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教育部委托研究计画 计画执行:国立台湾大学图书馆
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显示项目 872901-872910 / 2348685 (共234869页)
<< < 87286 87287 87288 87289 87290 87291 87292 87293 87294 87295 > >>
每页显示[10|25|50]项目
| 臺大學術典藏 |
2022-03-22T08:27:50Z |
Thermal stability of grain structure for Ag nanotwinned films sputtered with substrate bias
|
Lai Y.-C;Wu P.-C;Chuang T.-H.; Lai Y.-C; Wu P.-C; Chuang T.-H.; TUNG-HAN CHUANG |
| 臺大學術典藏 |
2022-03-22T08:30:50Z |
Thermal stability of grain structure for Ag nanotwinned films sputtered with substrate bias
|
Lai Y.-C;Wu P.-C;Chuang T.-H.; Lai Y.-C; Wu P.-C; Chuang T.-H.; TUNG-HAN CHUANG |
| 臺大學術典藏 |
2021-09-21T23:19:31Z |
Thermal stability of grain structure for Ag nanotwinned films sputtered with substrate bias
|
Lai, Yu Chang; Wu, Po Ching; TUNG-HAN CHUANG |
| 臺大學術典藏 |
2022-03-22T08:30:51Z |
Thermal stability of grain structure for Ag nanotwinned films sputtered with substrate bias
|
Lai Y.-C;Wu P.-C;Chuang T.-H.; Lai Y.-C; Wu P.-C; Chuang T.-H.; TUNG-HAN CHUANG |
| 國立聯合大學 |
2009 |
Thermal stability of hafnium and hafnium nitride gates on HfO2 gate dielectrics
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Tsai, CH; Lai, YS; Chen, JS |
| 國立成功大學 |
2009-11-13 |
Thermal stability of hafnium and hafnium nitride gates on HfO2 gate dielectrics
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Tsai, Chih-Huang; Lai, Yi-Sheng; Chen, Jen-Sue |
| 國立東華大學 |
2008-12 |
Thermal stability of hard transparent AlxCoCrCuFeNi oxide films
|
Wong,M.S.; Chen,T.K. |
| 國立成功大學 |
2021 |
Thermal Stability of HfO2|AlGaN|GaN Normally-Off Transistors with Ni|Au and Pt Gate Metals
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Lin, Y.-C.;Niu, J.-S.;Liu, W.-C.;Tsai, J.-H. |
| 國立成功大學 |
2013-09 |
Thermal Stability of High-Power LEDs Analyzed With Efficient Nondestructive Methodology
|
Lee, Pei-Hsuan; Chou, Jung-Hua; Tseng, Hsien-Cheng |
| 中原大學 |
1996 |
Thermal Stability of Horizontally Superposed Porous and Fluid Layers in a Rotating System
|
Jong Jhy Jou;Kuang Yuan Kung;Cheng Hsing Hsu |
显示项目 872901-872910 / 2348685 (共234869页)
<< < 87286 87287 87288 87289 87290 87291 87292 87293 87294 87295 > >>
每页显示[10|25|50]项目
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