| 國立高雄師範大學 |
1989 |
Defect density and the corresponding Activation Energy in Amorphous Dielectric thin films
|
林財庫; Tsair-Kuh Lin |
| 中華大學 |
2009 |
Defect Density Extraction of high-κ Dielectric Gate Stack by Combining Charge Pumping and Low Frequency Measurement
|
吳建宏; rossiwu |
| 臺大學術典藏 |
2018-09-10T08:40:12Z |
Defect density reduction of the Al 2 O 3/GaAs (001) interface by using H 2 S molecular beam passivation
|
Merckling, C;Chang, YC;Lu, CY;Penaud, J;Brammertz, G;Scarrozza, M;Pourtois, G;Kwo, J;Hong, M;Dekoster, J;others; Merckling, C; Chang, YC; Lu, CY; Penaud, J; Brammertz, G; Scarrozza, M; Pourtois, G; Kwo, J; Hong, M; Dekoster, J; others; MINGHWEI HONG |
| 國立交通大學 |
2014-12-08T15:26:43Z |
Defect density reduction of the Al(2)O(3)/GaAs(001) interface by using H(2)S molecular beam passivation
|
Merckling, C.; Chang, Y. C.; Lu, C. Y.; Penaud, J.; Brammertz, G.; Scarrozza, M.; Pourtois, G.; Kwo, J.; Hong, M.; Dekoster, J.; Meuris, M.; Heyns, M.; Caymax, M. |
| 國立交通大學 |
2019-04-02T05:58:57Z |
Defect density reduction of the Al2O3/GaAs(001) interface by using H2S molecular beam passivation
|
Merckling, C.; Chang, Y. C.; Lu, C. Y.; Penaud, J.; Brammertz, G.; Scarrozza, M.; Pourtois, G.; Kwo, J.; Hong, M.; Dekoster, J.; Meuris, M.; Heyns, M.; Caymax, M. |
| 臺大學術典藏 |
2019-12-27T07:49:25Z |
Defect density reduction of the Al2O3/GaAs(001) interface by using H2S molecular beam passivation
|
Merckling, C.;Chang, Y.C.;Lu, C.Y.;Penaud, J.;Brammertz, G.;Scarrozza, M.;Pourtois, G.;Kwo, J.;Hong, M.;Dekoster, J.;Meuris, M.;Heyns, M.;Caymax, M.; Merckling, C.; Chang, Y.C.; Lu, C.Y.; Penaud, J.; Brammertz, G.; Scarrozza, M.; Pourtois, G.; Kwo, J.; Hong, M.; Dekoster, J.; Meuris, M.; Heyns, M.; Caymax, M.; MINGHWEI HONG |
| 元智大學 |
2005-04 |
Defect detection in colored texture surfaces using Gabor filters
|
蔡篤銘; C.-P. Lin (林志賓); K.-T. Huang (黃國唐) |
| 元智大學 |
Jan-19 |
Defect detection in electronic surfaces using template-based Fourier image reconstruction
|
Du-Ming Tsai |
| 元智大學 |
2007-12 |
Defect detection in inhomogeneously textured sputtered surfaces using 3D Fourier image reconstruction
|
蔡篤銘; C. C. Kuo |
| 元智大學 |
2006-08 |
Defect detection in low-contrast glass substrates using anisotropic diffusion
|
蔡篤銘; Shin-Min Chao; Yan-Hsin Tseng; Yuan-Ruei Jhang |
| 元智大學 |
Aug-15 |
Defect detection in multi-crystal solar cells using clustering with uniformity measures
|
Du-Ming Tsai; Guan-Nan Li; Wei-Chen Li; Wei-Yao Chiu |
| 元智大學 |
Aug-15 |
Defect detection in multi-crystal solar cells using clustering with uniformity measures
|
Du-Ming Tsai; Guan-Nan Li; Wei-Chen Li; Wei-Yao Chiu |
| 元智大學 |
2008-09 |
Defect detection in periodically patterned surfaces using independent component analysis
|
蔡篤銘; 賴夏枝 |
| 元智大學 |
Sep-20 |
Defect Detection in Printed Circuit Boards Using You-Only-Look-Once Convolutional Neural Networks
|
Venkat Anil Adibhatla; Huan-Chuang Chih; Chi-Chang Hsu; Joseph Cheng; Maysam F. Abbod; J.S. Shieh |
| 元智大學 |
2013-02 |
Defect Detection in Solar Modules Using ICA Basis Images
|
Du-Ming Tsai; Shih-Chieh Wu; Wei-Yao Chiu |
| 元智大學 |
2013 |
Defect Detection in Solar Modules Using ICA Basis Images
|
Du-Ming Tsai; Shih-Chieh Wu; Wei-Yao Chiu |
| 元智大學 |
2005-12 |
Defect detection of backlight panel surfaces using independent component analysis filering scheme
|
蔡篤銘; Chi-Jie Lu (呂奇傑); Ping-Chieh Lin (林品杰); Yan-Hsin Tseng (曾彥馨) |
| 元智大學 |
2002-08 |
Defect detection of gold-plated surfaces on PCBs using entropy measures
|
蔡篤銘; B. T. Lin |
| 臺大學術典藏 |
2022-03-22T08:26:00Z |
Defect detection of grinded and polished workpieces using faster R-CNN
|
Liu M.-W;Lin Y.-H;Lo Y.-C;Shih C.-H;Lin P.-C.; Liu M.-W; Lin Y.-H; Lo Y.-C; Shih C.-H; Lin P.-C.; PEI-CHUN LIN |
| 臺大學術典藏 |
2022-03-22T08:28:48Z |
Defect detection of grinded and polished workpieces using faster R-CNN
|
Liu M.-W;Lin Y.-H;Lo Y.-C;Shih C.-H;Lin P.-C.; Liu M.-W; Lin Y.-H; Lo Y.-C; Shih C.-H; Lin P.-C.; PEI-CHUN LIN |
| 臺大學術典藏 |
2022-03-22T08:28:48Z |
Defect detection of grinded and polished workpieces using faster R-CNN
|
Liu M.-W;Lin Y.-H;Lo Y.-C;Shih C.-H;Lin P.-C.; Liu M.-W; Lin Y.-H; Lo Y.-C; Shih C.-H; Lin P.-C.; PEI-CHUN LIN |
| 臺大學術典藏 |
2021-10-21T23:27:23Z |
Defect detection of grinded and polished workpieces using faster R-CNN
|
Liu, Ming Wei; Lin, Yu Heng; Lo, Yuan Chieh; Shih, Chih Hsuan; PEI-CHUN LIN |
| 元智大學 |
2004-12 |
Defect Detection of Patterned TFT-LCD Surfaces Using Independent Component Analysis
|
C.-J. Lu (呂奇傑); 蔡篤銘 |
| 元智大學 |
2012-04 |
Defect detection of solar cells in electroluminescence images using Fourier image reconstruction
|
Du-Ming Tsai; Shih-Chieh Wu; Wei-Chen Li |
| 元智大學 |
2012-08 |
Defect detection of solar cells in electroluminescence images using Fourier image reconstruction
|
Du-Ming Tsai; Shih-Chieh Wu; Wei-Chen Li |
