Chen, M.-J.; Lin, C.-F.; CHING-FUH LIN |
Showing items 475831-475855 of 2348617 (93945 Page(s) Totally)
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