| 國立高雄師範大學 |
1989 |
Defect density and the corresponding Activation Energy in Amorphous Dielectric thin films
|
林財庫; Tsair-Kuh Lin |
| 中華大學 |
2009 |
Defect Density Extraction of high-κ Dielectric Gate Stack by Combining Charge Pumping and Low Frequency Measurement
|
吳建宏; rossiwu |
| 臺大學術典藏 |
2018-09-10T08:40:12Z |
Defect density reduction of the Al 2 O 3/GaAs (001) interface by using H 2 S molecular beam passivation
|
Merckling, C;Chang, YC;Lu, CY;Penaud, J;Brammertz, G;Scarrozza, M;Pourtois, G;Kwo, J;Hong, M;Dekoster, J;others; Merckling, C; Chang, YC; Lu, CY; Penaud, J; Brammertz, G; Scarrozza, M; Pourtois, G; Kwo, J; Hong, M; Dekoster, J; others; MINGHWEI HONG |
| 國立交通大學 |
2014-12-08T15:26:43Z |
Defect density reduction of the Al(2)O(3)/GaAs(001) interface by using H(2)S molecular beam passivation
|
Merckling, C.; Chang, Y. C.; Lu, C. Y.; Penaud, J.; Brammertz, G.; Scarrozza, M.; Pourtois, G.; Kwo, J.; Hong, M.; Dekoster, J.; Meuris, M.; Heyns, M.; Caymax, M. |
| 國立交通大學 |
2019-04-02T05:58:57Z |
Defect density reduction of the Al2O3/GaAs(001) interface by using H2S molecular beam passivation
|
Merckling, C.; Chang, Y. C.; Lu, C. Y.; Penaud, J.; Brammertz, G.; Scarrozza, M.; Pourtois, G.; Kwo, J.; Hong, M.; Dekoster, J.; Meuris, M.; Heyns, M.; Caymax, M. |
| 臺大學術典藏 |
2019-12-27T07:49:25Z |
Defect density reduction of the Al2O3/GaAs(001) interface by using H2S molecular beam passivation
|
Merckling, C.;Chang, Y.C.;Lu, C.Y.;Penaud, J.;Brammertz, G.;Scarrozza, M.;Pourtois, G.;Kwo, J.;Hong, M.;Dekoster, J.;Meuris, M.;Heyns, M.;Caymax, M.; Merckling, C.; Chang, Y.C.; Lu, C.Y.; Penaud, J.; Brammertz, G.; Scarrozza, M.; Pourtois, G.; Kwo, J.; Hong, M.; Dekoster, J.; Meuris, M.; Heyns, M.; Caymax, M.; MINGHWEI HONG |
| 元智大學 |
2005-04 |
Defect detection in colored texture surfaces using Gabor filters
|
蔡篤銘; C.-P. Lin (林志賓); K.-T. Huang (黃國唐) |
| 元智大學 |
Jan-19 |
Defect detection in electronic surfaces using template-based Fourier image reconstruction
|
Du-Ming Tsai |
| 元智大學 |
2007-12 |
Defect detection in inhomogeneously textured sputtered surfaces using 3D Fourier image reconstruction
|
蔡篤銘; C. C. Kuo |
| 元智大學 |
2006-08 |
Defect detection in low-contrast glass substrates using anisotropic diffusion
|
蔡篤銘; Shin-Min Chao; Yan-Hsin Tseng; Yuan-Ruei Jhang |
| 元智大學 |
Aug-15 |
Defect detection in multi-crystal solar cells using clustering with uniformity measures
|
Du-Ming Tsai; Guan-Nan Li; Wei-Chen Li; Wei-Yao Chiu |
| 元智大學 |
Aug-15 |
Defect detection in multi-crystal solar cells using clustering with uniformity measures
|
Du-Ming Tsai; Guan-Nan Li; Wei-Chen Li; Wei-Yao Chiu |
| 元智大學 |
2008-09 |
Defect detection in periodically patterned surfaces using independent component analysis
|
蔡篤銘; 賴夏枝 |
| 元智大學 |
Sep-20 |
Defect Detection in Printed Circuit Boards Using You-Only-Look-Once Convolutional Neural Networks
|
Venkat Anil Adibhatla; Huan-Chuang Chih; Chi-Chang Hsu; Joseph Cheng; Maysam F. Abbod; J.S. Shieh |
| 元智大學 |
2013-02 |
Defect Detection in Solar Modules Using ICA Basis Images
|
Du-Ming Tsai; Shih-Chieh Wu; Wei-Yao Chiu |
| 元智大學 |
2013 |
Defect Detection in Solar Modules Using ICA Basis Images
|
Du-Ming Tsai; Shih-Chieh Wu; Wei-Yao Chiu |
| 元智大學 |
2005-12 |
Defect detection of backlight panel surfaces using independent component analysis filering scheme
|
蔡篤銘; Chi-Jie Lu (呂奇傑); Ping-Chieh Lin (林品杰); Yan-Hsin Tseng (曾彥馨) |
| 元智大學 |
2002-08 |
Defect detection of gold-plated surfaces on PCBs using entropy measures
|
蔡篤銘; B. T. Lin |
| 臺大學術典藏 |
2022-03-22T08:26:00Z |
Defect detection of grinded and polished workpieces using faster R-CNN
|
Liu M.-W;Lin Y.-H;Lo Y.-C;Shih C.-H;Lin P.-C.; Liu M.-W; Lin Y.-H; Lo Y.-C; Shih C.-H; Lin P.-C.; PEI-CHUN LIN |
| 臺大學術典藏 |
2022-03-22T08:28:48Z |
Defect detection of grinded and polished workpieces using faster R-CNN
|
Liu M.-W;Lin Y.-H;Lo Y.-C;Shih C.-H;Lin P.-C.; Liu M.-W; Lin Y.-H; Lo Y.-C; Shih C.-H; Lin P.-C.; PEI-CHUN LIN |
| 臺大學術典藏 |
2022-03-22T08:28:48Z |
Defect detection of grinded and polished workpieces using faster R-CNN
|
Liu M.-W;Lin Y.-H;Lo Y.-C;Shih C.-H;Lin P.-C.; Liu M.-W; Lin Y.-H; Lo Y.-C; Shih C.-H; Lin P.-C.; PEI-CHUN LIN |
| 臺大學術典藏 |
2021-10-21T23:27:23Z |
Defect detection of grinded and polished workpieces using faster R-CNN
|
Liu, Ming Wei; Lin, Yu Heng; Lo, Yuan Chieh; Shih, Chih Hsuan; PEI-CHUN LIN |
| 元智大學 |
2004-12 |
Defect Detection of Patterned TFT-LCD Surfaces Using Independent Component Analysis
|
C.-J. Lu (呂奇傑); 蔡篤銘 |
| 元智大學 |
2012-04 |
Defect detection of solar cells in electroluminescence images using Fourier image reconstruction
|
Du-Ming Tsai; Shih-Chieh Wu; Wei-Chen Li |
| 元智大學 |
2012-08 |
Defect detection of solar cells in electroluminescence images using Fourier image reconstruction
|
Du-Ming Tsai; Shih-Chieh Wu; Wei-Chen Li |
| 元智大學 |
2010-03 |
Defect detection of uneven brightness in low-contrast images using basis image representation
|
曾彥馨; 蔡篤銘 |
| 國立交通大學 |
2019-04-02T06:04:18Z |
Defect Detection on Randomly Textured Surfaces by Convolutional Neural Networks
|
Jung, S. Y.; Tsai, Y. H.; Chiu, W. Y.; Hu, J. S.; Sun, C. T. |
| 淡江大學 |
2023-03-30 |
Defect diamond-like tellurides as infrared nonlinear optical materials with giant second-harmonic generation tensor
|
Mengran Sun, Chunxiao Li, Jinlong Shi, Ming-Hsien Lee , Jiyong Yao |
| 臺大學術典藏 |
2022-06-30T02:06:07Z |
Defect Engineering in Ambipolar Layered Materials for Mode-Regulable Nociceptor
|
Li M.; Yang F.-S.; Hsu H.-C.; Chen W.-H.; Kuo C.N.; Chen J.-Y.; Yang S.-H.; Yang T.-H.; Lin C.-Y.; Chou Y.; Lee M.-P.; Chang Y.-M.; Yang Y.-C.; Lee K.-C.; Chou Y.-C.; Lien C.-H.; Lin C.-L.; Chiu Y.-P.; Lue C.S.; Lin S.-P.; Lin Y.-F.; Li M.; Chou Y.-C.; YI-CHIA CHOU |
| 國立成功大學 |
2021-01 |
Defect Engineering in Ambipolar Layered Materials for Mode-Regulable Nociceptor
|
Li;Mengjiao;Yang;Feng-Shou;Hsu;Hung-Chang;Chen;Wan-Hsin;Kuo;Nung, Chia;Chen;Jiann-Yeu;Yang;Shao-Heng;Yang;Ting-Hsun;Lin;Che-Yi;Chou;Yi;Lee;Mu-Pai;Chang;Yuan-Ming;Yang;Yung-Cheng;Lee;Ko-Chun;Chou;Yi-Chia;Lien;Chen-Hsin;Lin;Chun-Liang;Chiu;Ya-Ping;Lue;Shan, Chin;Lin;Shu-Ping;Lin;Yen-Fu |
| 臺大學術典藏 |
2019-07-22T01:45:09Z |
Defect engineering of metal-oxide interface for proximity of photooxidation and photoreduction
|
Yu G.;Wang X.;Basset J.-M.;Wu J.C.S.;Zhang Y.;Su W.;Tong Y.;Chen L.;Long J.;Ling L.;Qiu M.;Fang Z.;Zhang Z.;Zhou Y.; Zhou Y.; Zhang Z.; Fang Z.; Qiu M.; Ling L.; Long J.; Chen L.; Tong Y.; Su W.; Zhang Y.; Wu J.C.S.; Basset J.-M.; Wang X.; Yu G. |
| 國立高雄大學 |
2011 |
Defect engineering of room-temperature ferromagnetism of carbon-doped ZnO
|
孫士傑; Hsu, H.S.; Tung, Y.; Chen, Y.J.; Chen, M.G.; Lee, J.S. |
| 淡江大學 |
2024-04-10 |
Defect engineering simultaneously regulating exciton dissociation in carbon nitride and local electron density in Pt single atoms toward highly efficient photocatalytic hydrogen production
|
Liu, Dongjie;Zhang, Chunyang;Shi, Jinwen;Shi, Yuchuan;Nga, Ta Thi Thuy;Liu, Maochang;Shen, Shaohua;Dong, Chun-Li |
| 國立臺灣科技大學 |
2012 |
Defect evolution in multiwalled carbon nanotube films irradiated by ar ions
|
Honda, S.-I.;Nanba, S.;Hasegawa, Y.;Nosho, Y.;Tsukagoshi, A.;Niibe, M.;Terasawa, M.;Hirase, R.;Izumi, H.;Yoshioka, H.;Lee, K.-Y.;Niwase, K.;Taguchi, E.;Oura, M. |
| 國立成功大學 |
2013-12-07 |
Defect formation by pristine indenter at the initial stage of nanoindentation
|
Chen, I-Hsien; Hsiao, Chun-I; Behera, Rakesh K.; Hsu, Wen-Dung |
| 國立成功大學 |
2015 |
Defect formation mechanism and quality improvement of InAlN epilayers grown by metal-organic chemical vapor deposition
|
Wang, Tzu Yu; Liang, Jia Hao; Wuu, Dong Sing |
| 國立中山大學 |
1996 |
Defect Formation Mechanisms in Laser Welding Technique for Semiconductor Laser Packaging
|
W.H. Cheng; W.H. Wang; J.C. Chen |
| 義守大學 |
2006-04 |
Defect generation of rutile-type SnO2 nanocondensates: Imperfect oriented attachment and phase transformation
|
Wan-Ju Tseng;Pouyan Shen;Shuei-Yuan Chen |
| 國立中山大學 |
1998 |
Defect in Optoelectronic Materials Due to Phosphorus-Containing Underlayer
|
W.H. Cheng; S.C. Wang;Y.K. Tu; C.H. Chen; K.C. Hsieh |
| 國立中山大學 |
1998 |
Defect in Optoelectronic Materials Due to Phosphous-containing Underlayer
|
W.H. Cheng;S.C. Wang;Y.K. Tu;C.H. Chen;K.C. Hsieh |
| 國立交通大學 |
2014-12-08T15:06:52Z |
Defect indices of powers of a contraction
|
Gau, Hwa-Long; Wu, Pei Yuan |
| 國立成功大學 |
2024-07 |
Defect induced crystal lattice disorder and its effect on the electron-phonon coupling in Fe doped ZnO thin films
|
Brahma;Sanjaya;Lo;Chiung-Yuan;Chen;Ssu-Chi;Chu;Heng-Chi;Hsu;Han, Cheng;Huang;Jow-Lay |
| 國立成功大學 |
2019 |
Defect induced ferromagnetic ordering in epitaxial Zn0.95Mn0.05O films on sapphire (0 0 0 1)
|
Liu, W.-R.;Pao, C.-W.;Yu, D.W.;Chin, Y.-Y.;Wu, Wu W.-B.;Lin, H.-J.;Haw, S.-C.;Chu, Chu C.-H.;Chao, T.-Y.;Hsu, Hsu H.-C.;Chen, J.-M.;Hsu, C.-H.;Hsieh, W.-F.;Chen, Chen C.-T. |
| 國立交通大學 |
2019-10-05T00:08:49Z |
Defect induced ferromagnetic ordering in epitaxial Zn0.95Mn0.05O films on sapphire (0001)
|
Liu, Wei-Rein; Pao, Chih-Wen; Yu, Doris Weijyun; Chin, Yi-Ying; Wu, Wen-Bin; Lin, Hong-Ji; Haw, Shu-Chih; Chu, Chia-Hung; Chao, Tzu-Yang; Hsu, Hsu-Cheng; Chen, Jin-Ming; Hsu, Chia-Hung; Hsieh, Wen-Feng; Chen, Chien-Te |
| 淡江大學 |
2017 |
Defect induced magnetism in nano-materials studied by X-ray-based spectroscopic and microscopic techniques
|
王玉富;Wang, Yu-Fu |
| 國立臺灣大學 |
2000-03 |
Defect Inspection and Analysis of Color Filter Panel
|
Wu, M. H.; Chen, C. S.; Fuh, H. Y. |
| 元智大學 |
2009-12 |
Defect inspection in low-contrast LCD images using Hough transform-based non-stationary line detection
|
李韋辰; 蔡篤銘 |
| 元智大學 |
2011-02 |
Defect inspection in low-contrast LCD images using Hough transform-based nonstationary line detection
|
Wei-Chen Li; Du-Ming Tsai |
| 元智大學 |
2018-05-20 |
Defect inspection of liquid-crystal-display (LCD) panels in repetitive pattern images using 2D Fourier image reconstruction
|
Du-Ming Tsai; Morris Fan; Yan Hsin Tseng |
| 元智大學 |
2018-05-20 |
Defect Inspection of Liquid-Crystal-Display (LCD) Panels in Repetitive Pattern Images Using 2D Fourier Image Reconstruction
|
Du-Ming Tsai; Yan-Hsin Tseng; S. K. Morris Fan |
